Abstract: A method and apparatus for configuring, automating and controlling the various operations performed on different products, e.g. the testing and/or repair of printed circuit boards, is presented. The apparatus includes one or more work stations and conveyor units to transport products and other components required to perform the operations on such products between such stations. The products are mounted in standardized carriers which facilitate intermixing different sizes and shapes of products without requiring adjustment to the conveyor units. The other components are adapted to also be transportable by the same conveyor units. The apparatus further includes buffering stages associated with each station for temporarily storing products and other components, and a distributed control system to facilitate the parallel processing of different types of products in accordance with a dynamic priority rating system and a preemptive scheduling technique.

Abstract: Three sets of pincer units depend from a flat palm, each pincer unit having a pinching gap at its distal end for engaging a loaded circuit board by its edges and holding it in a spaced-apart relationship with the palm. Each pincer unit includes a finger having a flange at its distal end and a thumb slideably mounted on the finger so as to define a variable pinching gap. The fingers are mounted for prehensiling movement away from one another for bracketing a board to be picked up and toward one another so that the board to be picked up may be squeezed between them.The invention includes a method for picking up a loaded circuit board which involves bracketing a board to be picked up between a set of pincer units, squeezing the board by moving the pincer units toward one another against opposing edges of the board while simultaneously pinching each edge engaged with the pincer units.

Abstract: A universe of probes is contained within a platen in a spaced-apart, substantially parallel relationship with one another with their tips pointing in the same direction. Each probe is free to move longitudinally between an advanced or test position and a retracted position. The platen nests into a wired personalizer having probe selector posts upstanding therein in a pattern corresponding to the pattern of test points on a circuit board to be tested. These posts serve to push up or advance the probes needed to test a particular type of circuit board. The posts are conductive and each is individually connected to the test system. The circuit board to be tested rests on a special deformable gasket so that its test points are suspended over and aligned with the advanced test probes. When the fixture is evacuated, the circuit board to be tested is drawn downwardly so that the test points on the board make electrical contact with the tips of the advanced probes.

Abstract: A printed circuit board test fixture having interchangeable top plates (card personalizers). The test fixture is provided with a vacuum well having a field of probes mounted therein. The field of probes corresponds to the sum of all test points of a family of different printed circuit boards. Only a portion of all the probes are necessary to test any particular type of circuit board of the family. The top plate for each type of circuit board in the family has holes drilled completely therethrough only at locations where selected probes must pass through the top plate in order to contact the test points on the circuit board. In a preferred form, each top plate is partially drilled therethrough to form sockets at locations corresponding to the remaining probes which need not contact a particular circuit board. A hinged cover is provided for the vacuum well to allow easy removal and insertion of top plates.

Abstract: A fixturing system including a product access unit, receiver and support bracket. The product access unit has a top plate upon which the product under test is placed, which top plate is movable so as to carry the product under test into contact with a field of test probes. The product access unit also has a contact panel disposed outboard of the field of test probes, said contact panel containing electrical contact posts wired to the test probes. The contact panel is provided with mating guides and the receiver includes mechanical means for engaging and locking with these guides. The support bracket includes sockets which co-operate with guide pins on the product access unit for aligning it for assembly with the receiver. The product access unit is vacuum-operated and a perimeter gasket on the top plate forms a seal with an inwardly sloping portion of the housing containing the vacuum plate.