Patents by Inventor John C. Bernet

John C. Bernet has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12293501
    Abstract: Systems and methods can be used for analyzing image data to determine an amount of vibration and/or misalignment in an object under analysis. In some instances, as operating equipment heats up during operation, temperature changes of various portions of the operating equipment leads to changes in dimensions of such portions, leading to misalignment. Multiple sets of data representative of the operating equipment in multiple operating conditions can be used to determine an amount of misalignment due to thermal offsets. Hot and cold temperatures of the equipment can be used to calculate thermal growth of various portions of the equipment, which can be used to determine an amount a misalignment due to thermal offsets. Additionally or alternatively, image data representing the equipment can be used to observe changes in alignment between states.
    Type: Grant
    Filed: December 23, 2021
    Date of Patent: May 6, 2025
    Assignee: Fluke Corporation
    Inventors: Michael D. Stuart, John C. Bernet
  • Publication number: 20220261980
    Abstract: Systems and methods can be used for analyzing image data to determine an amount of vibration and/or misalignment in an object under analysis. In some instances, as operating equipment heats up during operation, temperature changes of various portions of the operating equipment leads to changes in dimensions of such portions, leading to misalignment. Multiple sets of data representative of the operating equipment in multiple operating conditions can be used to determine an amount of misalignment due to thermal offsets. Hot and cold temperatures of the equipment can be used to calculate thermal growth of various portions of the equipment, which can be used to determine an amount a misalignment due to thermal offsets. Additionally or alternatively, image data representing the equipment can be used to observe changes in alignment between states.
    Type: Application
    Filed: December 23, 2021
    Publication date: August 18, 2022
    Inventors: Michael D. Stuart, John C. Bernet
  • Patent number: 11210776
    Abstract: Systems and methods can be used for analyzing image data to determine an amount of vibration and/or misalignment in an object under analysis. In some instances, as operating equipment heats up during operation, temperature changes of various portions of the operating equipment leads to changes in dimensions of such portions, leading to misalignment. Multiple sets of data representative of the operating equipment in multiple operating conditions can be used to determine an amount of misalignment due to thermal offsets. Hot and cold temperatures of the equipment can be used to calculate thermal growth of various portions of the equipment, which can be used to determine an amount a misalignment due to thermal offsets. Additionally or alternatively, image data representing the equipment can be used to observe changes in alignment between states.
    Type: Grant
    Filed: February 28, 2020
    Date of Patent: December 28, 2021
    Assignee: Fluke Corporation
    Inventors: Michael D. Stuart, John C. Bernet
  • Publication number: 20200258213
    Abstract: Systems and methods can be used for analyzing image data to determine an amount of vibration and/or misalignment in an object under analysis. In some instances, as operating equipment heats up during operation, temperature changes of various portions of the operating equipment leads to changes in dimensions of such portions, leading to misalignment. Multiple sets of data representative of the operating equipment in multiple operating conditions can be used to determine an amount of misalignment due to thermal offsets. Hot and cold temperatures of the equipment can be used to calculate thermal growth of various portions of the equipment, which can be used to determine an amount a misalignment due to thermal offsets. Additionally or alternatively, image data representing the equipment can be used to observe changes in alignment between states.
    Type: Application
    Filed: February 28, 2020
    Publication date: August 13, 2020
    Inventors: Michael D. Stuart, John C. Bernet
  • Patent number: 10586319
    Abstract: Systems and methods can be used for analyzing image data to determine an amount of vibration and/or misalignment in an object under analysis. In some instances, as operating equipment heats up during operation, temperature changes of various portions of the operating equipment leads to changes in dimensions of such portions, leading to misalignment. Multiple sets of data representative of the operating equipment in multiple operating conditions can be used to determine an amount of misalignment due to thermal offsets. Hot and cold temperatures of the equipment can be used to calculate thermal growth of various portions of the equipment, which can be used to determine an amount a misalignment due to thermal offsets. Additionally or alternatively, image data representing the equipment can be used to observe changes in alignment between states.
    Type: Grant
    Filed: October 24, 2016
    Date of Patent: March 10, 2020
    Assignee: Fluke Corporation
    Inventors: Michael D. Stuart, John C. Bernet
  • Patent number: 10083501
    Abstract: Systems and methods can be used for analyzing image data to determine an amount of vibration and/or misalignment in an object under analysis. Image distortion present in the image data due to vibration and/or misalignment of the object during operation can be detected automatically or manually, and can be used to determine an amount of vibration and/or misalignment present. The determined amount of vibration and/or misalignment can be used to determine alignment calibration parameters for inputting into an alignment tool to facilitate alignment of the object. Various steps in determining the image distortion and/or the alignment calibration parameters can be performed using single components or can be spread across multiple components in a system.
    Type: Grant
    Filed: October 24, 2016
    Date of Patent: September 25, 2018
    Assignee: Fluke Corporation
    Inventors: Michael D. Stuart, John C. Bernet
  • Publication number: 20170140520
    Abstract: Systems and methods can be used for analyzing image data to determine an amount of vibration and/or misalignment in an object under analysis. Image distortion present in the image data due to vibration and/or misalignment of the object during operation can be detected automatically or manually, and can be used to determine an amount of vibration and/or misalignment present. The determined amount of vibration and/or misalignment can be used to determine alignment calibration parameters for inputting into an alignment tool to facilitate alignment of the object. Various steps in determining the image distortion and/or the alignment calibration parameters can be performed using single components or can be spread across multiple components in a system.
    Type: Application
    Filed: October 24, 2016
    Publication date: May 18, 2017
    Inventors: Michael D. Stuart, John C. Bernet
  • Publication number: 20170116725
    Abstract: Systems and methods can be used for analyzing image data to determine an amount of vibration and/or misalignment in an object under analysis. In some instances, as operating equipment heats up during operation, temperature changes of various portions of the operating equipment leads to changes in dimensions of such portions, leading to misalignment. Multiple sets of data representative of the operating equipment in multiple operating conditions can be used to determine an amount of misalignment due to thermal offsets. Hot and cold temperatures of the equipment can be used to calculate thermal growth of various portions of the equipment, which can be used to determine an amount a misalignment due to thermal offsets. Additionally or alternatively, image data representing the equipment can be used to observe changes in alignment between states.
    Type: Application
    Filed: October 24, 2016
    Publication date: April 27, 2017
    Inventors: Michael D. Stuart, John C. Bernet