Patents by Inventor John D. Waldron

John D. Waldron has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Combined magnetic sector mass spectrometer and time-of-flight mass spectrometer
    Patent number: 5171987
    Abstract: A mass spectrometry system includes a double-focusing magnetic sector mass spectrometer and a time-of-flight spectrometer arranged in parallel. The spectrometers share a common means for exciting ions from a sample, and a common transfer optics system. An interleaved control system for the two spectrometers, is arranged also to control a sampling handling arrangement dependent on the output of the time-of-flight spectrometer, so as to enable the double-focusing magnetic sector mass spectrometer to analyze a region of interest on a sample.
    Type: Grant
    Filed: March 19, 1991
    Date of Patent: December 15, 1992
    Assignee: Kratos Analytical Ltd.
    Inventors: John D. Waldron, Mark G. Dowsett, Peter J. Derrick