Abstract: The use of highly compressively strained In1−xGaxAs quantum wells having a high In content for the detection of light to a wavelength of &lgr;≈2.1 &mgr;m is disclosed. Crystal quality is maintained through strain compensation using tensile strained barriers of InGaAs, InGaP, or InGaAsP. High efficiencies have been achieved in detectors fabricated using this technique. The theoretical cutoff wavelength limit for diodes fabricated using this technique is calculated to be &lgr;˜2.1 &mgr;m. Lattice mismatched layers may be used to transition between compressively strained layers and tensile strained layers to prevent the crystal from breaking up. Multiple quantum wells are formed with multiple periods of strained InGaAs, transition layers and tensile strained layers. These detectors have application in semiconductor, amplifiers, detectors, optical switches, images, etc.