Abstract: A method for in-set evaluation of critical characteristics and parameters of components utilized in various devices. A component in a device to be evaluated is installed in the actual complex device using a socket for easy placement and removal of multiple components. Additional modifications are made to the device to permit logical evaluation of the critical component parameters of the component in the device. In an exemplary embodiment, evaluation of duplexers utilized in cordless and cellular telephones requires the placement of a desense switch to permit taking measurements in isolation and measurements affected by transmitter interference.