Patents by Inventor John H. Cantrell
John H. Cantrell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11185232Abstract: Systems and methods for measuring phase dynamics and other properties (e.g. intracranial pressure) are disclosed. For example, the system may generate a reference waveform and a measurement waveform using digital synthesizers, each waveform having an identical constant frequency but also a relative phase shift. Next, system may send a tone-burst, via a transducer, into a sample (e.g. a skull or a bonded material), and then receive a reflected tone-burst in response. Then, a phase difference between the received tone-burst and the measurement waveform may be determined with a linear phase detector. Next, the phase shift of the measurement waveform may be adjusted, by the determined phase difference, such that there is no longer any phase difference between the received tone-burst and the adjusted measurement waveform generated by the appropriate digital synthesizer. A similar adjustment may occur after subsequent tone-bursts, allowing accurate monitoring of continuously variable phase relationships.Type: GrantFiled: August 16, 2019Date of Patent: November 30, 2021Assignee: UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASAInventors: William T. Yost, John H. Cantrell, Daniel F. Perey
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Publication number: 20200000339Abstract: Systems and methods for measuring phase dynamics and other properties (e.g. intracranial pressure) are disclosed. For example, the system may generate a reference waveform and a measurement waveform using digital synthesizers, each waveform having an identical constant frequency but also a relative phase shift. Next, system may send a tone-burst, via a transducer, into a sample (e.g. a skull or a bonded material), and then receive a reflected tone-burst in response. Then, a phase difference between the received tone-burst and the measurement waveform may be determined with a linear phase detector. Next, the phase shift of the measurement waveform may be adjusted, by the determined phase difference, such that there is no longer any phase difference between the received tone-burst and the adjusted measurement waveform generated by the appropriate digital synthesizer. A similar adjustment may occur after subsequent tone-bursts, allowing accurate monitoring of continuously variable phase relationships.Type: ApplicationFiled: August 16, 2019Publication date: January 2, 2020Inventors: William T. Yost, John H. Cantrell, Daniel F. Perey
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Patent number: 10390704Abstract: Systems and methods for measuring phase dynamics and other properties (e.g. intracranial pressure) are disclosed. For example, the system may generate a reference waveform and a measurement waveform using digital synthesizers, each waveform having an identical constant frequency but also a relative phase shift. Next, system may send a tone-burst, via a transducer, into a sample (e.g. a skull or a bonded material), and then receive a reflected tone-burst in response. Then, a phase difference between the received tone-burst and the measurement waveform may be determined with a linear phase detector. Next, the phase shift of the measurement waveform may be adjusted, by the determined phase difference, such that there is no longer any phase difference between the received tone-burst and the adjusted measurement waveform generated by the appropriate digital synthesizer. A similar adjustment may occur after subsequent tone-bursts, allowing accurate monitoring of continuously variable phase relationships.Type: GrantFiled: March 9, 2016Date of Patent: August 27, 2019Assignee: United States of America as represented by the Administrator of NASAInventors: William T. Yost, John H. Cantrell, Daniel F. Perey
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Publication number: 20160262621Abstract: Systems and methods for measuring phase dynamics and other properties (e.g. intracranial pressure) are disclosed. For example, the system may generate a reference waveform and a measurement waveform using digital synthesizers, each waveform having an identical constant frequency but also a relative phase shift. Next, system may send a tone-burst, via a transducer, into a sample (e.g. a skull or a bonded material), and then receive a reflected tone-burst in response. Then, a phase difference between the received tone-burst and the measurement waveform may be determined with a linear phase detector. Next, the phase shift of the measurement waveform may be adjusted, by the determined phase difference, such that there is no longer any phase difference between the received tone-burst and the adjusted measurement waveform generated by the appropriate digital synthesizer. A similar adjustment may occur after subsequent tone-bursts, allowing accurate monitoring of continuously variable phase relationships.Type: ApplicationFiled: March 9, 2016Publication date: September 15, 2016Inventors: William T. Yost, John H. Cantrell, Daniel F. Perey
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Patent number: 7845215Abstract: A scanning probe microscope and methodology called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create images of nanoscale near-surface and subsurface features.Type: GrantFiled: August 24, 2007Date of Patent: December 7, 2010Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: John H. Cantrell, Sean A. Cantrell
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Publication number: 20080295584Abstract: A scanning probe microscope and methodology called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create images of nanoscale near-surface and subsurface features.Type: ApplicationFiled: August 24, 2007Publication date: December 4, 2008Applicant: Administrator of the National Aeronautics and Space AdministrationInventors: John H. Cantrell, Sean Cantrell
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Patent number: 6773407Abstract: A method is presented for determining absolute intracranial pressure (ICP) in a patient. Skull expansion is monitored while changes in ICP are induced. The patient's blood pressure is measured when skull expansion is approximately zero. The measured blood pressure is indicative of a reference ICP value. Subsequently, the method causes a known change in ICP and measures the change in skull expansion associated therewith. The absolute ICP is a function of the reference ICP value, the known change in ICP and its associated change in skull expansion, and a measured change in skull expansion.Type: GrantFiled: September 25, 2002Date of Patent: August 10, 2004Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell, Jr., Alan E. Hargens
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Patent number: 6761695Abstract: A method and apparatus for measuring intracranial pressure. In one embodiment, the method comprises the steps of generating an information signal that comprises components (e.g., pulsatile changes and slow changes) that are related to intracranial pressure and blood pressure, generating a reference signal comprising pulsatile components that are solely related to blood pressure, processing the information and reference signals to determine the pulsatile components of the information signal that have generally the same phase as the pulsatile components of the reference signal, and removing from the information signal the pulsatile components determined to have generally the same phase as the pulsatile components of the reference signal so as to provide a data signal having components wherein substantially all of the components are related to intracranial pressure.Type: GrantFiled: March 7, 2002Date of Patent: July 13, 2004Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell, Jr.
