Patents by Inventor John Enderby

John Enderby has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11733282
    Abstract: A probe for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials. The probe may include a capacitive measuring apparatus that includes at least two coplanar electrodes, an adjustment device to adjust a spatial separation between the electrodes, and a separation device. The separation device may maintain a substantially constant distance between the at least two coplanar electrodes and the test object during test measurements.
    Type: Grant
    Filed: May 24, 2022
    Date of Patent: August 22, 2023
    Assignee: AIRBUS HELICOPTERS
    Inventors: Laurent Bianchi, Sebastien Bernier, John Enderby, Mark Bowes, Dawood Parker
  • Patent number: 11366150
    Abstract: A probe for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials. The probe may include a capacitive measuring apparatus that includes at least two coplanar electrodes, an adjustment device to adjust a spatial separation between the electrodes, and a separation device. The separation device may maintain a substantially constant distance between the at least two coplanar electrodes and the test object during test measurements.
    Type: Grant
    Filed: November 26, 2018
    Date of Patent: June 21, 2022
    Assignee: AIRBUS HELICOPTERS
    Inventors: Laurent Bianchi, Sebastien Bernier, John Enderby, Mark Bowes, Dawood Parker
  • Patent number: 10876989
    Abstract: A method for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials. The method uses a database with predetermined reference values and a probe that comprises a capacitive measuring apparatus with at least two coplanar electrodes. The method includes the operations of placing the at least two coplanar electrodes into a first position that is at a predetermined distance from the test object, performing a capacitive measurement to determine an effective dielectric constant, retrieving a reference value of the predetermined reference values from the database based on the test object and the predetermined distance, and detecting imperfections in the test object based on a comparison of the effective dielectric constant with the reference value.
    Type: Grant
    Filed: October 10, 2018
    Date of Patent: December 29, 2020
    Assignee: AIRBUS HELICOPTERS
    Inventors: Laurent Bianchi, Sebastien Bernier, John Enderby, Mark Bowes, Dawood Parker
  • Patent number: 8970843
    Abstract: An optical assembly and method for the non-invasive determination of a concentration of an analyte in a tissue sample is disclosed. The assembly comprises an optical arrangement comprising a first optical interface for reflecting light incident thereon and a second optical interface for reflecting light incident thereon. The second interface comprises an interface between an optical element of the arrangement and the tissue sample under investigation. The light reflected from the first and second interfaces is arranged to combine to generate an interference pattern characteristic of a difference in phase between light reflected from the first interface with the light reflected from the second interface.
    Type: Grant
    Filed: July 1, 2011
    Date of Patent: March 3, 2015
    Assignee: Melys Diagnostics Ltd
    Inventors: John Enderby, Dawood Parker
  • Publication number: 20130155410
    Abstract: An optical assembly and method for the non-invasive determination of a concentration of an analyte in a tissue sample is disclosed. The assembly comprises an optical arrangement comprising a first optical interface for reflecting light incident thereon and a second optical interface for reflecting light incident thereon. The second interface comprises an interface between an optical element of the arrangement and the tissue sample under investigation. The light reflected from the first and second interfaces is arranged to combine to generate an interference pattern characteristic of a difference in phase between light reflected from the first interface with the light reflected from the second interface.
    Type: Application
    Filed: July 1, 2011
    Publication date: June 20, 2013
    Applicant: MELYS DIAGNOSTICS LTD
    Inventors: John Enderby, Dawood Parker