Patents by Inventor John Charles Ould
John Charles Ould has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20250130206Abstract: An ultrasound inspection probe for a machine tool that includes a probe body and elongate member that extends from probe body and has datum surface for contacting object to be inspected. Probe also includes an ultrasound transducer and coupling assembly for acoustically coupling ultrasound transducer to object to be inspected. Ultrasound coupling assembly includes carrier shell containing ultrasound coupling element having transducer-contacting face coupled to ultrasound transducer and object-contacting face for acoustically coupling to object to be inspected. Bearing mechanism movably attaches ultrasound transducer and coupling assembly to elongate member allowing movement between extended position wherein object-contacting face of ultrasound coupling element extends beyond datum surface and measurement position wherein object-contacting face of ultrasound coupling element is substantially flush with datum surface.Type: ApplicationFiled: February 6, 2023Publication date: April 24, 2025Applicant: RENISHAW PLCInventors: John Charles OULD, Thomas Phillip HANDFORD, Robert TOTH
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Publication number: 20250130203Abstract: An ultrasound inspection probe is described for use with a coordinate positioning apparatus, such as a machine tool. The probe includes a probe body for mounting to a coordinate positioning apparatus and an elongate member extending from the probe body. The elongate member includes an ultrasound transducer assembly and a datum surface at its distal end. A movable joint connects a proximal end of the elongate member to the probe body and this movable joint is configured to permit both lateral and rotational movement of the proximal end of the elongate member relative to the probe body such that the elongate member can rotate about its distal end to allow the datum surface to angularly align with a surface of an object to be inspected. In this manner, the datum surface aligns with the surface of the object being inspected to optimise acoustic coupling.Type: ApplicationFiled: February 6, 2023Publication date: April 24, 2025Applicant: RENISHAW PLCInventors: John Charles OULD, Thomas Phillip HANDFORD, Robert TOTH, Christopher James RATFORD
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Publication number: 20240142229Abstract: A method of communicating information to a measurement probe mounted on a coordinate positioning machine includes encoding the information as one or more of a plurality of characteristic movements of the probe, controlling the machine to impart the movement(s) to the probe, detecting the movement(s) at the probe, and decoding the information at the probe from the detected movement(s). A measurement probe for use in such a method is mountable to the machine and includes at least one movement sensor for sensing movement imparted to the measurement probe by the machine, and a controller for determining whether the sensed movement includes one or more of the plurality of characteristic movements of the probe and for performing an operation at or controlling operation of the probe in dependence on the determination.Type: ApplicationFiled: March 1, 2022Publication date: May 2, 2024Applicant: RENISHAW PLCInventors: Jamie John BUCKINGHAM, Derek MARSHALL, John Charles OULD
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Patent number: 11846497Abstract: Method for measuring an object using a scanning probe carried by a machine tool having a probe holder for the scanning probe and a carrier for the object. The method includes (i) using the machine tool to move the probe holder relative to the carrier along a pre-programmed scan path, (ii) measuring acceleration whilst the pre-programmed scan path is traversed, (iii) collecting probe data whilst the pre-programmed scan path is traversed, and (iv) using the acceleration measured to identify at least one acceleration zone of the pre-programmed scan path and thereby determine one or more positions along the scan path at which the probe data of step (iii) were collected.Type: GrantFiled: June 10, 2019Date of Patent: December 19, 2023Assignee: RENISHAW PLCInventors: John Charles Ould, Thomas Phillip Handford
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Publication number: 20230050256Abstract: A method of determining a form measurement for a curved feature of an artefact. The method includes a positioning apparatus relatively moving the artefact and a measurement device relative along a curved path in a first direction, to obtain a first set of data points along the surface of the curved feature, and the positioning apparatus relatively moving the artefact and the measurement device other along a curved path in a second direction, opposite to the first direction, to obtain a second set of data points along the surface of the curved feature. The method further includes using the first and second sets of data points to determine a form measurement for the artefact.Type: ApplicationFiled: February 23, 2021Publication date: February 16, 2023Applicant: RENISHAW PLCInventors: John Charles OULD, Rose CROSSLAND
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Patent number: 11163288Abstract: A method is described for analysing probe data collected by a scanning probe carried by a machine tool. The probe data is collected as the machine tool moves or scans the scanning probe along a scan path relative to a workpiece. The method includes a step of identifying a property of the scan path used by the machine tool from a characteristic of the collected probe data. In this manner, the scan path can be identified from the probe data alone without having to receive any position data from the machine tool.Type: GrantFiled: March 30, 2016Date of Patent: November 2, 2021Assignee: RENISHAW PLCInventors: Derek Marshall, John Charles Ould
