Abstract: A reusable, portable attachment for coupling in between a baby bottle top and a baby bottle container that comprises a container compartment for storing powdered formula separately from water prior to feeding, a hollow compartment, a removable seal therebetween, and a release actuator for releasing the seal to mix the powdered formula and water.

Abstract: A reusable, portable attachment for coupling in between a baby bottle top and a baby bottle container that comprises a container compartment for storing powdered formula separately from water prior to feeding, a hollow compartment, a removable seal therebetween, and a release actuator for releasing the seal to mix the powdered formula and water.

Abstract: Testing one or more memories of a device includes receiving one or more first repair records from one or more built-in self-testers of a device having one or more memories. A built-in self-tester is associated with a memory, and a first repair record describes a first repair at a memory. A first repair signature corresponding to the first repairs at the memories is generated from the first repair records, and then is recorded. One or more second repair records are received from the built-in self-testers, where a second repair record describes a second repair at a memory. A second repair signature corresponding to the second repairs at the memories is generated from the second repair records. The second repair signature is compared with the first repair signature. The device is evaluated in response to the comparison.

Abstract: Testing one or more memories of a device includes receiving one or more first repair records from one or more built-in self-testers of a device having one or more memories. A built-in self-tester is associated with a memory, and a first repair record describes a first repair at a memory. A first repair signature corresponding to the first repairs at the memories is generated from the first repair records, and then is recorded. One or more second repair records are received from the built-in self-testers, where a second repair record describes a second repair at a memory. A second repair signature corresponding to the second repairs at the memories is generated from the second repair records. The second repair signature is compared with the first repair signature. The device is evaluated in response to the comparison.

Abstract: A method for processing data is provided that includes receiving a first request in a first clock cycle from a processor for access to a first data segment corresponding to a first address included in the first request. A second request for access to a second data segment corresponding to a second address included in the second request is received during a second clock cycle. The second data segment is disabled from being communicated to the processor and the first data segment is communicated to the processor in response to the second request.

Abstract: A microprocessor is implemented using sense amplifiers to replace CMOS logic circuits, in order to provide low voltage, high frequency switching. The input node of the sense amplifier is maintained at a voltage just above or just below their trip-point of one inverter in order to obtain high-speed switching. Bench mark tests have shown that a microprocessor operating at 2.7 volts may obtain a frequency of 20 MHz and while the same microprocessor may operate at 5.5 volts and 40 MHz.

Abstract: Independent functional units are clocked by a clock source generator having at least two adjustable delay lines for independently adjusting the duty cycles of at least two clocks so that speed path margins are individually optimized for each functional unit.

Abstract: A programmable phase shift clock generator is disclosed including a phase comparator, an up-down counter, a ring oscillator, and an adjustable delay line for determining a digital signature of an input clock and precisely generating a phase shifted clock signal.

Abstract: An adjustable duty cycle clock generator has first and second delay lines coupled to receive an input clock and cascaded to first and second edge detectors, respectively. The second delay line has a programmable delay and the first and second edge detectors are further coupled to set and reset inputs on an S-R latch to generate an adjustable duty cycle clock with independently adjustable high and low times proportional to the induced delays of the first and second delay lines.

Abstract: A shared interleaved memory having a relatively large number of banks employs circuitry and methodology for resolving bank conflicts without significantly inducing delay into the data path. A first and a second port make data read, data write, and instruction fetch requests to/from the shared interleaved memory by way of asserting a priority signal, an address, and an operand size which are decoded to discern which, if any, memory banks in the interleaved shared memory are needed. In the event of a bank request conflict, the highest priority requester gets all its requested banks and the losing requester gets all nonconflicting requested banks. After the banks in the interleaved memory are allocated, a signal identifying that the losing requester did not receive all its requested banks is generated which does not impact the delay in the data path and accordingly, the losing requester resubmits its request on the next cycle.

Abstract: An adjustable duty cycle clock generator is disclosed having a single delay line cascaded to a multiplexer and first and second edge detectors which respectively drive set and reset inputs on a S-R latch to produce an adjustable duty cycle clock signal.

Abstract: An improved sense amplifier is disclosed employing bleeder and dampening devices coupled in a robust feedback configuration for maintaining a relatively narrow and stable voltage level above the high threshold of the sense amplifier.

Abstract: An integrated circuit, such as a microprocessor or math coprocessor, having a clock generator circuit for generating a high frequency internal clock signal based on an external input signal is disclosed. A clock generator circuit comprises circuitry for detecting an active edge of an input signal, circuitry for generating a plurality of clock edges responsive to the detection of the clock signal and circuitry for inhibiting the edge generating circuitry after generation of a predetermined number of clock edges. The factor by which the input clock signal is multiplied may be set by the circuit designer, or programmably set, without impact on the circuit design. Hence, a single circuit may be used to generate clocks of various frequencies. Further, the duty cycle of the generated clock is independent of the input clock signal.

Abstract: An integrated circuit, such as a microprocessor or math co-processor, having a clock generator circuit for generating a high frequency internal clock signal based on an external input clock signal is disclosed. The clock generator circuit includes a programmable delay stage having fixed and variable portions. The fixed portion preferably includes a series of logic elements of various types (NOR, NAND, NOT, pass gates, etc.), selected to match the worst case clock phase delay and which match speed variations as a function of voltage, temperature or processing conditions. The variable portion of the delay stage selects a propagation delay by way of programmable elements (e.g., mask programmable); multiplexers may be included therein to allow selection of the delay in a test mode.

Abstract: A bus precharge circuit is provided that precharges a bus line or node as an inverse function of the precharge level already attained on the bus line, such that the precharge level on the bus line is gradually approached. The precharge circuit charges the bus line to a midpoint between high and low logic states. The preexisting state of the bus line is stored and is used to select one of two voltage supplies to which the bus line may be partially pulled up or down. The switchpoint of a precharge circuit sensing gate is set to be equivalent to the switchpoint of the receiving gate of receiver on the bus line.

Abstract: Improved access to programmable logic arrays is provided by continuously asserting and negating a latch inputs control signal, continuously asserting and negating a control signal which discharges a first logic section of the array to provide frequent, current inputs to a second logic section of the PLA and discharging the second section of the PLA only upon receipt of an access request. In the case of asynchronous access, it is also necessary to generate a synchronized data strobe from the unsynchronized one and to generate an acknowledge signal to indicate the presence of valid output data. The disclosed method and apparatus provide access which has a short access time and which also provides outputs which reflect relatively current states of the inputs thereto.

Abstract: A two stage synchronizer circuit for synchronizing an asynchronous input signal with a local clock signal includes a reference inverter for generating a reference signal, a first sense amplifier for amplifying the difference between the reference signal and the asynchronous input signal, buffer inverters coupled to the output on the sense amplifier, a second sense amplifier coupled to the output of the buffer inverters, and an output inverter for delivering the desired synchronized signal. The reference inverter and the first and second buffer inverters have the same switch point so as to substantially reduce the probability of the generation of a meta-stable output. Furthermore, the first and second sense amplifiers and output inverter also have the same switch point as the reference inverter.

Abstract: A read-only-memory (ROM) having a plurality of enhancement and depletion transistors selectively arranged in an array with the gates of the transistors in each row connected in common to form word lines, and the current paths of the transistors in each column connected in series to form bit lines. The word lines are precharged and then allowed to float. The bit lines are then precharged, bootstrapping the word lines above the precharge level. A selected one of the word lines is thereafter discharged before one end of each of the bit lines is connected to ground. A selected bit line will either remain precharged or be discharged depending upon the type of transistor at the intersection of the selected word and bit lines.