Abstract: A ternary superlattice structure includes a substrate and periodic layer structure on the substrate and having alternating infrared absorbing semiconductor materials having a first layer of InAs[1-x]Sb[x] ternary alloy material, and a second layer of In[1-y]Z[y]As ternary alloy material, wherein Z is Ga or Al, wherein x is in a range of greater than zero and less than one, wherein y is in a range of greater than zero and less than one, and wherein a thickness of each of the first and second layers are substantially similar and configured to absorb light in a predetermined spectral band and prevent trapping of carriers in any particular layer. In examples, y is in a range from about 0.05 to about 0.35, and x is in a range of about 0.2 to about 0.8.

Abstract: A ternary superlattice structure includes a substrate and periodic layer structure on the substrate and having alternating infrared absorbing semiconductor materials having a first layer of InAs[1-x]Sb[x] ternary alloy material, and a second layer of In[1-y]Z[y]As ternary alloy material, wherein Z is Ga or Al, wherein x is in a range of greater than zero and less than one, wherein y is in a range of greater than zero and less than one, and wherein a thickness of each of the first and second layers are substantially similar and configured to absorb light in a predetermined spectral band and prevent trapping of carriers in any particular layer. In examples, y is in a range from about 0.05 to about 0.35, and x is in a range of about 0.2 to about 0.8.

Abstract: A photodetector includes a detector material having an upper layer, a lower layer, and at least one sidewall. Also included as part of the photodetector are a first contact electrically coupled to the detector material through the upper layer and a second contact electrically coupled to the detector material through the lower layer. Diffused into the sidewall by a passivation process is a dopant material operable to electrically isolate the first contact from the second contact via the sidewall. The dopant material is provided by a passivation layer deposited on the sidewall.

Abstract: A semiconductor based radiation detector utilizing a dual absorption layer system design to selectively respond to particular bands of incident radiation while rejecting others. Generally, a top absorption layer initially absorbs all radiation less than a cutoff wavelength. Radiation longer than the cutoff pass to a buried or second absorption layer. This second absorption layer has a smaller band gap energy corresponding with a larger cutoff wavelength than the top layer and is therefore responsive to longer wavelengths or radiation with lower energies. As such, preselected wavelengths or energy bands are detectable by the second layer while all other wavelengths or energy bands are either absorbed by the top layer or passed through both layers. The resultant absorption in the second layer is thereafter detectable to indicate the presence of the desired wavelength.