Patents by Inventor John E. Spittal, Jr.

John E. Spittal, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for secure scan testing
    Patent number: 7725788
    Abstract: A processor, scan controller, and method for protecting sensitive information from electronic hacking is disclosed. To maintain the security of the sensitive data present in a processor, the scan controller denies access to the scan chain until data is cleared from scan-observable portions of the processor, then clears the scan chain again prior to exiting test mode and resuming normal operation. Clearing or otherwise modifying data stored in the scan-observable portions of a processor when transitioning to and/or from a test mode will prevent unauthorized personnel from simply shifting secure data out of the scan chain, and from pre-loading data into the scan chain prior to normal operation in an attempt to set sensitive state information.
    Type: Grant
    Filed: January 25, 2007
    Date of Patent: May 25, 2010
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Thomas Tkacik, John E. Spittal, Jr., Jonathan Lutz, Lawrence Case, Douglas Hardy, Mark Redman, Gregory Schmidt, Steven Tugenberg, Michael D. Fitzsimmons, Darrell L. Carder
  • Method and apparatus for secure scan testing
    Patent number: 7185249
    Abstract: A processor, scan controller, and method for protecting sensitive information from electronic hacking is disclosed. To maintain the security of the sensitive data present in a processor, the scan controller denies access to the scan chain until data is cleared from scan-observable portions of the processor, then clears the scan chain again prior to exiting test mode and resuming normal operation. Clearing or otherwise modifying data stored in the scan-observable portions of a processor when transitioning to and/or from a test mode will prevent unauthorized personnel from simply shifting secure data out of the scan chain, and from pre-loading data into the scan chain prior to normal operation in an attempt to set sensitive state information.
    Type: Grant
    Filed: April 30, 2002
    Date of Patent: February 27, 2007
    Assignee: Freescale Semiconductor, Inc.
    Inventors: Thomas Tkacik, John E. Spittal, Jr., Jonathan Lutz, Lawrence Case, Douglas Hardy, Mark Redman, Gregory Schmidt, Steven Tugeberg, Michael D. Fitzsimmons, Darrell L. Carder