Abstract: Apparatus include a photoelastic modulator (PEM) optical element, a controller having a frequency generator configured to produce a frequency signal at a selected frequency based on a clock signal of the controller wherein the controller is configured to produce a PEM driving signal based on the frequency signal, a PEM transducer coupled to the PEM optical element and the controller and configured to drive the PEM with the PEM driving signal, and a detector optically coupled to the PEM optical element and configured to receive a PEM modulated output and to produce a PEM detection signal that includes a PEM modulation signal, wherein the controller is configured to receive the PEM detection signal and to extract the PEM modulation signal from the PEM detection signal using the frequency signal and the clock signal.

Abstract: An apparatus includes an elastically deformable optical element holder situated to receive an optical element having a plurality of holder contact surfaces, the optical element holder including a plurality of receiving portions adjacent to an aperture and corresponding to respective holder contact surfaces, each receiving portion displaceable through deformation of the optical element holder so that the optical element is insertable in the aperture so as to be cushionably supported in a predetermined position with the receiving portions in contact with the respective holder contact surfaces.

Abstract: An apparatus includes a photoelastic modulator (PEM) optical element including a first driving axis and a second driving axis arranged at a selected angle with respect to each other and perpendicular to an optical axis, wherein the first driving axis and the second driving axis extend respective predetermined non-equal lengths that correspond to respective predetermined non-equal natural first and second PEM frequencies f1 and f2. Methods of manufacture and operation are also disclosed.

Abstract: Apparatus include a photoelastic modulator (PEM) optical element, a controller having a frequency generator configured to produce a frequency signal at a selected frequency based on a clock signal of the controller wherein the controller is configured to produce a PEM driving signal based on the frequency signal, a PEM transducer coupled to the PEM optical element and the controller and configured to drive the PEM with the PEM driving signal, and a detector optically coupled to the PEM optical element and configured to receive a PEM modulated output and to produce a PEM detection signal that includes a PEM modulation signal, wherein the controller is configured to receive the PEM detection signal and to extract the PEM modulation signal from the PEM detection signal using the frequency signal and the clock signal.

Abstract: An apparatus includes a photoelastic modulator (PEM) optical element including a first driving axis and a second driving axis arranged at a selected angle with respect to each other and perpendicular to an optical axis, wherein the first driving axis and the second driving axis extend respective predetermined non-equal lengths that correspond to respective predetermined non-equal natural first and second PEM frequencies f1 and f2. Methods of manufacture and operation are also disclosed.

Abstract: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one aspect, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. The spatially resolved imaging approach described here is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.

Abstract: An apparatus includes an elastically deformable optical element holder situated to receive an optical element having a plurality of holder contact surfaces, the optical element holder including a plurality of receiving portions adjacent to an aperture and corresponding to respective holder contact surfaces, each receiving portion displaceable through deformation of the optical element holder so that the optical element is insertable in the aperture so as to be cushionably supported in a predetermined position with the receiving portions in contact with the respective holder contact surfaces.

Abstract: This invention is directed to methods of unambiguously measuring the absolute retardance, ?A of an optical sample. A method for measuring absolute retardance of an optical sample includes directing light comprising a plurality of wavelengths through a polarization state generator source, the optical sample, and a polarization state analyzer, detecting, at an imaging device, retardance measurement light emanating from the optical sample after also passing through the polarization state analyzer at the plurality of wavelengths, determining a measurement retardance associated with the detected retardance measurement light at each of the wavelengths, and determining an absolute retardance associated with the optical sample based on the measurement retardances determined at each of the wavelengths.

Abstract: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one aspect, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. The spatially resolved imaging approach described here is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.

Abstract: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one example, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. An example spatially resolved imaging approach described herein is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.

Abstract: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one example, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. An example spatially resolved imaging approach described herein is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.

Abstract: This invention is directed to methods of unambiguously measuring the absolute retardance, ?A of an optical sample. A method for measuring absolute retardance of an optical sample includes directing light comprising a plurality of wavelengths through a polarization state generator source, the optical sample, and a polarization state analyzer, detecting, at an imaging device, retardance measurement light emanating from the optical sample after also passing through the polarization state analyzer at the plurality of wavelengths, determining a measurement retardance associated with the detected retardance measurement light at each of the wavelengths, and determining an absolute retardance associated with the optical sample based on the measurement retardances determined at each of the wavelengths.