Patents by Inventor John M. Schmidt
John M. Schmidt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11957893Abstract: A neuromodulation therapy is delivered via at least one electrode implanted subcutaneously and superficially to a fascia layer superficial to a nerve of a patient. In one example, an implantable medical device is deployed along a superficial surface of a deep fascia tissue layer superficial to a nerve of a patient. Electrical stimulation energy is delivered to the nerve through the deep fascia tissue layer via implantable medical device electrodes.Type: GrantFiled: August 25, 2020Date of Patent: April 16, 2024Assignee: Medtronic, Inc.Inventors: Brad C. Tischendorf, John E. Kast, Thomas P. Miltich, Gordon O. Munns, Randy S. Roles, Craig L. Schmidt, Joseph J. Viavattine, Christian S. Nielsen, Prabhakar A. Tamirisa, Anthony M. Chasensky, Markus W. Reiterer, Chris J. Paidosh, Reginald D. Robinson, Bernard Q. Li, Erik R. Scott, Phillip C. Falkner, Xuan K. Wei, Eric H. Bonde, David A. Dinsmoor, Duane L. Bourget, Forrest C M Pape, Gabriela C. Molnar, Joel A. Anderson, Michael J. Ebert, Richard T. Stone, Shawn C. Kelley, Stephen J. Roddy, Timothy J. Denison, Todd V. Smith
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Patent number: 11957894Abstract: A neuromodulation therapy is delivered via at least one electrode implanted subcutaneously and superficially to a fascia layer superficial to a nerve of a patient. In one example, an implantable medical device is deployed along a superficial surface of a deep fascia tissue layer superficial to a nerve of a patient. Electrical stimulation energy is delivered to the nerve through the deep fascia tissue layer via implantable medical device electrodes.Type: GrantFiled: August 25, 2020Date of Patent: April 16, 2024Assignee: Medtronic, Inc.Inventors: Anthony M. Chasensky, Bernard Q. Li, Brad C. Tischendorf, Chris J. Paidosh, Christian S. Nielsen, Craig L. Schmidt, David A. Dinsmoor, Duane L. Bourget, Eric H. Bonde, Erik R. Scott, Forrest C M Pape, Gabriela C. Molnar, Gordon O. Munns, Joel A. Anderson, John E. Kast, Joseph J. Viavattine, Markus W. Reiterer, Michael J. Ebert, Phillip C. Falkner, Prabhakar A. Tamirisa, Randy S. Roles, Reginald D. Robinson, Richard T. Stone, Shawn C. Kelley, Stephen J. Roddy, Thomas P. Miltich, Timothy J. Denison, Todd V. Smith, Xuan K. Wei
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Patent number: 11956251Abstract: An internet service provider (ISP) is configured to analyze data sent by a user to determine a subscriber account associated with the data and a user associated with the data. A database is then queried to determine the number of users of the subscriber account, with a number above a threshold indicating a likely theft of service. This automatic process is accompanied by automated messaging to the user with information as to the measures taken and remedial options. The messaging may be different dependent on whether the user is deemed to be an authorized user having subscriber account administration rights.Type: GrantFiled: January 24, 2023Date of Patent: April 9, 2024Assignee: PERFTECH, INC.Inventors: Jonathan E. Schmidt, John A. Murphy, Henry M. Donzis, Lewis T. Donzis, Peter W. Baron, Rodney D. Frey
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Patent number: 9537444Abstract: A method of quantum efficiency (QE) photovoltaic measurement is provided that includes coupling measurement electronics to a p-n junction of a Cell Under Test (CUT) that are capable of measuring a pulsed DC photocurrent. The measurement electronics output a response by the CUT to turning on and turning off the pulsed DC photocurrent that are digitized and analyzed for the magnitude that is representative of a conversion efficiency of the CUT to a wavelength of the DC photocurrent, where a measured decay time represents the p-n junction or the minority carrier lifetime. The CUT is exposed to the pulsed DC photocurrent, where signatures of the response to turning off and on to the pulsed DC photocurrent overlap, where a combined amplitude of the response is proportional to an efficiency of a production of photocarriers, where a value of a spectral response at a wavelength is determined.Type: GrantFiled: December 5, 2014Date of Patent: January 3, 2017Assignee: Tau Science CorporationInventors: John M. Schmidt, Gregory S. Horner, Leonid A. Vasilyev, James E. Hudson, Kyle Lu
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Publication number: 20150084664Abstract: A method of quantum efficiency (QE) photovoltaic measurement is provided that includes coupling measurement electronics to a p-n junction of a Cell Under Test (CUT) that are capable of measuring a pulsed DC photocurrent. The measurement electronics output a response by the CUT to turning on and turning off the pulsed DC photocurrent that are digitized and analyzed for the magnitude that is representative of a conversion efficiency of the CUT to a wavelength of the DC photocurrent, where a measured decay time represents the p-n junction or the minority carrier lifetime. The CUT is exposed to the pulsed DC photocurrent, where signatures of the response to turning off and on to the pulsed DC photocurrent overlap, where a combined amplitude of the response is proportional to an efficiency of a production of photocarriers, where a value of a spectral response at a wavelength is determined.Type: ApplicationFiled: December 5, 2014Publication date: March 26, 2015Inventors: John M. Schmidt, Gregory S. Horner, Leonid A. Vasilyev, James E. Hudson, Kyle Lu
