Patents by Inventor John H. Cantrell
John H. Cantrell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11185232Abstract: Systems and methods for measuring phase dynamics and other properties (e.g. intracranial pressure) are disclosed. For example, the system may generate a reference waveform and a measurement waveform using digital synthesizers, each waveform having an identical constant frequency but also a relative phase shift. Next, system may send a tone-burst, via a transducer, into a sample (e.g. a skull or a bonded material), and then receive a reflected tone-burst in response. Then, a phase difference between the received tone-burst and the measurement waveform may be determined with a linear phase detector. Next, the phase shift of the measurement waveform may be adjusted, by the determined phase difference, such that there is no longer any phase difference between the received tone-burst and the adjusted measurement waveform generated by the appropriate digital synthesizer. A similar adjustment may occur after subsequent tone-bursts, allowing accurate monitoring of continuously variable phase relationships.Type: GrantFiled: August 16, 2019Date of Patent: November 30, 2021Assignee: UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASAInventors: William T. Yost, John H. Cantrell, Daniel F. Perey
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Publication number: 20200000339Abstract: Systems and methods for measuring phase dynamics and other properties (e.g. intracranial pressure) are disclosed. For example, the system may generate a reference waveform and a measurement waveform using digital synthesizers, each waveform having an identical constant frequency but also a relative phase shift. Next, system may send a tone-burst, via a transducer, into a sample (e.g. a skull or a bonded material), and then receive a reflected tone-burst in response. Then, a phase difference between the received tone-burst and the measurement waveform may be determined with a linear phase detector. Next, the phase shift of the measurement waveform may be adjusted, by the determined phase difference, such that there is no longer any phase difference between the received tone-burst and the adjusted measurement waveform generated by the appropriate digital synthesizer. A similar adjustment may occur after subsequent tone-bursts, allowing accurate monitoring of continuously variable phase relationships.Type: ApplicationFiled: August 16, 2019Publication date: January 2, 2020Inventors: William T. Yost, John H. Cantrell, Daniel F. Perey
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Patent number: 10390704Abstract: Systems and methods for measuring phase dynamics and other properties (e.g. intracranial pressure) are disclosed. For example, the system may generate a reference waveform and a measurement waveform using digital synthesizers, each waveform having an identical constant frequency but also a relative phase shift. Next, system may send a tone-burst, via a transducer, into a sample (e.g. a skull or a bonded material), and then receive a reflected tone-burst in response. Then, a phase difference between the received tone-burst and the measurement waveform may be determined with a linear phase detector. Next, the phase shift of the measurement waveform may be adjusted, by the determined phase difference, such that there is no longer any phase difference between the received tone-burst and the adjusted measurement waveform generated by the appropriate digital synthesizer. A similar adjustment may occur after subsequent tone-bursts, allowing accurate monitoring of continuously variable phase relationships.Type: GrantFiled: March 9, 2016Date of Patent: August 27, 2019Assignee: United States of America as represented by the Administrator of NASAInventors: William T. Yost, John H. Cantrell, Daniel F. Perey
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Publication number: 20160262621Abstract: Systems and methods for measuring phase dynamics and other properties (e.g. intracranial pressure) are disclosed. For example, the system may generate a reference waveform and a measurement waveform using digital synthesizers, each waveform having an identical constant frequency but also a relative phase shift. Next, system may send a tone-burst, via a transducer, into a sample (e.g. a skull or a bonded material), and then receive a reflected tone-burst in response. Then, a phase difference between the received tone-burst and the measurement waveform may be determined with a linear phase detector. Next, the phase shift of the measurement waveform may be adjusted, by the determined phase difference, such that there is no longer any phase difference between the received tone-burst and the adjusted measurement waveform generated by the appropriate digital synthesizer. A similar adjustment may occur after subsequent tone-bursts, allowing accurate monitoring of continuously variable phase relationships.Type: ApplicationFiled: March 9, 2016Publication date: September 15, 2016Inventors: William T. Yost, John H. Cantrell, Daniel F. Perey
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Patent number: 7845215Abstract: A scanning probe microscope and methodology called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create images of nanoscale near-surface and subsurface features.Type: GrantFiled: August 24, 2007Date of Patent: December 7, 2010Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: John H. Cantrell, Sean A. Cantrell
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Publication number: 20080295584Abstract: A scanning probe microscope and methodology called resonant difference-frequency atomic force ultrasonic microscopy (RDF-AFUM), employs an ultrasonic wave launched from the bottom of a sample while the cantilever of an atomic force microscope, driven at a frequency differing from the ultrasonic frequency by one of the contact resonance frequencies of the cantilever, engages the sample top surface. The nonlinear mixing of the oscillating cantilever and the ultrasonic wave in the region defined by the cantilever tip-sample surface interaction force generates difference-frequency oscillations at the cantilever contact resonance. The resonance-enhanced difference-frequency signals are used to create images of nanoscale near-surface and subsurface features.Type: ApplicationFiled: August 24, 2007Publication date: December 4, 2008Applicant: Administrator of the National Aeronautics and Space AdministrationInventors: John H. Cantrell, Sean Cantrell
