Abstract: A method and apparatus for filtering failures due to must-repair rows or columns from a memory test fail summary image includes current available redundant row failure counts respectively associated with rows of a memory device and current available redundant column failure counts associated with columns of the device. Respective failure counts are preloaded with the respective values of redundant rows and columns available for repairing the device. When failures in memory cells of the device are encountered, either during test, or during scan of an earlier generated error image, the row and column failure counts associated with the rows and columns containing the memory cell failures are decremented. At the end of a test, the value of the failure counts indicates whether the corresponding row or column contain any failures at all, whether the corresponding row or column is designated as a “must-repair” row or column, and otherwise how many errors the corresponding row or column contain.

Abstract: A delay management system in a computer system includes a delay manager and a first storage element that stores a delay time. The delay manager is configured to receive a series of delay values and respond to each delay value in the series of delay values by providing a corresponding delay time value. The delay time is updated to the corresponding delay time value if the corresponding delay time value is greater than the delay time.

Abstract: A delay management system in a computer system includes a delay manager and a first storage element that stores a delay time. The delay manager is configured to receive a series of delay values and respond to each delay value in the series of delay values by providing a corresponding delay time value. The delay time is updated to the corresponding delay time value if the corresponding delay time value is greater than the delay time.