Patents by Inventor John H. Greig

John H. Greig has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4423505
    Abstract: An adaptive canceller construction for cancelling signals received by a radio receiver operating in close proximity to a transmitter having means for extending the usefulness of the device over a wide band of frequencies. The canceller is provided with a memory which will remember the adopted parameter from one time in a given band to the next, so that as a jammer frequency jumps back and forth among several narrow frequency bands, the canceller will jump among a corresponding set of remembered parameters.
    Type: Grant
    Filed: November 23, 1981
    Date of Patent: December 27, 1983
    Assignee: Loral Corp.
    Inventor: John H. Greig
  • Patent number: 4101830
    Abstract: The disclosed apparatus provides a mercury electrode for making non-destructive tests, especially for Schottky-diode tests of semi-conductors such as silicon. By developing vacuum under a test wafer on a support, a column of mercury is drawn into contact with the test wafer through a bore in the support that accurately establishes the area of the contact. The vacuum system also holds the test wafer securely in position, it avoids spillage of mercury, and additional circuit-completing contact can be made to the wafer with independently controlled pressure.
    Type: Grant
    Filed: February 15, 1977
    Date of Patent: July 18, 1978
    Assignee: MSI Electronics Inc.
    Inventor: John H. Greig
  • Patent number: RE32024
    Abstract: The disclosed apparatus provides a mercury electrode for making non-destructive tests, especially for Schottky-diode tests of semi-conductors such as silicon. By developing vacuum under a test wafer on a support, a column of mercury is drawn into contact with the test wafer through a bore in the support that accurately establishes the area of the contact. The vacuum system also holds the test wafer securely in position, it avoids spillage of mercury, and additional circuit-completing contact can be made to the wafer with independently controlled pressure.
    Type: Grant
    Filed: June 21, 1979
    Date of Patent: November 5, 1985
    Assignee: MSI Electronics Inc.
    Inventor: John H. Greig