Abstract: A microstrip probe blade which has a ceramic body (20) with a microstrip (26) on one side and a metalized ground plane (30) on the other. A straight needle (32) having a tapered end and a spherical tip is attached to the microstrip axially and protrudes from the body parallel to the microstrip such that a high frequency signal may be conducted through the device with a minimum of electrical aberations. With this blade test, frequencies as high as 10 gigahertz may be achieved overcoming previous frequency limitations. The probe blade by virtue of the ground plane (30) wrapping around slightly to the microstrip side of the body (20) allows the addition of resistors (36) or chip capacitors (38) to minimize electrical spikes, transients, and unwanted opscillations to power supply frequencies.

Abstract: A multipoint microwave coaxial probe card which has a printed circuit (20) with an edge connector (24) and a mounting ring (30) attached to the surface. A series of ceramic stripline needle assemblies (38) are bonded to the board around a hole (22) in the center of the board for compliance with the pads on the component under test. Microwave connectors (34) are mounted into the ring with coaxial cable (42) electrically connecting to the needle assemblies. A portion of the needle assemblies are joined to the edge connector by insulated wires (44) allowing both high and low frequency signals to be utilized simultaneously. A shield in the form of a flat plate (48), with a cover (54), enclose the ring and provide RFI and EMI shielding. The coaxial probe card fulfills the need to provide shielded dual frequency testing of microwave semi-conductor wafers heretofore unavailable.

Abstract: A fixture having a header plate (20) in rectangular shape with a notch (28) on each end and an aperture (22) in the middle defined as a through hole. A plurality of microwave connectors (30) are located on the top surface of the header plate (20) adjacent to the aperture and penetrate through the body with the connector extended contact planar with the bottom. A substrate (32) of dielectric material with a ground plane on one side and a plurality of striplines (34) on the other is attached into a recess peripherally positioned on the bottom side of the aperture (22). The striplines (34) are joined to the connectors (30) on one end and to individual probe needles (38) with angular tips on the other near the midmost point. A centrally located access opening (36) in the substrate (32) allows visual indication of the probe needles (38) for positioning upon node points and inspection points on a microwave semiconductor wafer under test.

Abstract: A continuity testing fixture for simultaneously probing of microelectronic chip site pads having a cluster of probe pins extending from a top plate in the same precise orientation as the pads. The probe pins are individually urged into compliance by a resilient pad disposed beneath the pins forcing a sharp end into contiguous engagement allowing an external signal to determine continuity of the workpiece. Individual insulated wires are attached to each probe on one end and are encompassed within a cavity in the body terminating at a connector near the edge of the fixture for linking to the remote test source. In another embodiment, the probe pins are hollow and contain an insulated wire allowing an independent signal to be introduced by way of the connector through the pads indicating both compliance of the probe and continuity of the workpiece simultaneously and independently.

Abstract: The invention provides a siphonic apparatus to effect irrigation of a field from a water supply. The apparatus comprises a bridging structure which includes a chassis fabricated from spaced longitudinal bottom members, spaced longitudinal top members interconnected by cross members, vertical struts, diagonal braces and side plates to form a rigid structure having a central elevated section and downwardly angled end sections, the ends of which being on substantially the same plane as the surface supporting the chassis.At least one siphonic tube is rotatably, transversely supported in the chassis.