Patents by Inventor John Damiano, Jr.

John Damiano, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20160336144
    Abstract: An electron microscope sample holder that includes at least one capillary having a sufficient inner diameter to act as a catheter pathway that allows objects that can be accommodated within the at least one capillary to be replaced or swapped with other objects. The sample holder having at least one capillary allows the user to insert and remove temporary fluidic pathways, sensors or other tools without the need to dissemble the holder.
    Type: Application
    Filed: May 13, 2016
    Publication date: November 17, 2016
    Inventors: Daniel Stephen Gardiner, Franklin Stampley Walden, II, John Damiano, JR.
  • Patent number: 9466459
    Abstract: A flow directing gasket for improving the flow of a gas or liquid across electron beam transparent membranes in environmental cells within a sample holder of an electron microscope, and uses of the sample holders comprising said flow directing gaskets.
    Type: Grant
    Filed: June 3, 2015
    Date of Patent: October 11, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: Daniel Stephen Gardiner, Franklin Stampley Walden, II, John Damiano, Jr.
  • Patent number: 9437393
    Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
    Type: Grant
    Filed: November 13, 2013
    Date of Patent: September 6, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Franklin Stampley Walden, II, William Bradford Carpenter
  • Publication number: 20160172153
    Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
    Type: Application
    Filed: February 23, 2016
    Publication date: June 16, 2016
    Inventors: John DAMIANO, Jr., Stephen E. MICK, David P. NACKASHI
  • Publication number: 20160126056
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Application
    Filed: January 13, 2016
    Publication date: May 5, 2016
    Inventors: John DAMIANO, JR., David P. NACKASHI, Stephen E. MICK
  • Patent number: 9324539
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Grant
    Filed: September 9, 2014
    Date of Patent: April 26, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: John Damiano, Jr., David P. Nackashi, Stephen E. Mick
  • Patent number: 9312097
    Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Grant
    Filed: October 14, 2014
    Date of Patent: April 12, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: David P. Nackashi, John Damiano, Jr., Stephen E. Mick, Thomas G. Schmelzer, Michael Zapata, III
  • Patent number: 9275826
    Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
    Type: Grant
    Filed: October 28, 2014
    Date of Patent: March 1, 2016
    Assignee: PROTOCHIPS, INC.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi
  • Publication number: 20160033355
    Abstract: System and method for safely controlling the containment of gas within a manifold system and the delivery of gas to a sample holder for an electron microscope for imaging and analysis.
    Type: Application
    Filed: August 3, 2015
    Publication date: February 4, 2016
    Inventors: Daniel S. Gardiner, John Damiano, JR., David P. Nackashi, William Bradford Carpenter, James Rivenbark, Mark Uebel, Michael Zapata, III, Rebecca Thomas, Franklin Stampley Walden, II
  • Publication number: 20150348745
    Abstract: A flow directing gasket for improving the flow of a gas or liquid across electron beam transparent membranes in environmental cells within a sample holder of an electron microscope, and uses of the sample holders comprising said flow directing gaskets.
    Type: Application
    Filed: June 3, 2015
    Publication date: December 3, 2015
    Inventors: Daniel Stephen Gardiner, Franklin Stampley Walden, II, John Damiano, JR.
  • Publication number: 20150338322
    Abstract: A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.
    Type: Application
    Filed: May 22, 2015
    Publication date: November 26, 2015
    Inventors: John DAMIANO, JR., Stephen E. MICK, David P. NACKASHI, Madeline DUKES
  • Publication number: 20150235805
    Abstract: An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.
    Type: Application
    Filed: February 19, 2015
    Publication date: August 20, 2015
    Inventors: Daniel Stephen Gardiner, William Bradford Carpenter, John Damiano, Jr., Franklin Stampley Walden, II, David P. Nackashi
  • Publication number: 20150179397
    Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
    Type: Application
    Filed: October 28, 2014
    Publication date: June 25, 2015
    Inventors: John DAMIANO, JR., Stephen E. MICK, David P. NACKASHI
  • Publication number: 20150162164
    Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
    Type: Application
    Filed: September 9, 2014
    Publication date: June 11, 2015
    Inventors: John DAMIANO, JR., David P. NACKASHI, Stephen E. MICK
  • Patent number: 9040939
    Abstract: A sample support structure with integrated support features and methods of making and using the reinforced membrane. The sample support structures are useful for supporting samples for analysis using microscopic techniques, such as electron microscopy, optical microscopy, x-ray microscopy, UV-VIS spectroscopy and nuclear magnetic resonance (NMR) techniques.
    Type: Grant
    Filed: February 29, 2008
    Date of Patent: May 26, 2015
    Assignee: PROTOCHIPS, INC.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi
  • Publication number: 20150129778
    Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Application
    Filed: October 14, 2014
    Publication date: May 14, 2015
    Inventors: David P. Nackashi, John Damiano, Jr., Stephen E. Mick, Thomas G. Schmelzer, Michael Zapata, III
  • Patent number: 8920723
    Abstract: A sample support structure comprising a sample support manufactured from a semiconductor material and having one or more openings therein. Methods of making and using the sample support structure.
    Type: Grant
    Filed: November 16, 2007
    Date of Patent: December 30, 2014
    Assignee: Protochips, Inc.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi
  • Patent number: 8872128
    Abstract: A novel specimen holder for specimen support specimen support devices for insertion in electron microscopes is provided. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Grant
    Filed: June 18, 2013
    Date of Patent: October 28, 2014
    Assignee: Protochips, Inc.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi, Montie Roland, Paul Hakenewerth
  • Patent number: 8872129
    Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
    Type: Grant
    Filed: May 9, 2008
    Date of Patent: October 28, 2014
    Assignee: Protochips, Inc.
    Inventors: John Damiano, Jr., Stephen E. Mick, David P. Nackashi
  • Patent number: 8859991
    Abstract: A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
    Type: Grant
    Filed: March 13, 2013
    Date of Patent: October 14, 2014
    Assignee: Protochips, Inc.
    Inventors: David P. Nackashi, John Damiano, Jr., Stephen E. Mick, Thomas G. Schmelzer, Michael Zapata, III