Abstract: Disclosed is apparatus to enhance thermal energy transfer from a heater to a DUT in IC handler systems. The pick-up head of an IC handler system is made of metal blocks in maximal thermal contact, and further includes an electrically resistive and thermally conductive layer. The electrically resistive layer provides ESD protection to the DUT. The preferred apparatus uses a collapsible billows suction cup to secure, pick-up, and align DUTs.

Abstract: An test block includes a box-like body and four rails extending from side edges of the body. During thermal testing, the test block is mounted between a test head and a test socket such that the rails provide a thermal path between the test block body and contact pads formed on the test socket. In this manner the rails emulate the thermal path formed by the metal leads extending from a conventional Quad Flat Pack Integrated Circuit (QFP IC), thereby reliably duplicating the actual thermal path of the QFP IC. The test block is mounted on the test system and its temperature is measured before and after testing QFP IC devices. Confirming that the test block is within test temperature specifications before and after the QFP-IC test procedure provides a highly reliable verification that the QFP-IC's actual test temperature is within the test temperature specifications.

Abstract: A calibration assembly and method for calibrating the device pick-up heads used in multi-head IC handlers such that all of the device pick-up heads are reliably calibrated to a consistent optimal calibration position. Gauge blocks are provided that greatly simplify the calibration process by holding the movable portion of a device pick-up head in an optimal calibration position relative to the base structure of the device pick-up head while the collar is secured. Each gauge block has base portion for supporting the base structure of the device pick-up head, and a flat contact surface against which the lower surface of the movable portion is pressed. The contact surface is a predetermined distance from the base portion such that when the device pick-up head is mounted on the gauge block, the movable portion is maintained in an optimal calibration position relative to the base structure.