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Publication number: 20210207938Abstract: Method for measuring an object using a scanning probe carried by a machine tool having a probe holder for the scanning probe and a carrier for the object. The method includes (i) using the machine tool to move the probe holder relative to the carrier along a pre-programmed scan path, (ii) measuring acceleration whilst the pre-programmed scan path is traversed, (iii) collecting probe data whilst the pre-programmed scan path is traversed, and (iv) using the acceleration measured to identify at least one acceleration zone of the pre-programmed scan path and thereby determine one or more positions along the scan path at which the probe data of step (iii) were collected.Type: ApplicationFiled: June 10, 2019Publication date: July 8, 2021Applicant: RENISHAW PLCInventors: John Charles OULD, Thomas Phillip HANDFORD
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Publication number: 20190178618Abstract: A method is described for measuring an object using a machine tool and a scanning probe. The scanning probe is driven along a scan path relative to the object whilst the scanning probe acquires probe data describing a series of positions on the surface of the object relative to the scanning probe. The scan path includes at least a first scan path segment for producing probe data that can be analysed to measure the object. The scan path is also arranged to impart a plurality of identifiable probe motions to the scanning probe that can be identified from the acquired probe data alone. Each identifiable probe motion is used to define a time stamp. This allows the probe data to be tied to commanded or nominal positions around the scan path.Type: ApplicationFiled: September 7, 2017Publication date: June 13, 2019Applicant: RENISHAW PLCInventors: David Roberts MCMURTRY, John Charles OULD
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Publication number: 20190025793Abstract: A method for setting a null position of a scanning probe mounted to the rotatable spindle of a machine tool. This method may be performed as part of a probe qualification process. The method includes setting the null position using probe measurement data collected by the scanning probe when mounted to the spindle. In one embodiment, a stylus tip of the scanning probe may be located in a conical recess whilst the probe measurement data is collected. The set null position is arranged to be away from the rest position of the scanning probe and to substantially coincide with the axis of rotation of the spindle. The need to measure and use a probe offset value in subsequent measurement cycles can thus be avoided.Type: ApplicationFiled: February 22, 2017Publication date: January 24, 2019Applicant: RENISHAW PLCInventor: John Charles OULD
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Patent number: 10048065Abstract: A method of inspecting an artifact on a machine tool includes: scanning a probe mounted on the machine tool along the surface of the artifact to be inspected. The method involves supplying a flow of fluid at least at the point of interaction between the probe and the artifact during the scanning.Type: GrantFiled: November 5, 2013Date of Patent: August 14, 2018Assignee: RENISHAW PLCInventors: John Charles Ould, Paul William Moore, Matthew Anthony Revell
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Publication number: 20180107190Abstract: A method is described for analysing probe data collected by a scanning probe carried by a machine tool. The probe data is collected as the machine tool moves or scans the scanning probe along a scan path relative to a workpiece. The method includes a step of identifying a property of the scan path used by the machine tool from a characteristic of the collected probe data. In this manner, the scan path can be identified from the probe data alone without having to receive any position data from the machine tool.Type: ApplicationFiled: March 30, 2016Publication date: April 19, 2018Applicant: RENISHAW PLCInventors: Derek MARSHALL, John Charles OULD
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Patent number: 9235205Abstract: A method for producing a measurement probe 30 inspection path on a machine tool is disclosed which includes the step of running a program e.g. a modified CAM editor program 44 which allows the selection of geometric features of a workpiece 34 to be inspected. Once selected the program will generate a measurement probe path which is included in software for loading into the numeric controller (NC) of the machine tool. The software can have cutting commands together with inspection path instructions either readable by the NC or written as unreadable instructions for use with a p.c. 20 connected to the NC controller and preferably operating at the same time as the NC.Type: GrantFiled: February 13, 2004Date of Patent: January 12, 2016Assignee: RENISHAW PLCInventors: Tim Prestidge, John Charles Ould
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Publication number: 20150285629Abstract: A method of inspecting an artefact on a machine tool includes: scanning a probe mounted on the machine tool along the surface of the artefact to be inspected. The method involves supplying a flow of fluid at least at the point of interaction between the probe and the artefact during the scanning.Type: ApplicationFiled: November 5, 2013Publication date: October 8, 2015Applicant: Renishaw plcInventors: John Charles Ould, Derek Marshall, Paul William Moore, Matthew Anthony Revell
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Patent number: 8195310Abstract: A machine tool program editor is used to insert auxiliary operations e.g. measurement, process control and program logic into a CNC work producing program. The editor has representations of the operations which can be placed in the correct position in the program. User input in the form of parameters is prompted when a representation is selected. The program is post processed and run on a machine tool whereat the operations are performed.Type: GrantFiled: June 28, 2005Date of Patent: June 5, 2012Assignee: Renishaw PLCInventors: John Charles Ould, Sam Hawke Whale, Kevin James Tett, Matthew James Powley, Alexander Edward Kane
