Patents by Inventor John Hanselman

John Hanselman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for measuring the thickness of opaque and transparent films
    Patent number: 6348967
    Abstract: A method for determining the thickness of a thin sample is described. The method includes the step of exciting time-dependent acoustic waveguide modes in the sample with an excitation radiation field. The acoustic waveguide modes are detected by diffracting probe radiation off a ripple morphology induced on the sample's surface by the acoustic waveguide modes. The diffracted probe radiation is then analyzed to measure phase velocities or frequencies of the acoustic waveguide modes. A thickness of the thin sample is determined by comparing the measured phase velocities or frequencies to the phase velocities or frequencies calculated from a mathematical model.
    Type: Grant
    Filed: May 11, 2000
    Date of Patent: February 19, 2002
    Assignee: Active Impulse Systems, Inc.
    Inventors: Keith A. Nelson, John A. Rogers, Matthew J. Banet, John Hanselman, Martin Fuchs
  • Method and device for measuring the thickness of opaque and transparent films
    Patent number: 6081330
    Abstract: A method for determining the thickness of a thin sample is described. The method includes the step of exciting time-dependent acoustic waveguide modes in the sample with an excitation radiation field. The acoustic waveguide modes are detected by diffracting probe radiation off a ripple morphology induced on the sample's surface by the acoustic waveguide modes. The diffracted probe radiation is then analyzed to measure phase velocities or frequencies of the acoustic waveguide modes. A thickness of the thin sample is determined by comparing the measured phase velocities or frequencies to the phase velocities or frequencies calculated from a mathematical model.
    Type: Grant
    Filed: September 18, 1998
    Date of Patent: June 27, 2000
    Assignee: Active Impulse Systems, Inc.
    Inventors: Keith A. Nelson, John A. Rogers, Matthew J. Banet, John Hanselman, Martin Fuchs
  • Method and device for measuring the thickness of opaque and transparent films
    Patent number: 5812261
    Abstract: A method for determining the thickness of a thin sample is described. The method includes the step of exciting time-dependent acoustic waveguide modes in the sample with an excitation radiation field. The acoustic waveguide modes are detected by diffracting probe radiation off a ripple morphology induced on the sample's surface by the acoustic waveguide modes. The diffracted probe radiation is then analyzed to measure phase velocities or frequencies of the acoustic waveguide modes. A thickness of the thin sample is determined by comparing the measured phase velocities or frequencies to the phase velocities or frequencies calculated from a mathematical model.
    Type: Grant
    Filed: January 15, 1997
    Date of Patent: September 22, 1998
    Assignee: Active Impulse Systems, Inc.
    Inventors: Keith A. Nelson, John A. Rogers, Matthew J. Banet, John Hanselman, Martin Fuchs