Patents by Inventor John E. Tristan

John E. Tristan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • DERIVED METRIC FOR MONITORING DIE PLACEMENT
    Publication number: 20080172142
    Abstract: A method for monitoring die placement includes receiving measurements of an alignment of a semiconductor die mounted in a package by a die packaging tool. The measurements include center offset metrics associated with displacement of a center of the die. A plurality of corner offset metrics is determined based on the center offset metrics and dimensions of the die. A maximum one of the corner offset metrics is selected as a die placement metric. An out of tolerance condition with the die packaging tool is identified based on the die placement metric.
    Type: Application
    Filed: January 12, 2007
    Publication date: July 17, 2008
    Inventor: John E. Tristan
  • Derived metric for monitoring die placement
    Patent number: 7390681
    Abstract: A method for monitoring die placement includes receiving measurements of an alignment of a semiconductor die mounted in a package by a die packaging tool. The measurements include center offset metrics associated with displacement of a center of the die. A plurality of corner offset metrics is determined based on the center offset metrics and dimensions of the die. A maximum one of the corner offset metrics is selected as a die placement metric. An out of tolerance condition with the die packaging tool is identified based on the die placement metric.
    Type: Grant
    Filed: January 12, 2007
    Date of Patent: June 24, 2008
    Assignee: Advanced Micro Devices, Inc.
    Inventor: John E. Tristan