Patents by Inventor John James Greenhall

John James Greenhall has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Acoustics-based noninvasive wafer defect detection
    Patent number: 11879868
    Abstract: Techniques are provided for detecting wafer defects. Example techniques include exciting a wafer using an acoustic signal to cause the wafer to exhibit vibrations, measuring one or more of linear frequency response metrics or nonlinear frequency responses metrics associated with the vibrations, and identifying any defects in the wafer based at least in part on one or more of the linear frequency response metrics or nonlinear frequency responses metrics. In embodiments, the wafer includes bismuth telluride (Bi2Te3).
    Type: Grant
    Filed: May 14, 2021
    Date of Patent: January 23, 2024
    Assignee: TRIAD NATIONAL SECURITY, LLC
    Inventors: Cristian Pantea, John James Greenhall, Alan Lyman Graham, Dipen N. Sinha
  • ACOUSTICS-BASED NONINVASIVE WAFER DEFECT DETECTION
    Publication number: 20210356435
    Abstract: Techniques are provided for detecting wafer defects. Example techniques include exciting a wafer using an acoustic signal to cause the wafer to exhibit vibrations, measuring one or more of linear frequency response metrics or nonlinear frequency responses metrics associated with the vibrations, and identifying any defects in the wafer based at least in part on one or more of the linear frequency response metrics or nonlinear frequency responses metrics. In embodiments, the wafer includes bismuth telluride (Bi2Te3).
    Type: Application
    Filed: May 14, 2021
    Publication date: November 18, 2021
    Inventors: Cristian Pantea, John James Greenhall, Alan Lyman Graham, Dipen N. Sinha