Abstract: A multilevel semiconductor integrated circuit (IC) structure including a first interconnect level including a layer of dielectric material over a semiconductor substrate, the layer of dielectric material comprising a dense material for passivating semiconductor devices and local interconnects underneath; multiple interconnect layers of dielectric material formed above the layer of dense dielectric material, each layer of dielectric material including at least a layer of low-k dielectric material; and, a set of stacked via-studs in the low-k dielectric material layers, each of said set of stacked via studs interconnecting one or more patterned conductive structures, a conductive structure including a cantilever formed in the low-k dielectric material.

Abstract: A multilevel semiconductor integrated circuit (IC) structure including a first interconnect level including a layer of dielectric material over a semiconductor substrate, the layer of dielectric material comprising a dense material for passivating semiconductor devices and local interconnects underneath; multiple interconnect layers of dielectric material formed above the layer of dense dielectric material, each layer of dielectric material including at least a layer of low-k dielectric material; and, a set of stacked via-studs in the low-k dielectric material layers, each of said set of stacked via studs interconnecting one or more patterned conductive structures, a conductive structure including a cantilever formed in the low-k dielectric material.

Abstract: A constant deviation beam scanning apparatus having a rotatable beam deflector with at least one reflective surface thereof lying in a plane that intersects the axis of rotation at an acute angle. One embodiment utilizes a rotatable, truncated, n-sided pyramidal mirror with at least one planar reflective scanning segment located on one of the n-sides of the pyramidal mirror. The pyramidal mirror's truncation surface lies in a plane normal to the mirror's rotation axis and contains at least one planar reflective segment. A constant deviation reflector having two reflective surfaces is positioned so that a collimated beam of light reflected by the truncation surface reflective segment is reflected by one of the constant deviation reflective surfaces to the other reflective surface and then to the at least one planar reflective scanning segment of the pyramidal mirror.

Abstract: A constant deviation beam scanning apparatus having a rotatable beam deflector with at least one reflective surface thereof lying in a plane that intersects the axis of rotation at an acute angle. One embodiment utilizes a rotatable, truncated, n-sided pyramidal mirror with at least one planar reflective scanning segment located on one of the n-sides of the pyramidal mirror. The pyramidal mirror's truncation surface lies in a plane normal to the mirror's rotation axis and contains at least one planar reflective segment. A constant deviation reflector having two reflective surfaces is positioned so that a collimated beam of light reflected by the truncation surface reflective segment is reflected by one of the constant deviation reflective surfaces to the other reflective surface and then to the at least one planar reflective scanning segment of the pyramidal mirror.

Abstract: A photo display apparatus utilizing an assembly of slats having dados for permitting them to be meshed together in two or three dimensional configurations and provided with grooves in the sides for supporting the photographs.