Patents by Inventor John McKinley Poole

John McKinley Poole has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9347924
    Abstract: A moisture provision and analyzer arrangement includes a conduit for obtaining a sample flow of natural gas, a moisture analyzer, and a bypass flow conduit. A main orifice is in fluid communication within the moisture provision and analyzer arrangement with flow proceeding to the moisture analyzer. A bypass orifice is located along the bypass flow conduit. The main orifice is sized and the flow provided to the moisture analyzer via the main orifice is at a pressure such that the flow provided to the moisture analyzer is at a critical flow condition and the bypass orifice is sized and the bypass flow is provided at a pressure such that the bypass flow is at a critical flow condition. Components in the moisture provision and analyzer arrangement are selected such that the critical flow rate through the main orifice and the critical flow rate through the bypass orifice are equal.
    Type: Grant
    Filed: April 10, 2013
    Date of Patent: May 24, 2016
    Assignee: GENERAL ELECTRIC COMPANY
    Inventors: Yufeng Huang, Gary Stephen Parece, John McKinley Poole
  • Publication number: 20140305193
    Abstract: A moisture provision and analyzer arrangement includes a conduit for obtaining a sample flow of natural gas, a moisture analyzer, and a bypass flow conduit. A main orifice is in fluid communication within the moisture provision and analyzer arrangement with flow proceeding to the moisture analyzer. A bypass orifice is located along the bypass flow conduit. The main orifice is sized and the flow provided to the moisture analyzer via the main orifice is at a pressure such that the flow provided to the moisture analyzer is at a critical flow condition and the bypass orifice is sized and the bypass flow is provided at a pressure such that the bypass flow is at a critical flow condition. Components in the moisture provision and analyzer arrangement are selected such that the critical flow rate through the main orifice and the critical flow rate through the bypass orifice are equal.
    Type: Application
    Filed: April 10, 2013
    Publication date: October 16, 2014
    Applicant: General Electric Company
    Inventors: Yufeng Huang, Gary Stephen Parece, John McKinley Poole
  • Patent number: 8547554
    Abstract: A system includes a moisture analyzer configured to detect moisture in natural gas. The moisture analyzer includes an absorption cell that encloses and conducts the natural gas. The moisture analyzer also includes a pressure control device that may reduce a pressure of the natural gas inside the absorption cell. The moisture analyzer includes a light emitting device that may transmit light through the natural gas inside the absorption cell, as well as a photodetector that may detect an intensity of the light transmitted through the natural gas and exiting the absorption cell.
    Type: Grant
    Filed: August 17, 2011
    Date of Patent: October 1, 2013
    Assignee: General Electric Company
    Inventors: Xiaoyong Frank Liu, Yufeng Huang, John McKinley Poole, Gary S. Parece, Anthony Kowal
  • Publication number: 20130044323
    Abstract: A system includes a moisture analyzer configured to detect moisture in natural gas. The moisture analyzer includes an absorption cell that encloses and conducts the natural gas. The moisture analyzer also includes a pressure control device that may reduce a pressure of the natural gas inside the absorption cell. The moisture analyzer includes a light emitting device that may transmit light through the natural gas inside the absorption cell, as well as a photodetector that may detect an intensity of the light transmitted through the natural gas and exiting the absorption cell.
    Type: Application
    Filed: August 17, 2011
    Publication date: February 21, 2013
    Applicant: General Electric Company
    Inventors: Xiaoyong Frank Liu, Yufeng Huang, John McKinley Poole, Gary S. Parece, Anthony Kowal
  • Patent number: 8217376
    Abstract: Several methods of calibrating a wavelength-modulation spectroscopy apparatus configured to measure a concentration of an analyte in a sample gas are disclosed. Each of the methods allows for calibration and recalibration using a relatively safe gas regardless of whether the sample gas for which the concentration of the analyte can be determined is a hazardous gas. In one embodiment of the invention, calibration that is sample-gas specific is accomplished by determining a first slope coefficient and calibration function for the sample gas, after which a scaling factor can be determined based on the first slope coefficient and a second slope coefficient for the same or a different sample gas and used in a subsequent calibration (or recalibration) to scale the calibration function. In other embodiments of the invention, calibration that is not sample-gas specific is accomplished to allow for the determination of the analyte concentration in variable gas compositions and constant gas compositions.
    Type: Grant
    Filed: April 11, 2011
    Date of Patent: July 10, 2012
    Assignee: GE Infrastructure Sensing, Inc.
    Inventors: Xiaoyong Liu, Yufeng Huang, John McKinley Poole, Gene Smith Berkowitz, Anthony Kowal, Shawn D. Wehe, Hejie Li
  • Patent number: 8026499
    Abstract: Several methods of calibrating a wavelength-modulation spectroscopy apparatus configured to measure a concentration of an analyte in a sample gas are disclosed. Each of the methods allows for calibration and recalibration using a relatively safe gas regardless of whether the sample gas for which the concentration of the analyte can be determined is a hazardous gas. In one embodiment of the invention, calibration that is sample-gas specific is accomplished by determining a first slope coefficient and calibration function for the sample gas, after which a scaling factor can be determined based on the first slope coefficient and a second slope coefficient for the same or a different sample gas and used in a subsequent calibration (or recalibration) to scale the calibration function. In other embodiments of the invention, calibration that is not sample-gas specific is accomplished to allow for the determination of the analyte concentration in variable gas compositions and constant gas compositions.
