Patents by Inventor John Mark ALLISON

John Mark ALLISON has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • ION SOURCES WITH IMPROVED CLEANING BY ABLATING LIGHT
    Publication number: 20210229136
    Abstract: An ion source comprises an ionising light source arranged to output ionising light for ionising a sample material, an electrode presenting an electrode surface for attracting the ionised sample material and upon which contaminant material is able to accumulate, and an ablating light source arranged to output an ablating light beam or pulse(s) for ablating material of the electrode from the electrode surface. The ablating light beam or pulse(s) does not include said ionising light. A reflector for reflecting the ablating light onto the electrode surface, therewith by a process of ablation a part of the electrode surface is removable from the electrode together with contaminant material when accumulated upon that part.
    Type: Application
    Filed: June 14, 2019
    Publication date: July 29, 2021
    Inventors: John Mark ALLISON, Diana Vladimirovna KALININA
  • Methods and apparatuses relating to cleaning and imaging an ion source using reflected light
    Patent number: 10340131
    Abstract: A method of cleaning an ion source. The method includes: at a first reflective surface of a mirror, reflecting light that has a wavelength in a first wavelength band onto a surface of the ion source so that contaminant material is desorbed from the surface of the ion source; at a second reflective surface of the mirror, reflecting light that has a wavelength in a second wavelength band and that comes from the surface of the ion source towards an imaging apparatus for producing an image of the surface of the ion source, wherein the light that has a wavelength in the second wavelength band passes through the first reflective surface of the mirror before being reflected at the second reflective surface of the mirror.
    Type: Grant
    Filed: September 21, 2015
    Date of Patent: July 2, 2019
    Assignee: KRATOS ANALYTICAL LIMITED
    Inventor: John Mark Allison
  • METHODS AND APPARATUSES RELATING TO CLEANING AN ION SOURCE
    Publication number: 20170309464
    Abstract: A method of cleaning an ion source. The method includes: at a first reflective surface of a mirror, reflecting light that has a wavelength in a first wavelength band onto a surface of the ion source so that contaminant material is desorbed from the surface of the ion source; at a second reflective surface of the mirror, reflecting light that has a wavelength in a second wavelength band and that comes from the surface of the ion source towards an imaging apparatus for producing an image of the surface of the ion source, wherein the light that has a wavelength in the second wavelength band passes through the first reflective surface of the mirror before being reflected at the second reflective surface of the mirror.
    Type: Application
    Filed: September 21, 2015
    Publication date: October 26, 2017
    Applicant: KRATOS ANALYTICAL LIMITED
    Inventor: John Mark ALLISON