Patents by Inventor John F. X. Judge

John F. X. Judge has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5098187
    Abstract: The apparatus and method of the invention are applied to the generation of alternating sample, dark, reference and dark beams for direction of said sample and reference beams into an integrating sphere which comprises detecting means and a reference source, for spectroscopic analysis of a sample contained in a sample cell which is operatively associated with said integrating sphere; to the generation of digital control signals attendant the generation of said beams; and to the processing of the multiplexed, sample analysis results analog data signal, as provided by the detecting means, by aligning a digital control signal therewith in time and further operating upon the thusly aligned data signal to precisely calculate the sample analysis results therefrom.
    Type: Grant
    Filed: December 14, 1990
    Date of Patent: March 24, 1992
    Assignee: Alfa-Laval AB
    Inventor: John F. X. Judge
  • Patent number: 4274093
    Abstract: A keyboard is constructed as an integral member of a display screen. The keyboard comprises a number of keys which are back-lighted upon the screen when they are enabled, but which are otherwise invisible to the viewer when disabled. When a key is depressed, the lit keyboard is reconfigured, a new set of keys enabled, and a system function is performed.
    Type: Grant
    Filed: February 26, 1979
    Date of Patent: June 16, 1981
    Assignee: Technicon Instruments Corporation
    Inventor: John F. X. Judge
  • Patent number: 4236076
    Abstract: An infrared analyzer is described which analyzes constituents of a sample. The sample and/or reference signals are synchronously averaged to provide unisonous sample and reference values. This processing eliminates drift and signal noise from the measurements, thus providing a more sensitive and accurate characterization of the constituents of the sample.
    Type: Grant
    Filed: February 26, 1979
    Date of Patent: November 25, 1980
    Assignee: Technicon Instruments Corporation
    Inventors: John F. X. Judge, Victor G. Lipshutz
  • Patent number: 4047032
    Abstract: A standard, which is of ceramic material and preferably includes alumina, for spectral reflectance for use in near infrared reflectance measurements of constituents of samples, which constituents comprise oil, moisture and protein. The standard reflects electromagnetic radiation in the wavelength range of 1.0 - 2.5 micrometers and exhibits its best optical characteristics in the operational range of 1.4 - 2.4 micrometers.
    Type: Grant
    Filed: June 9, 1975
    Date of Patent: September 6, 1977
    Assignee: Technicon Instruments Corporation
    Inventors: John F. X. Judge, Jerome Salpeter