Patents by Inventor John McGlory
John McGlory has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7898276Abstract: A probe card is provided including a first substrate, a second substrate, and a plurality of conductive wires extending between the first substrate and the second substrate. The conductive wires are fixed (a) at a first end to a contact of the first substrate, and (b) at a second end to a contact of the second substrate.Type: GrantFiled: February 21, 2006Date of Patent: March 1, 2011Assignee: SV Probe PTE Ltd.Inventors: Scott R. Williams, Bahadir Tunaboylu, John McGlory
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Patent number: 7733104Abstract: A probe test card assembly for testing of a device under test includes a printed circuit board, a substrate and a substrate support structure. The substrate support structure holds the substrate in position with respect to the printed circuit board. The substrate support structure may include one or more alignment members, one or more hard stop members and/or a support plate attached to the printed circuit board for positioning the substrate with respect to the printed circuit board. The one or more alignment members may extend through the printed circuit board and be connected to the one or more printed circuit board stiffener members. The probe test card assembly may also employ a proximity detection feature to indicate when the substrate is in a particular position with respect to the printed circuit board.Type: GrantFiled: April 21, 2008Date of Patent: June 8, 2010Assignee: SV Probe Pte. Ltd.Inventors: John McGlory, Anh-Tai Thai Nguyen, John William Clancy, III, Senthil Theppakuttai, Bahadir Tunaboylu
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Patent number: 7637007Abstract: An approach for fabricating cantilever probes for a probe card assembly includes forming posts on conductive traces on a substrate. A beam panel having beam elements formed therein is aligned to the substrate so that the beam elements are in contact with the plurality of posts. Each beam element is in contact with a post at a portion of the beam element so that both a first end portion and a second end portion overhang the post element. Each beam element is also attached to the beam panel by the first end portion. The beam elements are bonded to the plurality of posts. The first end portion of each beam element is cut, for example using an electrode, laser ablation or by dicing, to release the beam element from the beam panel. The beam panel is then removed, leaving the beam elements attached to the posts.Type: GrantFiled: February 7, 2007Date of Patent: December 29, 2009Assignee: SV Probe Pte. Ltd.Inventors: Bahadir Tunaboylu, Horst Clauberg, Mark Cunningham, Senthil Theppakuttai, John McGlory
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Patent number: 7637006Abstract: A method for fabricating beams for a probe card includes dividing a large beam panel into smaller sub-panels before attaching the beams to corresponding posts on a substrate. Each sub-panel may have a sufficient number of beams to test several devices under test. The beam sub-panels may be aligned to the space transformer using alignment fiducials on the beam sub-panels that correspond to opposing alignment features formed in the space transformer or other substrate. Special tie-bars may be formed between: (1) rows, for example, of beams and the frame/frame splines (i.e., quadrant tie-bars); and (2) adjacent beams within any such rows on the beam panel (i.e., beam tie-bars). The approach may also include the use of tip tie-bars and/or tail tie-bars.Type: GrantFiled: February 27, 2007Date of Patent: December 29, 2009Assignee: SV Probe Pte. Ltd.Inventors: Bahadir Tunaboylu, Horst Clauberg, John McGlory, Anh-Tai Thai Nguyen
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Publication number: 20090261849Abstract: A probe test card assembly for testing of a device under test includes a printed circuit board, a substrate and a substrate support structure. The substrate support structure holds the substrate in position with respect to the printed circuit board. The substrate support structure may include one or more alignment members, one or more hard stop members and/or a support plate attached to the printed circuit board for positioning the substrate with respect to the printed circuit board. The one or more alignment members may extend through the printed circuit board and be connected to the one or more printed circuit board stiffener members. The probe test card assembly may also employ a proximity detection feature to indicate when the substrate is in a particular position with respect to the printed circuit board.Type: ApplicationFiled: April 21, 2008Publication date: October 22, 2009Inventors: John McGlory, Anh-Tai Thai Nguyen, John William Clancy, III, Senthil Theppakuttai, Bahadir Tunaboylu
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Patent number: 7583098Abstract: A method and apparatus for performing automated alignment of probes of a probe card is provided. The desired horizontal location for a probe is compared with the actual horizontal position for the probe to determine a horizontal correction distance and a horizontal correction direction to correct a horizontal alignment for the probe. A first tool automatically corrects the horizontal alignment for the probe based on the horizontal correction distance and the horizontal correction direction. Upon determining that an actual vertical position of the probe is closer to the probe card than a desired vertical position, a second tool automatically changes the actual vertical position of the probe to the desired vertical position. Upon determining that the actual vertical position of the probe is farther from the probe card than the desired vertical position, a third tool automatically changes the actual vertical position of the probe to the desired vertical position.Type: GrantFiled: February 7, 2007Date of Patent: September 1, 2009Assignee: SV Probe Pte. Ltd.Inventors: Bahadir Tunaboylu, Guy B. Frick, Edward L. Malantonio, Horst Clauberg, John McGlory
