Abstract: A welding fume collector is disclosed that includes a flexible sheath, fume collection opening at the distal end of the sheath, and vacuum hose. A welding torch extends through the sheath with the nozzle extending beyond the distal end of the sheath. The vacuum hose extends into the proximal end of the sheath. A vacuum system creates a negative pressure inside the flexible sheath which extends out through the collection opening to collect fumes. The collection opening can be generally elliptical with a major axis extending along the welding direction. The vacuum system, vacuum hose and sheath can be sized to create the desired vacuum to collect welding fumes without interfering with the welding process. The diameters of the vacuum hose and sheath can be sized to create low-speed welding fume collection through the collection opening. The vacuum system can include a self-cleaning filter.

Abstract: A welding fume collector is disclosed that includes a sheath, fume collection opening and vacuum hose. A welding torch extends through the sheath with the nozzle extending beyond the distal end of the sheath. The fume collection opening is at the distal end of the sheath. The vacuum hose extends into the proximal end of the sheath. A vacuum system creates a negative pressure inside the sheath which extends out through the collection opening to collect fumes. The collection opening can be generally elliptical with a major axis extending along the welding direction. The vacuum system, vacuum hose and sheath can be sized to create the desired vacuum to collect welding fumes without interfering with the welding process. The diameters of the vacuum hose and sheath can be sized to create low-speed welding fume collection through the collection opening. The vacuum system can include a self-cleaning filter.

Abstract: A system for measuring a flow rate of a fluid through a plurality of tubes sharing a common flow orifice, the system includes an ultrasonic transducer having a plurality of sensors in communication with a plurality of tubes sharing a common flow orifice. The system includes an electronic module coupled to the ultrasonic transducer, the electronic module connecting selected sensors to a flow rate analyzer for determining a flow rate of fluid through the plurality of tubes on which the sensors are in communication with.

Abstract: A system for measuring a flow rate of a fluid through a plurality of tubes sharing a common flow orifice, the system includes an ultrasonic transducer having a plurality of sensors in communication with a plurality of tubes sharing a common flow orifice. The system includes an electronic module coupled to the ultrasonic transducer, the electronic module connecting selected sensors to a flow rate analyzer for determining a flow rate of fluid through the plurality of tubes on which the sensors are in communication with.

Abstract: A method and system are provided for programming a plurality of memory devices arranged in parallel. In one embodiment of the present invention, the plurality of memory devices comprises first and second memory devices, and the method comprises providing successively the first address to the first memory device and the second address to the second memory device. The first address refers to a first group of storage locations in the first memory device and the second address refers to a second group of storage locations in the second memory device. The method then proceeds to load in parallel a string of data to the first and second memory devices so that the string of data is written simultaneously to the first group of storage locations in the first memory device and to the second group of storage locations in the second memory device.

Abstract: A tester and method are provided for testing semiconductor devices. Generally, the tester includes a multitasking Algorithmic Pattern Generator (APG) to concurrently execute multiple programs on multiple test sites using a single pattern generator. In one embodiment, up to eight test programs are run independently and concurrently on eight independent sixteen-pin devices on a 128 pin test site. When the multitasking APG is ready to broadcast to a device, timing system associated with that device only (and not the other devices) are loaded. While the timing system is executing the cycle of the test programs for the device just loaded, the APG continues on to load the other devices. Because of the slow cycle rates required for programming versus reading, the tester is particularly advantageous for testing flash memory. Optionally, for higher throughput, the APG can be run in lock step at up to a maximum operating frequency of the APG during read cycle of flash.

Abstract: A tester and method are provided for testing semiconductor devices. Generally, the tester includes a multitasking Algorithmic Pattern Generator (APG) to concurrently execute multiple programs on multiple test sites using a single pattern generator. In one embodiment, up to eight test programs are run independently and concurrently on eight independent sixteen-pin devices on a 128 pin test site. When the multitasking APG is ready to broadcast to a device, timing system associated with that device only (and not the other devices) are loaded. While the timing system is executing the cycle of the test programs for the device just loaded, the APG continues on to load the other devices. Because of the slow cycle rates required for programming versus reading, the tester is particular advantageous for testing flash memory. Optionally, for higher throughput, the APG can be run in lock step at up to a maximum operating frequency of the APG during read cycle of flash.

Abstract: An improved method of automatic sawing employs a programmable automatic saw and a remotely located computer which provides additional control for the saw or a group of saws. The saw is equipped with a programmable controller that is capable of storing a series of jobs. The programmable controller allows an operator to run one saw job while contemporaneously programming another saw job. A third person, such an engineer or supervisor, may be programming an additional job or ranges of jobs for the saw while the operator is running and programming other jobs. The improved system provides control for a group of saws thereby assisting in the distribution of work flow, enabling efficient use of materials and improving inventory controls.

Abstract: A mounting and traversing assembly (10) particularly suited for employment with an in situ particle size measuring device.

Abstract: A catalyzed process for deuterium isotope enrichment by H-D exchange between an amine and hydrogen in which the exchange catalyst includes a mixture of Group I and Group II metal amides. Catalyst mixtures of potassium methylamide with beryllium, calcium or strontium methylamide are of particular interest. Resistance to hydride formation is equivalent to the binary Group I metal amide catalysts and higher H-D exchange rates can be achieved with some combinations.