Abstract: The present invention provides a method for performing design rule check (DRC) of an integrated circuit. A design layout of the integrated circuit is provided. The integrated circuit includes a complex circuit. A DRC tool is used to compare a portion of the design layout with a reference layout containing an accurate implementation of the complex circuit. The portion of the design layout corresponds to the complex circuit.

Abstract: A method and computer program product for parasitic extraction from a previously calculated capacitance solution include steps of: (a) receiving as input a design database for an integrated circuit design; (b) receiving as input a first set of operating conditions and a second set of operating conditions for the integrated circuit design; (c) calculating a first resistance solution and a single capacitance solution from the design database and the first set of operating conditions; (d) performing a parasitic extraction of the first resistance solution and the single capacitance solution to generate a first set of parasitic values; (e) calculating a second resistance solution from the design database and the second set of operating conditions; (f) performing a parasitic extraction of the second resistance solution and the single capacitance solution to generate a second set of parasitic values; and (g) generating as output the first set of parasitic values and the second set of parasitic values.