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Patent number: 8299416Abstract: The present invention provides a high-speed Quantum Efficiency (QE) measurement device that includes at least one device under test (DUT), at least one conditioned light source with a less than 50 nm bandwidth, where a portion of the conditioned light source is monitored. Delivery optics are provided to direct the conditioned light to the DUT, a controller drives the conditioned light source in a time dependent operation, and at least one reflectance measurement assembly receives a portion of the conditioned light reflected from the DUT. A time-resolved measurement device includes a current measurement device and/or a voltage measurement device disposed to resolve a current and/or voltage generated in the DUT by each conditioned light source, where a sufficiently programmed computer determines and outputs a QE value for each DUT according to an incident intensity of at least one wavelength of from the conditioned light source and the time-resolved measurement.Type: GrantFiled: March 1, 2010Date of Patent: October 30, 2012Assignee: Tau Science CorporationInventors: Mark A. Arbore, David L Klein, Leonid A. Vasilyev, John M. Schmidt, James E. Hudson, Gregory S. Horner
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Patent number: 8278937Abstract: The current invention provides a shunt defect detection device that includes a device under test (DUT) that is fixedly held by a thermally isolating mount, a power source disposed to provide a directional bias condition to the DUT, a probe disposed to provide a localized power to the DUT from the power source, an emission detector disposed to measure a temporal emission from the DUT when in the directional bias condition, where the measured temporal emission is output as temporal data from the emission detector to a suitably programmed computer that uses the temporal data to determine a heating rate of the DUT and is disposed to estimate an overheat risk level of the DUT, where an output from the computer designates the DUT a pass status, an uncertain status, a fail status or a process to bin status according to the overheat risk level.Type: GrantFiled: February 8, 2010Date of Patent: October 2, 2012Assignee: Tau Science CorporationInventors: Leonid A. Vasilyev, John M. Schmidt, James E. Hudson, Gregory S. Horner
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Publication number: 20100219327Abstract: The present invention provides a high-speed Quantum Efficiency (QE) measurement device that includes at least one device under test (DUT), at least one conditioned light source with a less than 50 nm bandwidth, where a portion of the conditioned light source is monitored. Delivery optics are provided to direct the conditioned light to the DUT, a controller drives the conditioned light source in a time dependent operation, and at least one reflectance measurement assembly receives a portion of the conditioned light reflected from the DUT. A time-resolved measurement device includes a current measurement device and/or a voltage measurement device disposed to resolve a current and/or voltage generated in the DUT by each conditioned light source, where a sufficiently programmed computer determines and outputs a QE value for each DUT according to an incident intensity of at least one wavelength of from the conditioned light source and the time-resolved measurement.Type: ApplicationFiled: March 1, 2010Publication date: September 2, 2010Inventors: Mark A. Arbore, David L. Klein, Leonid A. Vasilyev, John M. Schmidt, James E. Hudson, Gregory S. Horner
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Publication number: 20100201374Abstract: The current invention provides a shunt defect detection device that includes a device under test (DUT) that is fixedly held by a thermally isolating mount, a power source disposed to provide a directional bias condition to the DUT, a probe disposed to provide a localized power to the DUT from the power source, an emission detector disposed to measure a temporal emission from the DUT when in the directional bias condition, where the measured temporal emission is output as temporal data from the emission detector to a suitably programmed computer that uses the temporal data to determine a heating rate of the DUT and is disposed to estimate an overheat risk level of the DUT, where an output from the computer designates the DUT a pass status, an uncertain status, a fail status or a process to bin status according to the overheat risk level.Type: ApplicationFiled: February 8, 2010Publication date: August 12, 2010Inventors: Leonid A. Vasilyev, John M. Schmidt, James E. Hudson, Gregory S. Horner
