Abstract: A test and measurement instrument acquires a signal from a device under test, displays that signal as a source waveform, and makes measurements on that source waveform with regard to a predetermined property or event. The test and measurement instrument employs the method of the subject invention for placing these measurements into a waveform and directly correlating a position in the measurement waveform to the same area on the source waveform where they were measured. Specifically, the subject invention displays the correlation of points on a source waveform and a measurement waveform without requiring the use of a common horizontal time scale. In one embodiment of the invention, the measurement waveform is a histogram and a pointer to a given location in the histogram causes identification of corresponding areas in the source waveform.

Abstract: A system for determining the phase and magnitude of an incident signal relative to a cyclical reference signal, includes a sampler for sampling the incident signal. Autoranging circuitry is responsive to the reference signal and determines the frequency f of the reference signal and sets the sampling rate sr of the sampler. A processor, responsive to the sampler, computes a single point DFT v of the sampled incident signal responsive to the frequency of the reference signal and determines the phase &thgr; and magnitude |v| of the incident signal relative to the reference signal in response to the single point DFT.

Abstract: A system for determining the phase and magnitude of an incident signal relative to a cyclical reference signal, includes a sampler for sampling the incident signal. Autoranging circuitry is responsive to the reference signal and determines the frequency f of the reference signal and sets the sampling rate sr of the sampler. A processor, responsive to the sampler, computes a single point DFT v of the sampled incident signal responsive to the frequency of the reference signal and determines the phase &thgr; and magnitude |v| of the incident signal relative to the reference signal in response to the single point DFT.

Abstract: A “Streaming Distributed Oscilloscope” (SDO) architecture comprises at least one channel including a preamplifier module, a Digitizer Module, and an Acquisition Memory Module. An SDO couples all acquired samples of a waveform being monitored to all of its processing boards. Because multiple processor boards can access all of the sample data, an SDO can perform measurements on substantially all samples of a continuous data stream without dead time. An SDO is readily expandable in terms of memory length by simply adding more memory boards, and can be reconfigured by a user by virtue of its object-oriented architecture. An SDO waveform is defined by a trigger source and an acquisition memory. An SDO is capable of acquiring multiple waveforms based upon different triggers from the same data stream in the same channel. An SDO timebase for a given channel is defined by a decimator followed by an acquisition memory. Multiple timebases can co-exist in the same SDO channel.

Abstract: A digital storage oscilloscope includes first and second memory modules each including a data input section for receiving an input stream of digital data words and generating a sequence of address words, an acquisition memory which is addressed utilizing the address words for storing the data words, and a trigger input section for receiving a discrete input trigger and supplying the discrete input trigger to the data input section for initiating termination of an acquisition. The data input section of the first memory module passes the stream of digital data words to the data input section of the second memory module and supplies a discrete trigger to the trigger input section of the second memory module.

Abstract: A gate comparator control panel, in accordance with the subject invention, allows a user to define up to four different gate regions that may exist on any of the live waveforms, maths waveforms, or REF waveforms. A menu for each gate controls the position of each gate and selects the source for the signal that is to be gated. All gates must be the same width. A high level application copies the gated region of a waveform into a REF memory. For example, Gate 1 would go into REF 1, gate 2 into REF2 and so on. A user-settable tolerance value is used to determine if difference between the waveforms of the gates reaches a point at which a violation is indicated. A master gate position control causes all gates to move by the same amount, thus maintaining a constant distance between them. A master gate width control causes all gates to change width.

Abstract: A method and apparatus for digitally sampling electrical waveforms. A sampling circuit for sampling an electrical signal, a digitizing circuit for digitizing the samples produced by the sampling circuit and an acquisition memory for storing the samples are employed, the acquisition memory being partitioned into a plurality of frames. Each frame is triggered to store samples associated with a respective triggering event. After substantially all of the frames have been triggered, the contents of the acquisition memory are retrieved from the acquisition memory, filtered in an equalization filter and stored in a waveform memory for ultimate display as an ET record under software control. A plurality of digitizing circuits associated with respective inputs of a multi-channel digital sampling oscilloscope are interleaved to increase the sampling rate.