Patents by Inventor John E. Stannard

John E. Stannard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • High resolution differential spectrometry system
    Patent number: 5706092
    Abstract: A differential spectrometry system detects very narrow-band spectral features, while providing much higher optical transmittance and signal-to-noise ratios than prior optical-filter-based spectrometer systems. A plurality of light detectors (10a, 10b) detect light that falls within respective wide wavebands. The wide wavebands have overlapping and non-overlapping portions, one of which is the desired narrow waveband. The detector outputs are operated upon to produce an output signal (22) which includes substantially only the desired narrow waveband. In the preferred embodiment, the light detectors (10a, 10b) are implemented with a pair of optical detectors (30a, 30b) and respective optical interference filters (24a, 24b). The filters have substantially identical cut-off wavelengths (.lambda..sub.2) and cut-on wavelengths that are shifted by .DELTA..lambda. with respect to each other (.lambda..sub.1 and (.lambda..sub.1 +.DELTA..lambda.), respectively).
    Type: Grant
    Filed: January 21, 1997
    Date of Patent: January 6, 1998
    Assignee: Santa Barbara Research Center
    Inventors: John E. Stannard, Cathy M. Peterson, Roger A. West, Geoffrey A. Walter
  • High resolution differential spectrometry system
    Patent number: 5624709
    Abstract: A differential spectrometry system detects very narrow-band spectral features, while providing much higher optical transmittance and signal-to-noise ratios than prior optical-filter-based spectrometer systems. A plurality of light detectors (10a, 10b) detect light that falls within respective wide wavebands. The wide wavebands have overlapping and non-overlapping portions, one of which is the desired narrow waveband. The detector outputs are operated upon to produce an output signal (22) which includes substantially only the desired narrow waveband. In the preferred embodiment, the light detectors (10a, 10b) are implemented with a pair of optical detectors (30a, 30b) and respective optical interference filters (24a, 24b). The filters have substantially identical cut-off wavelengths (.lambda..sub.2) and cut-on wavelengths that are shifted by .DELTA..lambda. with respect to each other (.lambda..sub.1 and (.lambda..sub.1 +.DELTA..lambda.), respectively).
    Type: Grant
    Filed: June 7, 1995
    Date of Patent: April 29, 1997
    Assignee: Santa Barbara Research Center
    Inventors: John E. Stannard, Cathy M. Peterson, Roger A. West, Geoffrey A. Walter
  • Method and apparatus for testing infrared detectors
    Patent number: 4885463
    Abstract: Two broad blackbody sources (24, 26) having a constantly maintained temperature differential therebetween are alternately directed via a chopper (40) onto a detector array (12) for testing same.
    Type: Grant
    Filed: August 29, 1988
    Date of Patent: December 5, 1989
    Assignee: Santa Barbara Research Center
    Inventors: William H. Wellman, John E. Stannard