Abstract: A continuity testing and cleaning fixture includes a continuity test area disposed on a portion of a first surface of the fixture, wherein the continuity test area comprises an upper region comprising at least 99.99 wt % tungsten. The continuity testing and cleaning fixture may be used in a method involving contacting at least two conductive elements of a probe card with a continuity test area of a continuity testing and cleaning fixture, wherein the continuity test area comprises an upper region comprising at least 99.99 wt % tungsten; determining an electrical resistance between the at least two conductive elements; and cleaning the at least two conductive elements with at least one cleaning zone of the continuity testing and cleaning fixture in response to determining the electrical resistance to be above a first threshold.

Abstract: A continuity testing and cleaning fixture includes a continuity test area disposed on a portion of a first surface of the fixture, wherein the continuity test area comprises an upper region comprising at least 99.99 wt % tungsten. The continuity testing and cleaning fixture may be used in a method involving contacting at least two conductive elements of a probe card with a continuity test area of a continuity testing and cleaning fixture, wherein the continuity test area comprises an upper region comprising at least 99.99 wt % tungsten; determining an electrical resistance between the at least two conductive elements; and cleaning the at least two conductive elements with at least one cleaning zone of the continuity testing and cleaning fixture in response to determining the electrical resistance to be above a first threshold.

Abstract: In a method for generating a product design, a description of i) a product to be designed, and/or ii) one or more design objectives are received and analyzed to determine a design function that corresponds to the description and characterizes the product. Combinations of sub-functions that match the determined design function are determined. A plurality of components that implement the design sub-functions are determined. One or more models that correspond to one or more candidate designs that implement the determined design function are constructed from sub-models corresponding to the determined plurality of components. The one or more models are evaluated with regard to one or more design objectives. A report is generated that provides i) information regarding performance of at least one candidate design with regard to the one or more design objectives, and/or ii) an indication that no candidate design meets the one or more design objectives, when appropriate.

Abstract: A snack food incorporating various ingredients of chicken noodle soup is described. The processing of a chicken noodle soup mixture begins with three separate batch operations (e.g., pasta, chicken/vegetable filling, and broth) that are completed before moving to a continuous forming process, such as a triple cold forming extrusion operation. Extrusion typically begins with a machine kneading and then forming a pasta shell under high pressure through a custom die. Concurrently, the chicken/vegetable filling and broth move through the extruder in separate streams allowing for two distinct fillings one inside the other (e.g., broth inside chicken), filling approximately 75% of the pasta shell's volume allowing room for closing. The product is simultaneously cut and sealed at a suitable length.

Abstract: Reporting and/or analyzing test data from a plurality of tests of an array structure using a data array is disclosed. One method includes obtaining the test data, and reporting the test data in a data array, which includes at least two portions representing different tests. Data stored in the data array is organized according to a translation table, which describes the locations of data for tests and criteria for data to be analyzed within the data array. Numerous other data arrangements such as a coordinate file listing a pre-defined maximum number of fail points, or a chip report including fail points by chip may also be generated. The data array reports all test data in a more easily generated and stored form, and may be converted to an image. A data analysis method for analyzing data using the data array is also disclosed.