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Patent number: 6746410Abstract: A method and apparatus for measuring changes in intracranial pressure (ICP) utilizing the variation of the surface wave propagation parameters of the patient's skull to determine the change in ICP.Type: GrantFiled: April 4, 2002Date of Patent: June 8, 2004Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell, Jr.
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Patent number: 6740048Abstract: A method is presented for determining diastolic intracranial pressure (ICP) in a patient. A first change in the length of a path across the skull of the patient caused by a known change in ICP is measured and used to determine an elasticity constant for the patient. Next, a second change in the length of the path across the patient's skull occurring between systolic and diastolic portions of the patient's heartbeat is measured. The patient's diastolic ICP is a function of the elasticity constant and the second change.Type: GrantFiled: September 25, 2002Date of Patent: May 25, 2004Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell, Jr., Alan R. Hargens
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Publication number: 20030191410Abstract: A method is presented for determining diastolic intracranial pressure (ICP) in a patient. A first change in the length of a path across the skull of the patient caused by a known change in ICP is measured and used to determine an elasticity constant for the patient. Next, a second change in the length of the path across the patient's skull occurring between systolic and diastolic portions of the patient's heartbeat is measured. The patient's diastolic ICP is a function of the elasticity constant and the second change.Type: ApplicationFiled: September 25, 2002Publication date: October 9, 2003Applicant: National Aeronautics and Space Administration as represented by the Administrator (NASA)Inventors: William T. Yost, John H. Cantrell, Alan R. Hargens
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Publication number: 20030191411Abstract: A method is presented for determining absolute intracranial pressure (ICP) in a patient. Skull expansion is monitored while changes in ICP are induced. The patient's blood pressure is measured when skull expansion is approximately zero. The measured blood pressure is indicative of a reference ICP value. Subsequently, the method causes a known change in ICP and measures the change in skull expansion associated therewith. The absolute ICP is a function of the reference ICP value, the known change in ICP and its associated change in skull expansion, and a measured change in skull expansion.Type: ApplicationFiled: September 25, 2002Publication date: October 9, 2003Applicant: National Aeronautics and Space Administration as represented by the Administrator (NASA)Inventors: William T. Yost, John H. Cantrell, Alan R. Hargens
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Publication number: 20030191409Abstract: A method and apparatus for measuring changes in intracranial pressure (ICP) utilizing the variation of the surface wave propagation parameters of the patient's skull to determine the change in ICP. In one embodiment, the method comprises the steps of transmitting an ultrasonic bulk compressional wave onto the surface of the skull at a predetermined angle with respect to the skull so as to produce a surface wave, receiving the surface wave at an angle with respect to the skull which is substantially the same as the predetermined angle and at a location that is a predetermined distance from where the ultrasonic bulk compressional wave was transmitted upon the skull, determining the retardation or advancement in phase of the received surface wave with respect to a reference phase, and processing the determined retardation or advancement in phase to determine circumferential expansion or contraction of the skull and utilizing the determined circumferential change to determine the change in intracranial pressure.Type: ApplicationFiled: April 4, 2002Publication date: October 9, 2003Applicant: National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell
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Publication number: 20030171693Abstract: A method and apparatus for measuring intracranial pressure. In one embodiment, the method comprises the steps of generating an information signal that comprises components (e.g., pulsatile changes and slow changes) that are related to intracranial pressure and blood pressure, generating a reference signal comprising pulsatile components that are solely related to blood pressure, processing the information and reference signals to determine the pulsatile components of the information signal that have generally the same phase as the pulsatile components of the reference signal, and removing from the information signal the pulsatile components determined to have generally the same phase as the pulsatile components of the reference signal so as to provide a data signal having components wherein substantially all of the components are related to intracranial pressure.Type: ApplicationFiled: March 7, 2002Publication date: September 11, 2003Inventors: William T. Yost, John H. Cantrell
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Patent number: 6584848Abstract: An acoustic nonlinearity parameter (&bgr;) measurement method and system for Non-Destructive Evaluation (NDE) of materials and structural members novelly employs a loosely mounted dielectric electrostatic ultrasonic transducer (DEUT) to receive and convert ultrasonic energy into an electrical signal which can be analyzed to determine the &bgr; of the test material. The dielectric material is ferroelectric with a high dielectric constant ∈. A computer-controlled measurement system coupled to the DEUT contains an excitation signal generator section and a measurement and analysis section. As a result, the DEUT measures the absolute particle displacement amplitudes in test material, leading to derivation of the nonlinearity parameter (&bgr;) without the costly, low field reliability methods of the prior art.Type: GrantFiled: September 30, 2002Date of Patent: July 1, 2003Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell, Jr.
