Patents by Inventor John C. Freeman

John C. Freeman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230137832
    Abstract: Various systems include one or more processors and one or more memory devices storing instructions. The instructions, when executed by the processor(s), cause the system to access temporal physiological data for a person from a storage located remote from the person where the temporal physiological data includes physiological data recorded over time by at least one electronic device of the person, receive a request from a requesting device for a physiology-based suspicion indicator for an identity associated with the person which indicates a degree to which the temporal physiological data of the person reflects a suspicion regarding the identity associated with the person, determine the physiology-based suspicion indicator for the identity based on at least a portion of the temporal physiological data for the person stored remote from the person, and communicate the physiology-based suspicion indicator for the identity associated with the person to the requesting device.
    Type: Application
    Filed: October 5, 2022
    Publication date: May 4, 2023
    Inventors: Timothy D. Paffel, John C. Freeman, Shinoy B. Cherayil
  • Patent number: 4859304
    Abstract: A plasma dry etch chamber is provided with an anode plate which has a cooling jacket which extends radially outwardly from a cooling core to an extent corresponding to the radial dimension of a silicon wafer work product. In order to further reduce deposit formation, the outer perimeter of the anode is designed to reduce the effects of polymer deposition.
    Type: Grant
    Filed: July 18, 1988
    Date of Patent: August 22, 1989
    Assignee: Micron Technology, Inc.
    Inventors: David A. Cathey, John C. Freeman, James Dale, William J. Crane, Eric A. Powell, Jeffrey V. Musser