Abstract: Systems and methods for monitoring a number of operating conditions of a programmable device are disclosed. In some implementations, the system may include a root monitor including circuitry configured to generate a reference voltage, a plurality of sensors and satellite monitors distributed across the programmable device, and a interconnect system coupled to the root monitor and to each of the plurality of satellite monitors. Each of the satellite monitors may be in a vicinity of and coupled to a corresponding one of the plurality of sensors via a local interconnect. The interconnect system may include one or more analog channels configured to distribute the reference voltage to each of the plurality of satellite monitors, and may include one or more digital channels configured to selectively route digital data from each of the plurality of satellite monitors to the root monitor as data packets.

Abstract: Systems and methods for monitoring a number of operating conditions of a programmable device are disclosed. In some implementations, the system may include a root monitor including circuitry configured to generate a reference voltage, a plurality of sensors and satellite monitors distributed across the programmable device, and a interconnect system coupled to the root monitor and to each of the plurality of satellite monitors. Each of the satellite monitors may be in a vicinity of and coupled to a corresponding one of the plurality of sensors via a local interconnect. The interconnect system may include one or more analog channels configured to distribute the reference voltage to each of the plurality of satellite monitors, and may include one or more digital channels configured to selectively route digital data from each of the plurality of satellite monitors to the root monitor as data packets.

Abstract: An apparatus for clock deskew includes: a first delay element configured to receive a clock signal from a clock, wherein the delay element comprises multiple delay lines; a first multiplexer coupled to the multiple delay lines; a sensor configured to sense a voltage, a temperature, or both, and to provide a sensor output based at least on the sensed voltage and/or the sensed temperature; and a converter configured to receive the sensor output, and to generate a converted signal; wherein the first multiplexer is configured to provide a delay line output from one of the multiple delay lines based at least in part on the converted signal.

Abstract: A method and apparatus for aligning an input signal to a clock signal in an integrated circuit are disclosed. The method includes receiving an input signal; determining whether the input signal is arriving too early or too late via a plurality of delay lines; and adjusting a delay of the plurality of delay lines in accordance with a result of the determining.

Abstract: A method of calibrating memory controller signals within an integrated circuit (IC) can include determining an internal delay of a clock network of the IC and generating a calibrated clock signal by applying a first delay to an uncalibrated clock signal, wherein the first delay is determined by subtracting the internal delay of the clock network of the IC from a bitperiod of the uncalibrated clock signal. The method can include determining a classification of at least one data signal according to timing of positive and negative edges of the at least one data signal in comparison with edges of the calibrated clock signal and aligning at least one of positive or negative edges of the at least one data signal to occur at midpoints between edges of the calibrated clock signal according to the classification of the at least one data signal.

Abstract: A method and apparatus for dynamically aligning high-speed signals in an integrated circuit are disclosed. For example, an integrated circuit according to one embodiment includes a logic fabric and at least one input/output interface coupled to the logic fabric. The input/output interface includes a plurality of input/output sites and an edge detector coupled to the plurality of input/output sites for detecting an edge in an input signal received by the integrated circuit. A plurality of delay lines are used to determine whether the input signal arrives too early or too late compared to a clock signal in the integrated circuit, and delays in the delay lines are adjusted to align the input signal with the clock signal in the integrated circuit.

Abstract: In one embodiment, a method and apparatus for configuring the internal memory cells of an integrated circuit through the logic fabric are disclosed. For example, an integrated circuit according to one embodiment includes a logic fabric and a plurality of input/output blocks coupled to the logic fabric, wherein the plurality of input/output blocks is positioned around the periphery of the logic fabric. The plurality of input/output blocks therefore forms a ring around the logic fabric, wherein a data path and a clock path are formed along the periphery of the logic fabric through the plurality of input/output blocks.

Abstract: In one embodiment, a method and apparatus for shifting the bits of a data word are disclosed. For example, a deserializer according to one embodiment includes an input register bank for capturing serial data comprising n bits, an intermediate register bank, and a strobe mux coupled to an input of the intermediate register bank. An input of the intermediate register bank is coupled to an output of the input register bank. The strobe mux comprises a single multiplexer configured to select a bitslip strobe signal that controls an order in which the n bits of the serial data are captured in the intermediate register bank.

Abstract: A programmable delay line includes a first oscillator that is enabled and generates a plurality of clock cycles of a clock signal in response to a transition of the input signal. A first programmable ripple counter is coupled to the first oscillator, counts with each successive clock cycle to a programmed count, and generates a first signal in response to reaching the programmed count. A control circuit is coupled to the first oscillator and to the first programmable ripple counter. The control circuit transitions the output signal and disables the first oscillator in response to the first signal.

Abstract: Multiple supply voltage select circuit for use with reduced supply voltage levels and method for using same are described. A first and second set of P-channel transistors are used for voltage pull-up at a common node using two supply voltages, respectively. A P-channel transistor from each of the sets is gated by output of a respective level shifter. Both of the level shifters are biased with a higher of the two supply voltages. First and second inputs are respectively provided to the level shifters and to gates of other P-channel transistors of each of the sets.

Abstract: Temperature measurement of an integrated circuit may be made using a bandgap voltage reference. In one example, a circuit includes a bandgap reference, a first output terminal, a second output terminal, and a calculation circuit. The bandgap reference includes a first amplifier having a first amplifier input coupled to a first transistor and a second amplifier input coupled to a second transistor. The first output terminal is coupled to the first and second transistors and is operable to provide a temperature independent voltage. The second output terminal is operable to provide a temperature dependent voltage. The calculation circuit is coupled to the first output terminal and the second output terminal and is configured to subtract from the temperature dependent voltage a difference between the temperature independent voltage and a nominal temperature independent voltage.