Patents by Inventor John David Stevenson

John David Stevenson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200025955
    Abstract: The present specification discloses methods for inspecting an object. The method includes scanning an object in a two-step process. In the primary scan, a truck or cargo container (container) is completely scanned with a fan beam radiation, the transmitted radiation is measured with an array of detectors, and the transmission information and optionally the fission signatures are analyzed to determine the presence of high-density, high-Z and fissionable materials. If the container alarms in one or more areas, the areas are subjected to a secondary scan. This is done by precisely repositioning the container to the location of the suspect areas, adjusting the scanning system to focus on the suspect areas, performing a stationary irradiation of the areas, and analyzing the measured feature signatures to clear or confirm the presence of SNM.
    Type: Application
    Filed: December 14, 2018
    Publication date: January 23, 2020
    Inventors: Tsahi Gozani, Joseph Bendahan, Michael Joseph King, Timothy John Shaw, John David Stevenson
  • Patent number: 10393915
    Abstract: The present specification discloses methods for inspecting an object. The method includes scanning an object in a two-step process. In the primary scan, a truck or cargo container (container) is completely scanned with a fan beam radiation, the transmitted radiation is measured with an array of detectors, and the transmission information and optionally the fission signatures are analyzed to determine the presence of high-density, high-Z and fissionable materials. If the container alarms in one or more areas, the areas are subjected to a secondary scan. This is done by precisely repositioning the container to the location of the suspect areas, adjusting the scanning system to focus on the suspect areas, performing a stationary irradiation of the areas, and analyzing the measured feature signatures to clear or confirm the presence of SNM.
    Type: Grant
    Filed: May 9, 2014
    Date of Patent: August 27, 2019
    Assignee: Rapiscan Systems, Inc.
    Inventors: Tsahi Gozani, Joseph Bendahan, Michael Joseph King, Timothy John Shaw, John David Stevenson
  • Patent number: 9207195
    Abstract: The application discloses systems and methods for X-ray scanning for identifying material composition of an object being scanned. The system includes at least one X-ray source for projecting an X-ray beam on the object, where at least a portion of the projected X-ray beam is transmitted through the object, and an array of detectors for measuring energy spectra of the transmitted X-rays. The measured energy spectra are used to determine atomic number of the object for identifying the material composition of the object. The X-ray scanning system may also have an array of collimated high energy backscattered X-ray detectors for measuring the energy spectrum of X-rays scattered by the object at an angle greater than 90 degrees, where the measured energy spectrum is used in conjunction with the transmission energy spectrum to determine atomic numbers of the object for identifying the material composition of the object.
    Type: Grant
    Filed: May 2, 2014
    Date of Patent: December 8, 2015
    Assignee: Rapiscan Systems, Inc.
    Inventors: Tsahi Gozani, Joseph Bendahan, Craig Matthew Brown, Willem G. J. Langevel, John David Stevenson
  • Publication number: 20140341341
    Abstract: The application discloses systems and methods for X-ray scanning for identifying material composition of an object being scanned. The system includes at least one X-ray source for projecting an X-ray beam on the object, where at least a portion of the projected X-ray beam is transmitted through the object, and an array of detectors for measuring energy spectra of the transmitted X-rays. The measured energy spectra are used to determine atomic number of the object for identifying the material composition of the object. The X-ray scanning system may also have an array of collimated high energy backscattered X-ray detectors for measuring the energy spectrum of X-rays scattered by the object at an angle greater than 90 degrees, where the measured energy spectrum is used in conjunction with the transmission energy spectrum to determine atomic numbers of the object for identifying the material composition of the object.
    Type: Application
    Filed: May 2, 2014
    Publication date: November 20, 2014
    Applicant: Rapiscan Systems, Inc.
    Inventors: Tsahi Gozani, Joseph Bendahan, Craig Matthew Brown, Willem G. J. Langevel, John David Stevenson
  • Publication number: 20140321588
    Abstract: The present specification discloses methods for inspecting an object. The method includes scanning an object in a two-step process. In the primary scan, a truck or cargo container (container) is completely scanned with a fan beam radiation, the transmitted radiation is measured with an array of detectors, and the transmission information and optionally the fission signatures are analyzed to determine the presence of high-density, high-Z and fissionable materials. If the container alarms in one or more areas, the areas are subjected to a secondary scan. This is done by precisely repositioning the container to the location of the suspect areas, adjusting the scanning system to focus on the suspect areas, performing a stationary irradiation of the areas, and analyzing the measured feature signatures to clear or confirm the presence of SNM.
    Type: Application
    Filed: May 9, 2014
    Publication date: October 30, 2014
    Applicant: Rapiscan Systems, Inc.
    Inventors: Tsahi Gozani, Joseph Bendahan, Michael Joseph King, Timothy John Shaw, John David Stevenson
  • Patent number: 8750454
    Abstract: The application discloses systems and methods for X-ray scanning for identifying material composition of an object being scanned. The system includes at least one X-ray source for projecting an X-ray beam on the object, where at least a portion of the projected X-ray beam is transmitted through the object, and an array of detectors for measuring energy spectra of the transmitted X-rays. The measured energy spectra are used to determine atomic number of the object for identifying the material composition of the object. The X-ray scanning system may also have an array of collimated high energy backscattered X-ray detectors for measuring the energy spectrum of X-rays scattered by the object at an angle greater than 90 degrees, where the measured energy spectrum is used in conjunction with the transmission energy spectrum to determine atomic numbers of the object for identifying the material composition of the object.
    Type: Grant
    Filed: February 23, 2011
    Date of Patent: June 10, 2014
    Assignee: Rapiscan Systems, Inc.
    Inventors: Tsahi Gozani, Joseph Bendahan, Craig Mathew Brown, Willem Gerhardus Johannes Langeveld, John David Stevenson
  • Publication number: 20120155592
    Abstract: The present specification discloses a system for detecting nuclear material based on at least one source of probing radiation and the radiation signatures generated from interrogating an object under inspection. In addition, the present specification describes a threshold-activation detector capable of detecting prompt neutrons, via the activation, after the source's blinding radiation has stopped. The threshold-activation detector can be manufactured from liquid fluorocarbons that allow for the detection of beta radiation and gamma rays.
    Type: Application
    Filed: February 25, 2011
    Publication date: June 21, 2012
    Inventors: Tsahi Gozani, Michael Joseph King, Timothy John Shaw, John David Stevenson
  • Publication number: 20110235777
    Abstract: The application discloses systems and methods for X-ray scanning for identifying material composition of an object being scanned. The system includes at least one X-ray source for projecting an X-ray beam on the object, where at least a portion of the projected X-ray beam is transmitted through the object, and an array of detectors for measuring energy spectra of the transmitted X-rays. The measured energy spectra are used to determine atomic number of the object for identifying the material composition of the object. The X-ray scanning system may also have an array of collimated high energy backscattered X-ray detectors for measuring the energy spectrum of X-rays scattered by the object at an angle greater than 90 degrees, where the measured energy spectrum is used in conjunction with the transmission energy spectrum to determine atomic numbers of the object for identifying the material composition of the object.
    Type: Application
    Filed: February 23, 2011
    Publication date: September 29, 2011
    Inventors: Tsahi Gozani, Joseph Bendahan, Craig Mathew Brown, Willem Gerhardus Johannes Langeveld, John David Stevenson