Patents by Inventor John G. Pitek

John G. Pitek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5155544
    Abstract: The Foucault or knife-edge method may be employed for testing an optical surface defined by an imaging device, for example, a mirror surface, to ascertain its characteristics, for example, whether or not it is a source of optical aberrations. To this end, the traditional Foucault knife-edge method typically employs a knife-edge that comprises a metal razor blade. The present method, in contrast, provides an improved Foucault method, and features a novel optical element suitable for employment in the method. The optical element comprises a transparent substrate, and a coating material that can adhere to at least a portion of the transparent substrate, thereby forming at least one knife-edge pattern.
    Type: Grant
    Filed: January 12, 1990
    Date of Patent: October 13, 1992
    Assignee: Eastman Kodak Company
    Inventors: Donald E. Vandenberg, Thomas W. Dey, William D. Humbel, John G. Pitek
  • Patent number: 5020905
    Abstract: The Foucault knife-edge test has been traditionally employed for testing a monolithic imaging device, for example, a mirror, to ascertain its characteristics, for example, whether or not it is a source of optical aberrations. The present invention, in contrast to the traditional Foucault employment, discloses a Foucault testing of a segmented optic, thereby significantly extending the utility of the Foucault test.
    Type: Grant
    Filed: February 27, 1990
    Date of Patent: June 4, 1991
    Assignee: Eastman Kodak Company
    Inventors: Thomas W. Dey, Edward M. Granger, Donald E. Vandenberg, John G. Pitek, William D. Humbel
  • Patent number: 4993831
    Abstract: The historical Foucault knife-edge test enables one to passively ascertain an optical imaging device's characteristics, for example, whether or not it is a source of optical aberrations. The historical Foucault knife-edge test corresponds to an open loop control system, since a control action, which is that quantity responsible for producing the imaging device characteristic, or open loop output, is independent of that output. The present invention, in sharp contrast to the historical Foucault knife-edge test, discloses a method for closing the Foucault open loop, so that the control action is somehow dependent on the output. In this way, accordingly, dynamic steps can be taken to compensate for, or remove the optical aberrations.
    Type: Grant
    Filed: March 21, 1990
    Date of Patent: February 19, 1991
    Assignee: Eastman Kodak Company
    Inventors: Donald E. Vandenberg, William D. Humbel, Thomas W. Dey, John G. Pitek
  • Patent number: 4979819
    Abstract: The historical Foucault knife-edge test enables one to qualitatively ascertain an optical imaging device's characteristics, for example, whether or not it is a source of optical aberrations. The novel method of the present invention, in sharp contrast, complements the historical Foucault knife-edge test, by expanding the test so as to develop a quantitative interpretation of the imaging device's characteristics. In particular, the novel method is suitable for determining a wavefront aberration over an entire surface of the imaging device.
    Type: Grant
    Filed: March 28, 1990
    Date of Patent: December 25, 1990
    Assignee: Eastman Kodak Company
    Inventors: William D. Humbel, Donald E. Vandenberg, Thomas W. Dey, John G. Pitek
  • Patent number: 4969737
    Abstract: The historical Foucault knife-edge test enables one to qualitatively ascertain an optical imaging device's characteristics, for example, whether or not it is a source of optical aberrations. The novel method of the present invention, in sharp contrast, complements the historical Foucault knife-edge test, by expanding the test so as to develop a quantitative interpretation of the imaging device's characteristics.
    Type: Grant
    Filed: February 27, 1990
    Date of Patent: November 13, 1990
    Assignee: Eastman Kodak Company
    Inventors: William D. Humbel, Donald E. Vandenberg, John G. Pitek, Thomas W. Dey