Patents by Inventor John Henry Petrangelo

John Henry Petrangelo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Detection and deduplication of backup sets exhibiting poor locality
    Patent number: 9122639
    Abstract: Described are computer-based methods and apparatuses, including computer program products, for detection and deduplication of backup sets exhibiting poor locality. A first set of summaries of a first data set are determined, each summary of the first set of summaries being indicative of a data pattern in the first data set. A second set of summaries of a second data set are determined, each summary of the second set of summaries being indicative of a data pattern in the second data set. A set of comparison metrics are calculated, each comparison metric being based on a first subset of summaries from the first set of summaries and a second subset of summaries from the second set of summaries. A locality metric is calculated based on the set of comparison metrics indicative of whether the first data set and second data set exhibit poor locality.
    Type: Grant
    Filed: January 25, 2011
    Date of Patent: September 1, 2015
    Assignee: Sepaton, Inc.
    Inventors: Jon Christopher Kennedy, Ronald Ray Trimble, Carey Jay McMaster, John Henry Petrangelo, Roland Leo Sorel, Patrick James Grinwald
  • Detection and Deduplication of Backup Sets Exhibiting Poor Locality
    Publication number: 20120191669
    Abstract: Described are computer-based methods and apparatuses, including computer program products, for detection and deduplication of backup sets exhibiting poor locality. A first set of summaries of a first data set are determined, each summary of the first set of summaries being indicative of a data pattern in the first data set. A second set of summaries of a second data set are determined, each summary of the second set of summaries being indicative of a data pattern in the second data set. A set of comparison metrics are calculated, each comparison metric being based on a first subset of summaries from the first set of summaries and a second subset of summaries from the second set of summaries. A locality metric is calculated based on the set of comparison metrics indicative of whether the first data set and second data set exhibit poor locality.
    Type: Application
    Filed: January 25, 2011
    Publication date: July 26, 2012
    Applicant: Sepaton, Inc.
    Inventors: Jon Christopher Kennedy, Ronald Ray Trimble, Carey Jay McMaster, John Henry Petrangelo, Roland Leo Sorel, Patrick James Grinwald