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Patent number: 7437813Abstract: A method and apparatus for repairing a probe on a probe card is provided. A plurality of beams is formed on a beam panel. The plurality of beams includes a replacement beam. After identifying a damaged beam on the probe card, the damaged beam is removed from the probe card. The beam panel is aligned with the probe card. After the beam panel is aligned, the aligned beam panel is temporarily affixed to the probe card. After the beam panel is temporarily affixed to the probe card, the replacement beam is affixed at a location previously occupied by the damaged beam. After the replacement beam is affixed at the location, the beam panel is removed from the probe card.Type: GrantFiled: February 7, 2007Date of Patent: October 21, 2008Assignee: SV Probe Pte Ltd.Inventors: Bahadir Tunaboylu, John McGlory, Horst Clauberg, Bruce Griffing, Robert E. Werner, Edward T. Laurent, Edward L. Malantonio, Alan Slopey, Paul Bereznycky
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Publication number: 20080246501Abstract: A probe card is provided including a first substrate, a second substrate, and a plurality of conductive wires extending between the first substrate and the second substrate. The conductive wires are fixed (a) at a first end to a contact of the first substrate, and (b) at a second end to a contact of the second substrate.Type: ApplicationFiled: February 21, 2006Publication date: October 9, 2008Inventors: Scott R. Williams, Bahadir Tunaboylu, John McGlory
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Publication number: 20070251080Abstract: A method for fabricating beams for a probe card includes dividing a large beam panel into smaller sub-panels before attaching the beams to corresponding posts on a substrate. Each sub-panel may have a sufficient number of beams to test several devices under test. The beam sub-panels may be aligned to the space transformer using alignment fiducials on the beam sub-panels that correspond to opposing alignment features formed in the space transformer or other substrate. Special tie-bars may be formed between: (1) rows, for example, of beams and the frame/frame splines (i.e., quadrant tie-bars); and (2) adjacent beams within any such rows on the beam panel (i.e., beam tie-bars). The approach may also include the use of tip tie-bars and/or tail tie-bars.Type: ApplicationFiled: February 27, 2007Publication date: November 1, 2007Inventors: Bahadir Tunaboylu, Horst Clauberg, John McGlory, Anh-Tai Thai Nguyen
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Publication number: 20070216431Abstract: A method and apparatus for performing automated alignment of probes of a probe card is provided. The desired horizontal location for a probe is compared with the actual horizontal position for the probe to determine a horizontal correction distance and a horizontal correction direction to correct a horizontal alignment for the probe. A first tool automatically corrects the horizontal alignment for the probe based on the horizontal correction distance and the horizontal correction direction. Upon determining that an actual vertical position of the probe is closer to the probe card than a desired vertical position, a second tool automatically changes the actual vertical position of the probe to the desired vertical position. Upon determining that the actual vertical position of the probe is farther from the probe card than the desired vertical position, a third tool automatically changes the actual vertical position of the probe to the desired vertical position.Type: ApplicationFiled: February 7, 2007Publication date: September 20, 2007Inventors: Bahadir Tunaboylu, Guy Frick, Edward Malantonio, Horst Clauberg, John McGlory
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Publication number: 20070200577Abstract: A method and apparatus for repairing a probe on a probe card is provided. A plurality of beams is formed on a beam panel. The plurality of beams includes a replacement beam. After identifying a damaged beam on the probe card, the damaged beam is removed from the probe card. The beam panel is aligned with the probe card. After the beam panel is aligned, the aligned beam panel is temporarily affixed to the probe card. After the beam panel is temporarily affixed to the probe card, the replacement beam is affixed at a location previously occupied by the damaged beam. After the replacement beam is affixed at the location, the beam panel is removed from the probe card.Type: ApplicationFiled: February 7, 2007Publication date: August 30, 2007Inventors: Bahadir Tunaboylu, John McGlory, Horst Clauberg, Bruce Griffing, Robert Werner, Edward Laurent, Edward Malantonio, Alan Slopey, Paul Berenycky
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Publication number: 20070202658Abstract: An approach for fabricating cantilever probes for a probe card assembly includes forming posts on conductive traces on a substrate. A beam panel having beam elements formed therein is aligned to the substrate so that the beam elements are in contact with the plurality of posts. Each beam element is in contact with a post at a portion of the beam element so that both a first end portion and a second end portion overhang the post element. Each beam element is also attached to the beam panel by the first end portion. The beam elements are bonded to the plurality of posts. The first end portion of each beam element is cut, for example using an electrode, laser ablation or by dicing, to release the beam element from the beam panel. The beam panel is then removed, leaving the beam elements attached to the posts.Type: ApplicationFiled: February 7, 2007Publication date: August 30, 2007Inventors: Bahadir Tunaboylu, Horst Clauberg, Mark Cunningham, Senthil Theppakuttai, John McGlory