Patents by Inventor John M. Cuffe

John M. Cuffe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080290866
    Abstract: A method and apparatus for conducting eddy current testing of a test object is disclosed, comprising the steps of generating a digital drive signal, converting the digital drive signal to an analog drive signal to drive a coil in a probe; placing the probe in proximity to a test object; receiving an electromagnetic field generated by the test object, which generates an analog return signal; converting the analog return signal to a digital return signal; measuring the amplitude of the digital return signal; measuring the phase shift of the digital return signal compared to the digital drive signal; determining the phase shift angle of the digital return signal based on the phase shift; determining the quadrature components of the digital return signal based on the digital return signal amplitude and the phase shift angle; and analyzing the quadrature components of the digital return signal to determine a material characteristic of the test object.
    Type: Application
    Filed: May 23, 2007
    Publication date: November 27, 2008
    Inventors: John M. Cuffe, Mark H. Feydo
  • Patent number: 6016700
    Abstract: Apparatus (10) for processing a return waveform generated by directing an ultrasonic pulse at an object (S) under test. A signal converter (12) converts the return waveform from an analog to a digital signal. The analog-to-digital conversion rate is approximately four times the operating frequency of the ultrasonic pulse. A signal processor includes a plurality of digital signal processors (14,16,18) each of which is separately controllable to process the converted digital signal. A communications network (20) directs the analog signal, converted digital signal, and an output signal from the signal processor to a visual display (28) and to various peripheral equipment (A1,A2) connected to the apparatus. A process controller (22) controls routing of these signals to and from the signal processor over the communication network. By processing a return waveform, peak amplitude values representing flaws or imperfections in the object can be determined and the processed waveform, including peak values, displayed.
    Type: Grant
    Filed: October 29, 1997
    Date of Patent: January 25, 2000
    Assignee: Krautkramer Branson, Inc.
    Inventor: John M. Cuffe
  • Patent number: 5596508
    Abstract: Apparatus (10) for measuring physical properties of a tube (T). A pulse generator (12) generates an electrical pulse having predetermined characteristics. Transducers (20a, 20b) convert the pulse to an ultrasonic waveform (W) and propagate the waveform at the tube from different directions. Resulting echoes (E1-E3) are converted into electrical response pulses. Another transducer (24a) propagates a similar waveform at a reference object (B) and converts an echo therefrom into a reference electrical response pulse which is combined with each of the other response pulses. Receivers (28a, 28b) receive the combined response pulses and convert them to digital data stored in a memory (32). A processor (36) reconstructs each combined waveform and determines from each reconstruction a value representing a physical characteristic of the tube. This involves performing a "real time" evaluation of the combined waveform to determine if it meets threshold criteria.
    Type: Grant
    Filed: December 7, 1994
    Date of Patent: January 21, 1997
    Assignee: Krautkramer-Branson, Inc.
    Inventor: John M. Cuffe
  • Patent number: 5511425
    Abstract: Apparatus (10) for performing ultrasonic flaw testing of a material (M) or assembly. A pulser (28) generates an electrical pulse having defined characteristics. A transducer (12) converts the signal to an ultrasonic pulse, propagates the pulse through the material or assembly, receives an echo the characteristics of which include reflections off flaws or discontinuities in the material or assembly, and converts the echo into an electrical reply signal. The transducer is selectable from among a number of transducers. A processor (32) processes the reply signal to produce a visual display representing the amplitude of the reply signal for a range of propagation times (distances) into the material. A visual display (16) displays the processed electrical signal. A correlation module (42) generates a gate signal which is visually displayed (at 38) with the processed electrical signal. The gate signal corresponds to a maximum amplitude value which represents the maximum flaw size allowable for the test.
    Type: Grant
    Filed: December 9, 1993
    Date of Patent: April 30, 1996
    Assignee: Krautkramer-Branson, Inc.
    Inventors: Wolf-Dietrich Kleinert, John M. Cuffe, Theodore L. Ballenger, Alan D. Weiner, Mark H. Feydo