Patents by Inventor John J. McGee

John J. McGee has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7444263
    Abstract: A metric monitoring and analysis system including dynamic sampling agents located in monitored system elements and a service management platform. Each sampling agent includes a data adapter collecting metric data in a common format, a threshold generator for determining dynamic metric threshold ranges, an alarm detector generating an indicator when a metric deviates outside a dynamic threshold range or a static threshold, and a deviation tracker generating an alarm severity scores. The service platform includes an alarm analyzer identifying root causes of system alarm conditions by correlation of grouped metrics or forensic analysis of temporally or statistically correlated secondary forensic data or data items from a service model of the system.
    Type: Grant
    Filed: August 1, 2007
    Date of Patent: October 28, 2008
    Assignee: Opnet Technologies, Inc.
    Inventors: David Ronald White, John J. McGee, Steven J. Baron, Edward W. Macomber, Earl Charles LaBatt, Jr.
  • Patent number: 7219034
    Abstract: A system and methods for displaying data distribution information for time-series data is described. The methods include computing a condensed quantile function that may be used to generate approximate histograms for the time-series data, while decreasing the data storage requirements for generating a series of histograms for time-series data. The methods further include displaying the data distribution information using stack-bar histograms, many of which may be shown in a single display to permit a user to discern trends in the data distribution information. Methods for merging condensed quantile function tables are also described.
    Type: Grant
    Filed: September 13, 2002
    Date of Patent: May 15, 2007
    Assignee: Opnet Technologies, Inc.
    Inventors: John J. McGee, Michael B. Courtemanche, Ralph L. Beck
  • Patent number: 6643613
    Abstract: A system and method for monitoring a set of performance metrics is described. The methods include metric correlation and grouping methods that analyze a group of temporally related metrics, and correlate pairs of the metrics in the group. In one embodiment, rank correlation techniques are used to perform this correlation. Methods are also described for grouping metrics using a dynamic correlation pair graph that preserves all of the correlated relationships. This correlation pair graph may be used to determine which metrics are associated with a particular key metric, which may provide information on the cause of an alarm or other event involving the key metric. Another embodiment includes apparatus for correlating, grouping, and identifying the metrics.
    Type: Grant
    Filed: July 1, 2002
    Date of Patent: November 4, 2003
    Assignee: Altaworks Corporation
    Inventors: John J. McGee, John Michael Earley, David M. Heath, Ralph L. Beck, Michael B. Courtemanche
  • Publication number: 20030088542
    Abstract: A system and methods for displaying data distribution information for time-series data is described. The methods include computing a condensed quantile function that may be used to generate approximate histograms for the time-series data, while decreasing the data storage requirements for generating a series of histograms for time-series data. The methods further include displaying the data distribution information using stack-bar histograms, many of which may be shown in a single display to permit a user to discern trends in the data distribution information. Methods for merging condensed quantile function tables are also described.
    Type: Application
    Filed: September 13, 2002
    Publication date: May 8, 2003
    Applicant: Altaworks Corporation
    Inventors: John J. McGee, Michael B. Courtemanche, Ralph L. Beck