Patents by Inventor John L. Chambers

John L. Chambers has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray diffraction-based defective pixel correction method using an active pixel array sensor
    Patent number: 9022651
    Abstract: A method for correcting erroneous intensity measurements caused by defective pixels of the detector for a single-crystal X-ray diffraction system uses collected diffraction images and a defective pixel list to modify three-dimensional reflection profiles by replacing profile elements affected by the defective pixels with corresponding profile elements from a model profile. Reflection positions on the detector are predicted using an orientation matrix for the crystal and a three-dimensional observed profile is constructed for each reflection. A model profile is constructed using normalized profile data from multiple reflection profiles. The observed profiles are compared with the defective pixel list to determine which profile elements are affected by defective pixels, and those elements are replaced by corresponding elements from the model profile.
    Type: Grant
    Filed: July 12, 2013
    Date of Patent: May 5, 2015
    Inventors: Joerg Kaercher, John L. Chambers
  • X-RAY DIFFRACTION-BASED DEFECTIVE PIXEL CORRECTION METHOD USING AN ACTIVE PIXEL ARRAY SENSOR
    Publication number: 20150016594
    Abstract: A method for correcting erroneous intensity measurements caused by defective pixels of the detector for a single-crystal X-ray diffraction system uses collected diffraction images and a defective pixel list to modify three-dimensional reflection profiles by replacing profile elements affected by the defective pixels with corresponding profile elements from a model profile. Reflection positions on the detector are predicted using an orientation matrix for the crystal and a three-dimensional observed profile is constructed for each reflection. A model profile is constructed using normalized profile data from multiple reflection profiles. The observed profiles are compared with the defective pixel list to determine which profile elements are affected by defective pixels, and those elements are replaced by corresponding elements from the model profile.
    Type: Application
    Filed: July 12, 2013
    Publication date: January 15, 2015
    Inventors: Joerg Kaercher, John L. Chambers
  • Apparatus and method for precise determinations of crystallographic orientation in crystalline substances
    Patent number: 4412345
    Abstract: An apparatus and method for precisely measuring the angles of cut of single nd doubly rotated cuts of quartz crystal blanks on a high volume production basis.
    Type: Grant
    Filed: August 3, 1981
    Date of Patent: October 25, 1983
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventors: S. Thomas Workman, John L. Chambers, Myron A. Pugh, Roger W. Ward