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Patent number: 7970488Abstract: A workpiece inspection system is disclosed for determining measurements of a workpiece on a machine tool. The system utilizes a measurement device which outputs data relating to the workpiece (e.g. in place of a conventional cutter). The problem of obtaining real time data relating to the position of the machine tool is overcome by recording a machine tool position data set and a measurement device data set at selected instants which are defined by a synchronization signal. The data sets are combined later in the correct relative position because the synchronization signal was used. The synchronization signal can issue from the machine tool controller, an interface, measurement device or another part of the system.Type: GrantFiled: January 6, 2005Date of Patent: June 28, 2011Assignee: Renishaw PLCInventors: Tim Prestidge, John Charles Ould, David Kenneth Thomas, Andrew James Harding
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Patent number: 7886453Abstract: A method is described for measuring a workpiece on a machine tool using an analogue probe having a deflectable stylus. The method comprises the step of taking a workpiece having a nominal surface profile, the workpiece being located within the working area of the machine tool. The machine tool is used to move the analogue probe along a predetermined (known) measurement path relative to the workpiece whilst deflection of the stylus is measured. The analogue probe is moved relative to the workpiece at a speed greater than five millimeters per second and the predetermined measurement path is selected to provide intermittent contact between the stylus and the workpiece.Type: GrantFiled: December 11, 2007Date of Patent: February 15, 2011Assignee: Renishaw PLCInventors: John Charles Ould, Kevin James Tett
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Patent number: 7866056Abstract: A method is described for calibrating apparatus including a measurement probe mounted on a machine, such as a machine tool. The machine is arranged to capture machine position data indicative of the position of the measurement probe and the measurement probe is arranged to capture probe data indicative of the position of a surface relative to the measurement probe. The measurement probe may be an analogue or scanning probe having a deflectable stylus. The first step of the method involves moving the measurement probe at a known speed relative to an artefact whilst capturing probe data and machine position data. In particular, the measurement probe is moved along a path that enables probe data to be captured that is indicative of the position of two or more points on the surface of the artefact relative to the measurement probe.Type: GrantFiled: February 18, 2008Date of Patent: January 11, 2011Assignee: Renishaw PLCInventors: John Charles Ould, Alexander Tennant Sutherland
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Publication number: 20100050837Abstract: A method is described for measuring a workpiece on a machine tool using an analogue probe having a deflectable stylus. The method comprises the step of taking a workpiece having a nominal surface profile, the workpiece being located within the working area of the machine tool. The machine tool is used to move the analogue probe along a predetermined (known) measurement path relative to the workpiece whilst deflection of the stylus is measured. The analogue probe is moved relative to the workpiece at a speed greater than five millimeters per second and the predetermined measurement path is selected to provide intermittent contact between the stylus and the workpiece.Type: ApplicationFiled: December 11, 2007Publication date: March 4, 2010Applicant: RENISHAW PLCInventors: John Charles Ould, Kevin James Tett
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Publication number: 20100018069Abstract: A method is described for calibrating apparatus comprising a measurement probe (4) mounted on a machine, such as a machine tool. The machine is arranged to capture machine position data (x,y,z;70;80) indicative of the position of the measurement probe and the measurement probe is arranged to capture probe data (a,b,c;72;82) indicative of the position of a surface relative to the measurement probe (4). The measurement probe (4) may be an analogue or scanning probe having a deflectable stylus (14). The first step of the method involves moving the measurement probe (4) at a known speed relative to an artefact (30;40,42) whilst capturing probe data (a,b,c;72;82) and machine position data (x,y,z;70;80). In particular, the measurement probe (4) is moved along a path that enables probe data (a,b,c;72;82) to be captured that is indicative of the position of two or more points on the surface of the artefact relative to the measurement probe (4).Type: ApplicationFiled: February 18, 2008Publication date: January 28, 2010Applicant: RENISHAW PLCInventors: John Charles Ould, Alexander Tennant Sutherland
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Publication number: 20080051927Abstract: A workpiece inspection system is disclosed for determining measurements of a workpiece on a machine tool. The system utilises a measurement device which outputs data relating to the workpiece (e.g. in place of a conventional cutter). The problem of obtaining real time data relating to the position of the machine tool is overcome by recording a machine tool position data set and a measurement device data set at selected instants which are defined by a synchronisation signal. The data sets are combined later in the correct relative position because the synchronisation signal was used. The synchronisation signal can issue from the machine tool controller, an interface, measurement device or another part of the system.Type: ApplicationFiled: January 6, 2005Publication date: February 28, 2008Applicant: Renishaw PLCInventors: Tim Prestidge, John Charles Ould, David Kenneth Thomas, Andrew James Harding