Patents by Inventor John Espinoza Sanchez, Jr.

John Espinoza Sanchez, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Determining a thickness of individual layers of a plurality of metal layers
    Patent number: 9791257
    Abstract: Techniques are described to determine a thickness of individual layers of a plurality of metal layers that include a first metal layer disposed on a polymer material and a second metal layer disposed on the first layer, such that the first layer is between the polymer material and the second layer. A measurement device may determine a resistance of the plurality of metal layers and calculate (e.g., estimate) a thickness of the individual layers based on the resistance of the individual layers and based on a resistivity of individual metals used in the plurality of metal layers. The measurement device may determine whether the individual thicknesses are within predetermined thickness ranges to determine whether to pass a quality control test.
    Type: Grant
    Filed: July 30, 2015
    Date of Patent: October 17, 2017
    Assignee: Amazon Technologies, Inc.
    Inventors: Mohammed Aftab Alam, Ramez Nachman, David Eric Peters, John Espinoza Sanchez, Jr.