Patents by Inventor John Firman Whitaker

John Firman Whitaker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning electromagnetic-field imager with optical-fiber-based electro-optic field-mapping system
    Patent number: 6677769
    Abstract: A microwave and millimeter-wave electric-field mapping system based on electro-optic sampling has been developed using micromachined Gallium Arsenide crystals mounted on gradient index lenses and single-mode optical fibers. The probes are able to detect three orthogonal polarizations of electric fields and, due to the flexibility and size of the optical fiber, can be positioned not only from the extreme near-field to the far-field regions of microwave and millimeter-wave structures, but also inside of enclosures such as waveguides and packages. A microwave electric-field-mapping system based on micromachined GaAs electro-optic sampling probes mounted on gradient index lenses and single-mode optical fibers can extract field images from the interior of an enclosed microwave cavity.
    Type: Grant
    Filed: June 8, 2001
    Date of Patent: January 13, 2004
    Assignee: The Regents of the University of Michigan
    Inventors: John Firman Whitaker, Kyoung Yang, Linda P. B. Katehi
  • Scanning electromagnetic-field imager with optical-fiber-based electro-optic field-mapping system
    Publication number: 20020036491
    Abstract: A microwave and millimeter-wave electric-field mapping system based on electro-optic sampling has been developed using micromachined Gallium Arsenide crystals mounted on gradient index lenses and single-mode optical fibers. The probes are able to detect three orthogonal polarizations of electric fields and, due to the flexibility and size of the optical fiber, can be positioned not only from the extreme near-field to the far-field regions of microwave and millimeter-wave structures, but also inside of enclosures such as waveguides and packages. A microwave electric-field-mapping system based on micromachined GaAs electro-optic sampling probes mounted on gradient index lenses and single-mode optical fibers can extract field images from the interior of an enclosed microwave cavity.
    Type: Application
    Filed: June 8, 2001
    Publication date: March 28, 2002
    Inventors: John Firman Whitaker, Kyoung Yang, Linda P.B. Katehi