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Publication number: 20030191409Abstract: A method and apparatus for measuring changes in intracranial pressure (ICP) utilizing the variation of the surface wave propagation parameters of the patient's skull to determine the change in ICP. In one embodiment, the method comprises the steps of transmitting an ultrasonic bulk compressional wave onto the surface of the skull at a predetermined angle with respect to the skull so as to produce a surface wave, receiving the surface wave at an angle with respect to the skull which is substantially the same as the predetermined angle and at a location that is a predetermined distance from where the ultrasonic bulk compressional wave was transmitted upon the skull, determining the retardation or advancement in phase of the received surface wave with respect to a reference phase, and processing the determined retardation or advancement in phase to determine circumferential expansion or contraction of the skull and utilizing the determined circumferential change to determine the change in intracranial pressure.Type: ApplicationFiled: April 4, 2002Publication date: October 9, 2003Applicant: National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell
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Publication number: 20030191410Abstract: A method is presented for determining diastolic intracranial pressure (ICP) in a patient. A first change in the length of a path across the skull of the patient caused by a known change in ICP is measured and used to determine an elasticity constant for the patient. Next, a second change in the length of the path across the patient's skull occurring between systolic and diastolic portions of the patient's heartbeat is measured. The patient's diastolic ICP is a function of the elasticity constant and the second change.Type: ApplicationFiled: September 25, 2002Publication date: October 9, 2003Applicant: National Aeronautics and Space Administration as represented by the Administrator (NASA)Inventors: William T. Yost, John H. Cantrell, Alan R. Hargens
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Publication number: 20030191411Abstract: A method is presented for determining absolute intracranial pressure (ICP) in a patient. Skull expansion is monitored while changes in ICP are induced. The patient's blood pressure is measured when skull expansion is approximately zero. The measured blood pressure is indicative of a reference ICP value. Subsequently, the method causes a known change in ICP and measures the change in skull expansion associated therewith. The absolute ICP is a function of the reference ICP value, the known change in ICP and its associated change in skull expansion, and a measured change in skull expansion.Type: ApplicationFiled: September 25, 2002Publication date: October 9, 2003Applicant: National Aeronautics and Space Administration as represented by the Administrator (NASA)Inventors: William T. Yost, John H. Cantrell, Alan R. Hargens
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Publication number: 20030171693Abstract: A method and apparatus for measuring intracranial pressure. In one embodiment, the method comprises the steps of generating an information signal that comprises components (e.g., pulsatile changes and slow changes) that are related to intracranial pressure and blood pressure, generating a reference signal comprising pulsatile components that are solely related to blood pressure, processing the information and reference signals to determine the pulsatile components of the information signal that have generally the same phase as the pulsatile components of the reference signal, and removing from the information signal the pulsatile components determined to have generally the same phase as the pulsatile components of the reference signal so as to provide a data signal having components wherein substantially all of the components are related to intracranial pressure.Type: ApplicationFiled: March 7, 2002Publication date: September 11, 2003Inventors: William T. Yost, John H. Cantrell
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Patent number: 6475147Abstract: Changes in intracranial pressure can be measured dynamically and non-invasively by monitoring one or more cerebrospinal fluid pulsatile components. Pulsatile components such as systolic and diastolic blood pressures are partially transferred to the cerebrospinal fluid by way of blood vessels contained in the surrounding brain tissue and membrane. As intracranial pressure varies these cerebrospinal fluid pulsatile components also vary. Thus, intracranial pressure can be dynamically measured. Furthermore, use of acoustics allows the measurement to be completely non-invasive. In the preferred embodiment, phase comparison of a reflected acoustic signal to a reference signal using a constant frequency pulsed phase-locked-loop ultrasonic device allows the pulsatile components to be monitored. Calibrating the device by inducing a known change in intracranial pressure allows conversion to changes in intracranial pressure.Type: GrantFiled: January 27, 2000Date of Patent: November 5, 2002Assignee: The United States of America as represented by the United States National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell
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Patent number: 6413227Abstract: A non-invasive method and apparatus for monitoring changes in intracranial pressure which removes extracranial effects from the measurements. The method and apparatus can include the supplying of a fixed frequency electrical output to a transducer coupled to the patient's head, thereby generating an acoustical tone burst in the patient's head which generates a first echo and a second echo, the first echo reflecting from a first interface in the side of the patient's head coupled to the transducer, and the second echo reflecting from a second interface at the opposite side of the patient's head. The first and second echoes are received by the transducer which can generate a first electrical signal and a second electrical signal, wherein the first and second electrical signals vary in accordance with the corresponding first and second echoes.Type: GrantFiled: December 2, 1999Date of Patent: July 2, 2002Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell
