Abstract: An apparatus for use with automatic testing equipment for testing infrared sensors on integrated circuits is provided. The apparatus includes an infrared source, a heat mass, and an electronic frequency modulator. The infrared source is modulated according to a predetermined test frequency such that the infrared source emits an infrared test signal representative of a test temperature and corresponding to the temperature of the heat mass and the predetermined test frequency. A signal processor, electrically coupled to an integrated circuit having an infrared sensor, receives a sensed signal from the infrared sensor in response to the infrared test signal and uses the sensed signal according to the predetermined test frequency to determine a measured temperature.

Abstract: An apparatus for use with automatic testing equipment for testing infrared sensors on integrated circuits is provided. The apparatus includes an infrared source, a heat mass, and an electronic frequency modulator. The infrared source is modulated according to a predetermined test frequency such that the infrared source emits an infrared test signal representative of a test temperature and corresponding to the temperature of the heat mass and the predetermined test frequency. A signal processor, electrically coupled to an integrated circuit having an infrared sensor, receives a sensed signal from the infrared sensor in response to the infrared test signal and uses the sensed signal according to the predetermined test frequency to determine a measured temperature.

Abstract: A device under test pogo pin type contactor features an active head and an electronic component associated with the active head. A tip is spaced from the active head and a biasing device is between the active head and the tip for biasing the active head against a device under test.

Abstract: A testing system contactor with an integral temperature measurement sensor.

Abstract: A device under test pogo pin type contactor features an active head and an electronic component associated with the active head. A tip is spaced from the active head and a biasing device is between the active head and the tip for biasing the active head against a device under test.

Abstract: A testing system contactor with an integral temperature measurement sensor.

Abstract: A game piece and method of game playing is disclosed wherein individual game pieces include a multi-piece base with scoring indicia printed on a top portion. The top is rotatable with respect to a bottom portion. A slotted aperture in the top reveals data that varies as the top portion is rotated with respect to the bottom. The variable numbers indicate capability characteristics of the particular game piece. In addition, the base includes slots for the addition of items that enhance the capabilities of the individual game piece. A plurality of additional items fit in the slots with each additional item affecting the numeric values of that character. The items may be dropped or picked up during the game thus permitting customization of each game piece as well as the ability to dynamically alter the characteristics of each game piece.