Patents by Inventor John C. Bergeron

John C. Bergeron has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus for interfacing electronic packages and test equipment
    Patent number: 7362114
    Abstract: A test apparatus for testing electrical devices such as ICs is provided. The test apparatus includes a test socket mounted on a DUT board in which a contact plunger assembly is at least partially positioned.
    Type: Grant
    Filed: October 27, 2004
    Date of Patent: April 22, 2008
    Assignee: Rika Electronics International, Inc.
    Inventors: John M. Winter, Larre H. Nelson, John C. Bergeron, Lourie M. Sarcione
  • Apparatus for interfacing electronic packages and test equipment
    Patent number: 6992496
    Abstract: A test apparatus for testing electrical devices such as ICs is provided. The test apparatus includes a test socket mounted on a DUT board in which a contact plunger assembly is at least partially positioned.
    Type: Grant
    Filed: March 5, 2003
    Date of Patent: January 31, 2006
    Assignee: Rika Electronics International, Inc.
    Inventors: John M. Winter, Larre H. Nelson, John C. Bergeron, Lourie M. Sarcione
  • Sockets for testing electronic packages having contact probes with contact tips easily maintainable in optimum operational condition
    Patent number: 6685492
    Abstract: An electrical socket (10) mounts a plurality of electrical contact probes (20, 22, 24, 26, 28, 30, 32) for providing an electrical connection between terminals of an electronic package (1,1′) received in a seat (10d) formed in the socket and respective conductive pads of a DUT board. The contact probes each have a slidable contact tip (20m, 26m, 28m, 30m, 32m) which is adapted for engagement with a respective terminal of an electronic package received in the socket and which is removable from the contact probe for ease of replacement. The removable contact tips or plungers are provided with a retainer surface (20t, 28t, 30t, 32t) for interengagement with a removable retainer member of the socket.
    Type: Grant
    Filed: May 17, 2002
    Date of Patent: February 3, 2004
    Assignee: Rika Electronics International, Inc.
    Inventors: John M. Winter, Larre H. Nelson, John C. Bergeron
  • Apparatus for interfacing electronic packages and test equipment
    Publication number: 20030218472
    Abstract: A test apparatus for testing electrical devices such as ICs is provided. The test apparatus includes a test socket mounted on a DUT board in which a contact plunger assembly is at least partially positioned.
    Type: Application
    Filed: March 5, 2003
    Publication date: November 27, 2003
    Applicant: Rika Electronics International, Inc.
    Inventors: John M. Winter, Larre H. Nelson, John C. Bergeron, Lourie M. Sarcione
  • Contact apparatus particularly useful with test equipment
    Patent number: 6652326
    Abstract: A double-ended, coaxial contact assembly has a center probe rod (12) mounted in the bore of a dielectric center spacer bushing (16) and mounts a probe contact assembly on each end of the center probe rod. The center probe rod is received in a ground sleeve (19) with the probe contact assemblies maintained in coaxial relationship with the ground sleeve by a dielectric outer spacer bushing (17). In certain embodiments a movable ground plunger (18g,22) is slidably received in each end of the ground sleeves and biased outwardly by respective ground plunger coil springs (25). In one such embodiment the center spacer bushing (16′) is provided with an axially extending sleeve disposed between the respective probe contact assembly and the ground sleeve.
    Type: Grant
    Filed: July 11, 2001
    Date of Patent: November 25, 2003
    Assignee: Rika Electronics International, Inc.
    Inventors: Stephen A. Boyle, John C. Bergeron
  • SOCKETS FOR TESTING ELECTRONIC PACKAGES HAVING CONTACT PROBES WITH CONTACT TIPS EASILY MAINTAINABLE IN OPTIMUM OPERATIONAL CONDITION
    Publication number: 20030124895
    Abstract: An electrical socket (10) mounts a plurality of electrical contact probes (20,22,24,26,28,30,32) for providing an electrical connection between terminals of an electronic package (1,1′) received in a seat (10d) formed in the socket and respective conductive pads of a DUT board. The contact probes each have a slidable contact tip (20m,26m,28m,30m,32m) which is adapted for engagement with a respective terminal of an electronic package received in the socket and which is removable from the contact probe for ease of replacement. The removable contact tips or plungers are provided with a retainer surface (20t,28t,30t, 32t) for interengagement with a removable retainer member of the socket.
    Type: Application
    Filed: May 17, 2002
    Publication date: July 3, 2003
    Inventors: John M. Winter, Larre H. Nelson, John C. Bergeron
  • Contact apparatus particularly useful with test equipment
    Publication number: 20020013085
    Abstract: A double-ended, coaxial contact assembly has a center probe rod (12) mounted in the bore of a dielectric center spacer bushing (16) and mounts a probe contact assembly on each end of the center probe rod. The center probe rod is received in a ground sleeve (19) with the probe contact assemblies maintained in coaxial relationship with the ground sleeve by a dielectric outer spacer bushing (17). In certain embodiments a movable ground plunger (18g,22) is slidably received in each end of the ground sleeves and biased outwardly by respective ground plunger coil springs (25). In one such embodiment the center spacer bushing (16′) is provided with an axially extending sleeve disposed between the respective probe contact assembly and the ground sleeve.
    Type: Application
    Filed: July 11, 2001
    Publication date: January 31, 2002
    Inventors: Stephen A. Boyle, John C. Bergeron