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Patent number: 6343513Abstract: An acoustic non-linearity parameter (&bgr;) measurement method and system for Non-Destructive Evaluation (NDE) of materials and structural members obviates the need for electronic calibration of the measuring equipment. Unlike known substitutional measuring techniques requiring elaborate calibration procedures, the electrical outputs of the capacitive detector of a sample with known &bgr; and the test sample of unknown &bgr; are compared to determine the unknown &bgr;. In order to provide the necessary stability of the present-inventive reference-based approach, the bandpass filters of the measurement system are maintained in a temperature-controlled environment, and the line voltage supplied to said amplifiers is well-regulated.Type: GrantFiled: July 14, 2000Date of Patent: February 5, 2002Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell
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Patent number: 6197130Abstract: A method and apparatus are provided which enable the nondestructive testing of strength of a heat treated alloy. An alloy is insonified with an ultrasonic signal. The resulting convoluted signal is detected and the acoustic nonlinearity parameter is determined. The acoustic nonlinearity parameter shows a peak corresponding to a peak in material strength.Type: GrantFiled: April 24, 1998Date of Patent: March 6, 2001Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: John H. Cantrell, William T. Yost
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Patent number: 6007489Abstract: A method and apparatus for determining important histological characteristics of tissue, including a determination of the tissue's health. Electrical pulses are converted into meaningful numerical representations through the use of Fourier Transforms. These numerical representations are then used to determine important histological characteristics of tissue. This novel invention does not require rectification and thus provides for detailed information from the ultrasonic scan.Type: GrantFiled: April 21, 1998Date of Patent: December 28, 1999Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell, George A. Tal Er
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Patent number: 5746209Abstract: A method and apparatus for determining important histological characteristics of tissue, including a determination of the tissue's health. Electrical pulses are converted into meaningful numerical representations through the use of Fourier Transforms. These numerical representations are then used to determine important histological characteristics of tissue. This novel invention does not require rectification and thus provides for detailed information from the ultrasonic scan.Type: GrantFiled: January 26, 1996Date of Patent: May 5, 1998Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell, George A. Taler
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Patent number: 5736642Abstract: A method and system are provided to detect defects in a material. Waves of known frequency(ies) are mixed at an interaction zone in the material. As a result, at least one of a difference wave and a sum wave are generated in the interaction zone. The difference wave occurs at a difference frequency and the sum wave occurs at a sum frequency. The amplitude of at least one nonlinear signal based on the sum and/or difference waves is then measured. The nonlinear signal is defined as the amplitude of one of the difference wave and sum wave relative to the product of the amplitude of the surface waves. The amplitude of the nonlinear signal is an indication of defects (e.g., dislocation dipole density) in the interaction zone.Type: GrantFiled: January 8, 1997Date of Patent: April 7, 1998Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell
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Patent number: 5448995Abstract: A method for non-invasive evaluation of diaphragmatic function in humans measures the thickness of the diaphragm in real time with an ultrasonic device, and displays the variations of diaphragm thickness versus time. Formulae are given for calculating a quantitative value for the reserve fatigue capacity of a patient's diaphragm from data obtained by measuring the time limits for maintaining a constant breathing pattern on the display at two different pressure differentials in series with the patient's airways. An apparatus for displaying the diaphragm thickness in real time is also described. The method can be used both on healthy patients and on patients with so severe breathing dysfunctions that they require breathing support from respirators.Type: GrantFiled: February 14, 1994Date of Patent: September 12, 1995Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, Juliette L. Wait, Patricia A. Nahormek, John H. Cantrell, Pamela D. Hanna-Hawver
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Patent number: 5325339Abstract: Calibrating an ultrasonic transducer can be performed with a reduced number of calculations and testing. A wide-band pulser is connected to an ultrasonic transducer under test to generate ultrasonic waves in a liquid. A single frequency is transmitted to the electrostatic acoustic transducer (ESAT) and the voltage change produced is monitored. Then a broadband ultrasonic pulse is generated by the ultrasonic transducer and received by the ESAT. The output of the ESAT is amplified and input to a digitized oscilloscope for Fast Fourier Transform. The resulting plot is normalized with the monitored signal from the single frequency pulse. The plot is then corrected for characteristics of the membrane and diffraction effects. The transfer function of the final plot is determined. The transfer function gives the final sensitivity of the ultrasonic transducer as a function of frequency.Type: GrantFiled: August 31, 1993Date of Patent: June 28, 1994Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space AdministrationInventors: William T. Yost, John H. Cantrell
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Patent number: 5214955Abstract: A measuring apparatus uses a fixed frequency oscillator to measure small changes in the phase velocity ultrasonic sound when a sample is exposed to environmental changes such as changes in pressure, temperature, etc. The invention automatically balances electrical phase shifts against the acoustical phase shifts in order to obtain an accurate measurement of electrical phase shifts.Type: GrantFiled: August 26, 1991Date of Patent: June 1, 1993Assignee: The United States of America as represented by the United States National Aeronautics and Space AdministrationInventors: William T. Yost, Peter W. Kushnick, John H. Cantrell