Abstract: A system for inspecting components is provided. The system includes an axial lighting system that illuminates the component with axial lighting to allow one or more features of the component to be located, such as by causing protruding features to be brighter than the background and recessed features to be darker than the background. An off-axis lighting system illuminates the component with off-axis lighting in the absence of the axial lighting to allow the component to be inspected to locate one or more features, such as a bump contact.

Abstract: A system for locating features in image data is provided. The system includes a first component system. The first component system compares first component data, which can be pixel data of a first user-selected component of the feature, to first test image data, which can be selected by scanning image data of a device, such as a die cut from a silicon wafer. The system also includes second component system that is connected to the first component system, such as through data memory locations of a processor. The second component system compares second component data to second test image data if the first component system finds a match between the first component data and the first test image data. The second test image data is selected based upon the first test image data, such as by using a known coordinate relationship between pixels of the first component data and the second component data.