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Patent number: 6475147Abstract: Changes in intracranial pressure can be measured dynamically and non-invasively by monitoring one or more cerebrospinal fluid pulsatile components. Pulsatile components such as systolic and diastolic blood pressures are partially transferred to the cerebrospinal fluid by way of blood vessels contained in the surrounding brain tissue and membrane. As intracranial pressure varies these cerebrospinal fluid pulsatile components also vary. Thus, intracranial pressure can be dynamically measured. Furthermore, use of acoustics allows the measurement to be completely non-invasive. In the preferred embodiment, phase comparison of a reflected acoustic signal to a reference signal using a constant frequency pulsed phase-locked-loop ultrasonic device allows the pulsatile components to be monitored. Calibrating the device by inducing a known change in intracranial pressure allows conversion to changes in intracranial pressure.Type: GrantFiled: January 27, 2000Date of Patent: November 5, 2002Assignee: The United States of America as represented by the United States National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell
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Patent number: 6413227Abstract: A non-invasive method and apparatus for monitoring changes in intracranial pressure which removes extracranial effects from the measurements. The method and apparatus can include the supplying of a fixed frequency electrical output to a transducer coupled to the patient's head, thereby generating an acoustical tone burst in the patient's head which generates a first echo and a second echo, the first echo reflecting from a first interface in the side of the patient's head coupled to the transducer, and the second echo reflecting from a second interface at the opposite side of the patient's head. The first and second echoes are received by the transducer which can generate a first electrical signal and a second electrical signal, wherein the first and second electrical signals vary in accordance with the corresponding first and second echoes.Type: GrantFiled: December 2, 1999Date of Patent: July 2, 2002Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell
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Patent number: 6343513Abstract: An acoustic non-linearity parameter (&bgr;) measurement method and system for Non-Destructive Evaluation (NDE) of materials and structural members obviates the need for electronic calibration of the measuring equipment. Unlike known substitutional measuring techniques requiring elaborate calibration procedures, the electrical outputs of the capacitive detector of a sample with known &bgr; and the test sample of unknown &bgr; are compared to determine the unknown &bgr;. In order to provide the necessary stability of the present-inventive reference-based approach, the bandpass filters of the measurement system are maintained in a temperature-controlled environment, and the line voltage supplied to said amplifiers is well-regulated.Type: GrantFiled: July 14, 2000Date of Patent: February 5, 2002Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell
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Patent number: 6197130Abstract: A method and apparatus are provided which enable the nondestructive testing of strength of a heat treated alloy. An alloy is insonified with an ultrasonic signal. The resulting convoluted signal is detected and the acoustic nonlinearity parameter is determined. The acoustic nonlinearity parameter shows a peak corresponding to a peak in material strength.Type: GrantFiled: April 24, 1998Date of Patent: March 6, 2001Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: John H. Cantrell, William T. Yost
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Patent number: 6007489Abstract: A method and apparatus for determining important histological characteristics of tissue, including a determination of the tissue's health. Electrical pulses are converted into meaningful numerical representations through the use of Fourier Transforms. These numerical representations are then used to determine important histological characteristics of tissue. This novel invention does not require rectification and thus provides for detailed information from the ultrasonic scan.Type: GrantFiled: April 21, 1998Date of Patent: December 28, 1999Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell, George A. Tal Er