Patents by Inventor John M Lara

John M Lara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6876942
    Abstract: Electrical and mechanical components and associated processes for enhancing automated test of a system by permitting automated generation and application (injection) of real-world stimuli applied to the system under test and sensing responses from the system under test without the need for manual intervention. Test components of the present invention may intercede in the exchange of signals and power over various signaling paths within a system under test. Under programmable control by methods of the invention, the electrical components of the present invention may simulate any desired real-world stimulus on any signal path associated with the system under test. Electromechanical manipulation test components and sensor components allow automation of testing of physical aspects of the system under test. Centralized test sequencing and logic enables simpler test components to permit improved scalability and flexibility of the automated test system and processes.
    Type: Grant
    Filed: September 18, 2002
    Date of Patent: April 5, 2005
    Assignee: LSI Logic Corporation
    Inventors: Steven G. Hagerott, John M Lara
  • Patent number: 6757634
    Abstract: Methods and associated structure for saving and restoration of state information regarding progress of an automated test procedure to permit resumption of the automated test procedure following reset or failure of the automated test system. An automated test system in accordance with the present invention preferably saves state information in a non-volatile storage medium, such as a disk file, indicative of the progress of the test procedure. When the test system environment in which the automated test system is operable is reset or restarted, intentionally or due to failure, the automated test system retrieves previously saved state information from the non-volatile storage medium to resume the automated test process in accordance with the saved state information.
    Type: Grant
    Filed: June 10, 2002
    Date of Patent: June 29, 2004
    Assignee: LSI Logic Corporation
    Inventor: John M. Lara
  • Patent number: 6745145
    Abstract: Electrical components and associated processes for enhancing automated test of a system by permitting automated generation and application (injection) of real-world stimuli applied to the system under test without the need for manual intervention. Electrical components of the present invention intercede in the exchange of signals and power over various signaling paths within a system under test. Under programmable control by methods of the invention, the electrical components of the present invention may simulate any desired real-world stimulus on any signal path associated with the system under test. Automated test procedures associated with the electrical components may then automate all phases of a test procedure including setup of the test environment, application of real-world stimuli, verification of operation of the system under test and cleanup and recovery following performance of the automated test sequence.
    Type: Grant
    Filed: June 24, 2002
    Date of Patent: June 1, 2004
    Assignee: LSI Logic Corporation
    Inventors: John M. Lara, Robin Huber
  • Publication number: 20040054492
    Abstract: Electrical and mechanical components and associated processes for enhancing automated test of a system by permitting automated generation and application (injection) of real-world stimuli applied to the system under test and sensing responses from the system under test without the need for manual intervention. Test components of the present invention may intercede in the exchange of signals and power over various signaling paths within a system under test. Under programmable control by methods of the invention, the electrical components of the present invention may simulate any desired real-world stimulus on any signal path associated with the system under test. Electromechanical manipulation test components and sensor components allow automation of testing of physical aspects of the system under test. Centralized test sequencing and logic enables simpler test components to permit improved scalability and flexibility of the automated test system and processes.
    Type: Application
    Filed: September 18, 2002
    Publication date: March 18, 2004
    Inventors: Steven G. Hagerott, John M. Lara
  • Publication number: 20030236644
    Abstract: Electrical components and associated processes for enhancing automated test of a system by permitting automated generation and application (injection) of real-world stimuli applied to the system under test without the need for manual intervention. Electrical components of the present invention intercede in the exchange of signals and power over various signaling paths within a system under test. Under programmable control by methods of the invention, the electrical components of the present invention may simulate any desired real-world stimulus on any signal path associated with the system under test. Automated test procedures associated with the electrical components may then automate all phases of a test procedure including setup of the test environment, application of real-world stimuli, verification of operation of the system under test and cleanup and recovery following performance of the automated test sequence.
    Type: Application
    Filed: June 24, 2002
    Publication date: December 25, 2003
    Inventors: John M. Lara, Robin Huber
  • Publication number: 20030229467
    Abstract: Methods and associated structure for saving and restoration of state information regarding progress of an automated test procedure to permit resumption of the automated test procedure following reset or failure of the automated test system. An automated test system in accordance with the present invention preferably saves state information in a non-volatile storage medium, such as a disk file, indicative of the progress of the test procedure. When the test system environment in which the automated test system is operable is reset or restarted, intentionally or due to failure, the automated test system retrieves previously saved state information from the non-volatile storage medium to resume the automated test process in accordance with the saved state information.
    Type: Application
    Filed: June 10, 2002
    Publication date: December 11, 2003
    Inventor: John M. Lara