Patents by Inventor John Giannini

John Giannini has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Resolution enhancement for line scanning excitation microscopy systems and methods
    Patent number: 11106027
    Abstract: A resolution enhancement technique for a line scanning confocal microscopy system that generates vertical and horizontal line scanning patterns onto a sample is disclosed. The line scanning confocal microscopy system is capable of producing line scanning patterns through the use of two alternative pathways that generate either the vertical line scanning pattern or horizontal line scanning pattern.
    Type: Grant
    Filed: April 1, 2019
    Date of Patent: August 31, 2021
    Assignee: THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY, DEPARTMENT OF HEALTH AND HUMAN SERVICES
    Inventors: Hari Shroff, Andrew York, John Giannini, Abhishek Kumar
  • Systems and methods for instant total internal reflection fluorescence/ structured illumination microscopy
    Patent number: 10914933
    Abstract: Various embodiments related to systems and methods for instant structured microscopy where total internal reflection fluorescence techniques are used to improve optical sectioning and signal-to-noise ratio of structured illumination microscopy are herein disclosed.
    Type: Grant
    Filed: September 4, 2019
    Date of Patent: February 9, 2021
    Assignee: THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY, DEPARTMENT OF HEALTH AND HUMAN SERVICES
    Inventors: Hari Shroff, Justin Taraska, John Giannini, Yicong Wu, Abhishek Kumar, Min Guo
  • SYSTEMS AND METHODS FOR INSTANT TOTAL INTERNAL REFLECTION FLUORESCENCE/ STRUCTURED ILLUMINATION MICROSCOPY
    Publication number: 20200064611
    Abstract: Various embodiments related to systems and methods for instant structured microscopy where total internal reflection fluorescence techniques are used to improve optical sectioning and signal-to-noise ratio of structured illumination microscopy are herein disclosed.
    Type: Application
    Filed: September 4, 2019
    Publication date: February 27, 2020
    Inventors: Hari Shroff, Justin Taraska, John Giannini, Yicong Wu, Abhishek Kumar, Min Guo
  • Systems and methods for instant total internal reflection fluorescence/ structured illumination microscopy
    Patent number: 10520714
    Abstract: Embodiments related to systems and methods for instant structured microscopy where total internal reflection fluorescence techniques are used to improve optical sectioning and signal-to-noise ratio of structured illumination microscopy are disclosed.
    Type: Grant
    Filed: August 23, 2017
    Date of Patent: December 31, 2019
    Assignee: The United States of America, as represented by the Secretary, Department of Health and Human Services
    Inventors: Hari Shroff, Justin Taraska, John Giannini, Yicong Wu, Abhishek Kumar, Min Guo
  • RESOLUTION ENHANCEMENT FOR LINE SCANNING EXCITATION MICROSCOPY SYSTEMS AND METHODS
    Publication number: 20190227292
    Abstract: A resolution enhancement technique for a line scanning confocal microscopy system that generates vertical and horizontal line scanning patterns onto a sample is disclosed. The line scanning confocal microscopy system is capable of producing line scanning patterns through the use of two alternative pathways that generate either the vertical line scanning pattern or horizontal line scanning pattern.
    Type: Application
    Filed: April 1, 2019
    Publication date: July 25, 2019
    Inventors: Hari Shroff, Andrew York, John Giannini, Abhishek Kumar
  • SYSTEMS AND METHODS FOR INSTANT TOTAL INTERNAL REFLECTION FLUORESCENCE/ STRUCTURED ILLUMINATION MICROSCOPY
    Publication number: 20190179128
    Abstract: Embodiments related to systems and methods for instant structured microscopy where total internal reflection fluorescence techniques are used to improve optical sectioning and signal-to-noise ratio of structured illumination microscopy are disclosed.
    Type: Application
    Filed: August 23, 2017
    Publication date: June 13, 2019
    Inventors: Hari Shroff, Justin Taraska, John Giannini, Yicong Wu, Abhishek Kumar, Min Guo
  • Resolution enhancement for line scanning excitation microscopy systems and methods
    Patent number: 10247930
    Abstract: A resolution enhancement technique for a line scanning confocal microscopy system that generates vertical and horizontal line scanning patterns onto a sample is disclosed. The line scanning confocal microscopy system is capable of producing line scanning patterns through the use of two alternative pathways that generate either the vertical line scanning pattern or horizontal line scanning pattern.
    Type: Grant
    Filed: September 22, 2015
    Date of Patent: April 2, 2019
    Assignee: The United States of America, as Represented by the Secretary, Department of Health and Human Services
    Inventors: Hari Shroff, Andrew York, John Giannini, Abhishek Kumar
  • RESOLUTION ENHANCEMENT FOR LINE SCANNING EXCITATION MICROSCOPY SYSTEMS AND METHODS
    Publication number: 20170254997
    Abstract: A resolution enhancement technique for a line scanning confocal microscopy system that generates vertical and horizontal line scanning patterns onto a sample is disclosed. The line scanning confocal microscopy system is capable of producing line scanning patterns through the use of two alternative pathways that generate either the vertical line scanning pattern or horizontal line scanning pattern.
    Type: Application
    Filed: September 22, 2015
    Publication date: September 7, 2017
    Inventors: Hari Shroff, Andrew York, John Giannini, Abhishek Kumar