Abstract: A method for manufacturing an array of dynamic random access memory (DRAM) cells having a single crown-shaped or a double crown-shaped stacked capacitors is accomplished. The method involves forming an array of device areas on a silicon substrate in which FETs for the DRAM cells are formed. After forming bit line contacts and bit line metallurgy contacting one of the two source/drain areas of each FET, a thick low melting temperature glass (BPSG) is deposited and planarized by annealing. Node capacitor contact openings are formed in the BPSG using a polysilicon sidewall method that reduces the contact size, and a thick polysilicon layer is deposited to contact the node source/drain areas of the FETs, and also provides a planar polysilicon surface. A specially designed edge phase-shift mask is then used with a positive photoresist to pattern the thick polysilicon layer and form crown-shaped bottom electrodes.