Abstract: An apparatus and method are provided to perform constrained optimization of a constrained property of an apparatus, which is complex due to having several components, and these components are configurable in real-time. The optimization is achieved by detecting values of the constrained property and a plurality of other properties of the apparatus when the apparatus is configured in a first subset of the plurality of configurations. A model is learned using the detected values of the constrained property. The model represents the constrained property and can also represent other properties as a function of the configurations. The model can also include estimated uncertainties of the constrained property in the model. Then, using the d model and the estimated uncertainties, the optimal configuration can be selected to minimize an error value (e.g., the difference between a desired value and an observed value of the at least one constrained property).

Abstract: An apparatus and method are provided to perform constrained optimization of a constrained property of an apparatus, which is complex due to having several components, and these components are configurable in real-time. The optimization is achieved by detecting values of the constrained property and a plurality of other properties of the apparatus when the apparatus is configured in a first subset of the plurality of configurations. A model is learned using the detected values of the constrained property. The model represents the constrained property and can also represent other properties as a function of the configurations. The model can also include estimated uncertainties of the constrained property in the model. Then, using the d model and the estimated uncertainties, the optimal configuration can be selected to minimize an error value (e.g., the difference between a desired value and an observed value of the at least one constrained property).

Abstract: A fluid dispensing device, particularly suited to medicine but also having many other applications. The device selectively dispenses any of one or more fluids contained within the device. Adapters on the dispensing end of the unit permit the device to be effectively used for intra-venous, intra-dermal or intra-muscular injections, gasses, colloids, gels, liquids or other fluids. Adapters on the head of the unit permit the device to be used with or without electrical power and to varying degrees of automatic control for timing, sequence, volume of fluid dispensed and other features.

Abstract: Disclosed is an integrated circuit chip test apparatus that has a module test fixture having contact pads that are adapted to make contact with signal input/output pins on an integrated circuit chip being tested. An intermediate banking box is connected to the module text fixture and a tester is connected to the intermediate banking box. The tester includes at least one bank of channels there are more pins on the integrated circuit chip than there are channels in the tester. The intermediate banking box includes switches that are connected between the contact pads and the channels. The switches are adapted to selectively connect a subset of the contact pads to the channels to connect the tester to a subset of pins, thereby allowing the tester to test a portion of the integrated circuit that corresponds to the subset of pins.

Abstract: Disclosed is an integrated circuit chip test apparatus that has a module test fixture having contact pads that are adapted to make contact with signal input/output pins on an integrated circuit chip being tested. An intermediate banking box is connected to the module text fixture and a tester is connected to the intermediate banking box. The tester includes at least one bank of channels there are more pins on the integrated circuit chip than there are channels in the tester. The intermediate banking box includes switches that are connected between the contact pads and the channels. The switches are adapted to selectively connect a subset of the contact pads to the channels to connect the tester to a subset of pins, thereby allowing the tester to test a portion of the integrated circuit that corresponds to the subset of pins.