Patents by Inventor John M. Aitren

John M. Aitren has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies
    Patent number: 6788093
    Abstract: A method and structure tests devices on a wafer by applying an electrical bias to the devices and simultaneously monitoring emitted light from all of the devices. The emitted light indicates locations of defective devices and records time-based images of the emitted light across the wafer.
    Type: Grant
    Filed: August 7, 2002
    Date of Patent: September 7, 2004
    Assignee: International Business Machines Corporation
    Inventors: John M. Aitren, Fen Chen, Kevin L. Condon, Mark F. Dionne, Gregory E. Nuttall
  • METHODOLOGY AND APPARATUS USING REAL-TIME OPTICAL SIGNAL FOR WAFER-LEVEL DEVICE DIELECTRICAL RELIABILITY STUDIES
    Publication number: 20040027149
    Abstract: A method and structure tests devices on a wafer by applying an electrical bias to the devices and simultaneously monitoring emitted light from all of the devices. The emitted light indicates locations of defective devices and records time-based images of the emitted light across the wafer.
    Type: Application
    Filed: August 7, 2002
    Publication date: February 12, 2004
    Applicant: International Business Machines Corporation
    Inventors: John M. Aitren, Fen Chen, Kevin L. Condon, Mark F. Dionne, Gregory E. Nuttall