Abstract: A high capacitance mirror driver cell provides reduced photocurrent leakage and includes a metal 1 layer comprising integrated circuit elements and a metal 2 layer comprising additional integrated circuit elements, the metal 2 layer being positioned over and associated with send metal 1 layer. A metal 3 layer blocking light and forming a ground plane and a metal 4 mirror layer covering at least a portion of said dielectric material and said metal 3 layer for forming a capacitive element operating to substantially reduce the effects of photocurrent leakage.

Abstract: In the present invention a method of testing a partially completely assembled module with integrated circuit dies mounted thereon is disclosed. The partially-completely assembled module has one or more first locations with integrated circuit dies mounted thereon and one or more second locations with integrated circuit dies to be mounted thereon and one or more electrical paths electrically connecting the first and second locations. A supplementary module with one or more electrical components assembled in the second locations and with one or more electrical components to be assembled in the first locations and with electrically identical electrical paths connecting the first and second locations as the testing module is also provided. The testing module and the supplementary module are mated together by electrically connecting the first and second locations of the testing module to the first and second locations of the supplementary module, respectively.