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Patent number: 7719294Abstract: Systems configured to perform a non-contact method for determining a property of a specimen are provided. One system configured to perform a non-contact method for determining a property of a specimen includes a focused biasing device configured to provide a stimulus to a focused spot on the specimen. The system also includes a sensor configured to measure a parameter of a measurement spot on the specimen. The measurement spot overlaps the focused spot. The system further includes a processor configured to determine the property of the specimen from the parameter.Type: GrantFiled: July 27, 2006Date of Patent: May 18, 2010Assignee: KLA-Tencor Technologies Corp.Inventors: Amin Samsavar, John M. Schmidt, Rainer Schierle, Gregory S. Horner, Thomas G. Miller, Zhiwei Xu, Xiaofeng Hu, Jianou Shi, Sergio Edelstein
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Patent number: 7538333Abstract: Systems and methods for determining a property of a specimen are provided. The specimen may be a product wafer. The method may include biasing a focused spot on the specimen. The method may also include measuring a parameter of a measurement spot on the specimen. The measurement spot may overlap the focused spot. In addition, the method may include determining the property of the specimen from the measured parameter. Systems and methods for varying the performance of a corona source are also provided. The method may include altering a property of the environment within the corona source. The property may include, but is not limited to, temperature, pressure, humidity, and/or partial pressure of a gas within the corona source.Type: GrantFiled: July 27, 2006Date of Patent: May 26, 2009Assignee: KLA-Tencor Technologies CorporationInventors: Amin Samsavar, John M. Schmidt, Rainer Schierle, Gregory S. Horner, Thomas G. Miller, Zhiwei Xu, Xiaofeng Hu, Jianou Shi, Sergio Edelstein
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Patent number: 7248062Abstract: Systems and methods for determining a property of a specimen are provided. The specimen may be a product wafer. The method may include biasing a focused spot on the specimen. The method may also include measuring a parameter of a measurement spot on the specimen. The measurement spot may overlap the focused spot. In addition, the method may include determining the property of the specimen from the measured parameter. Systems and methods for varying the performance of a corona source are also provided. The method may include altering a property of the environment within the corona source. The property may include, but is not limited to, temperature, pressure, humidity, and/or partial pressure of a gas within the corona source.Type: GrantFiled: November 4, 2003Date of Patent: July 24, 2007Assignee: KLA-Tencor Technologies Corp.Inventors: Amin Samsavar, John M. Schmidt, Rainer Schierle, Gregory S. Horner, Thomas G. Miller, Zhiwei Xu, Xiaofeng Hu, Jianou Shi, Sergio Edelstein
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Patent number: 5845983Abstract: A light mounting system for a motor vehicle. The system includes a tubular light mounting member, and a vehicle light mount bracket that extends from the mounting member and that receives a vehicle light mounted thereto. A bumper mount bracket extends from the light mount member and facilitates mounting of the member to a vehicle bumper mount. The mounting member extends generally upwardly and inwardly from the vehicle bumper mount to minimize exposure of the mounting member to bumper contact forces, and to allow the vehicle lights to be mounted in close proximity to the vehicle driving surface to provide maximum illumination of the driving surface.Type: GrantFiled: July 8, 1997Date of Patent: December 8, 1998Inventor: John M. Schmidt
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Patent number: 4862867Abstract: An arrow retainer to be attached to an archery bow which retains the arrow in a position adjacent the arrow rest. In accordance with this invention, the arrow retainer is preferably made from elastomeric materials and forms an upwardly opening channel. The arrow retainer provides a restricted distance gap enabling an arrow to be loaded within an area adjacent the bow arrow rest. The confined area defined by the arrow retainer maintains the arrow in close proximity with the arrow rest, thereby minimizing the time necessary to draw and release the arrow. In accordance with an alternate embodiment of this invention, the arrow retainer is integrated into the arrow rest component.Type: GrantFiled: February 2, 1987Date of Patent: September 5, 1989Inventor: John M. Schmidt
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Patent number: D309090Type: GrantFiled: July 6, 1987Date of Patent: July 10, 1990Inventors: John M. Schmidt, Richard J. Osemlak
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Patent number: D421075Type: GrantFiled: September 29, 1998Date of Patent: February 22, 2000Assignee: NuStep, Inc.Inventors: Mark D. Hildebrandt, John M. Schmidt, Richard K. Gresens