    Type: Grant
    Filed: April 11, 2011
    Date of Patent: September 27, 2011
    Assignee: GE Infrastructure Sensing, Inc.
    Inventors: Xiaoyong Liu, Yufeng Huang, John McKinley Poole, Gene Smith Berkowitz, Anthony Kowal, Shawn D. Wehe, Hejie Li
  • Publication number: 20110181876
    Abstract: Several methods of calibrating a wavelength-modulation spectroscopy apparatus configured to measure a concentration of an analyte in a sample gas are disclosed. Each of the methods allows for calibration and recalibration using a relatively safe gas regardless of whether the sample gas for which the concentration of the analyte can be determined is a hazardous gas. In one embodiment of the invention, calibration that is sample-gas specific is accomplished by determining a first slope coefficient and calibration function for the sample gas, after which a scaling factor can be determined based on the first slope coefficient and a second slope coefficient for the same or a different sample gas and used in a subsequent calibration (or recalibration) to scale the calibration function. In other embodiments of the invention, calibration that is not sample-gas specific is accomplished to allow for the determination of the analyte concentration in variable gas compositions and constant gas compositions.
    Type: Application
    Filed: April 11, 2011
    Publication date: July 28, 2011
    Inventors: Xiaoyong Liu, Yufeng Huang, John McKinley Poole, Gene Smith Berkowitz, Anthony Kowal, Shawn D. Wehe, Hejie Li
  • Publication number: 20110181877
    Abstract: Several methods of calibrating a wavelength-modulation spectroscopy apparatus configured to measure a concentration of an analyte in a sample gas are disclosed. Each of the methods allows for calibration and recalibration using a relatively safe gas regardless of whether the sample gas for which the concentration of the analyte can be determined is a hazardous gas. In one embodiment of the invention, calibration that is sample-gas specific is, accomplished by determining a first slope coefficient and calibration function for the sample gas, after which a scaling factor can be determined based on the first slope coefficient and a second slope coefficient for the same or a different sample gas and used in a subsequent calibration (or recalibration) to scale the calibration function. In other embodiments of the invention, calibration that is not sample-gas specific is accomplished to allow for the determination of the analyte concentration in variable gas compositions and constant gas compositions.
    Type: Application
    Filed: April 11, 2011
    Publication date: July 28, 2011
    Inventors: Xiaoyong Liu, Yufeng Huang, John McKinley Poole, Gene Smith Berkowitz, Anthony Kowal, Shawn D. Wehe, Hejie Li
  • Patent number: 7957001
    Abstract: In one embodiment of the spectroscopy method, the method comprises the steps of modulating the wavelength of a monochromatic radiation at a modulation amplitude and a modulation frequency; determining a first variable representative of an absorbance of an analyte in a sample; and demodulating by phase-sensitive detection the first variable at a harmonic of the modulation frequency to produce a harmonic spectrum of the analyte. In one embodiment of the spectroscopy apparatus, the apparatus comprises a laser diode integrated with a first photodetector configured to detect an intensity of a backward emission from the laser diode and act as a reference detector; a second photodetector configured to detect an intensity of laser radiation exiting a sample; and electronic circuitry coupled to the laser diode and the photodetectors, configured to acquire and process spectra of the sample.
    Type: Grant
    Filed: October 10, 2008
    Date of Patent: June 7, 2011
    Assignee: GE Infrastructure Sensing, Inc.
    Inventors: Xiaoyong Liu, John McKinley Poole, Yufeng Huang, Daniel M. Stearns, Michael J. Gambuzza, Gene Smith Berkowitz, Anthony Kowal, Hejie Li, Shawn D. Wehe
  • Patent number: 7943915
    Abstract: Several methods of calibrating a wavelength-modulation spectroscopy apparatus configured to measure a concentration of an analyte in a sample gas are disclosed. Each of the methods allows for calibration and recalibration using a relatively safe gas regardless of whether the sample gas for which the concentration of the analyte can be determined is a hazardous gas. In one embodiment of the invention, calibration that is sample-gas specific is accomplished by determining a first slope coefficient and calibration function for the sample gas, after which a scaling factor can be determined based on the first slope coefficient and a second slope coefficient for the same or a different sample gas and used in a subsequent calibration (or recalibration) to scale the calibration function. In other embodiments of the invention, calibration that is not sample-gas specific is accomplished to allow for the determination of the analyte concentration in variable gas compositions and constant gas compositions.
    Type: Grant
    Filed: October 10, 2008
    Date of Patent: May 17, 2011
    Assignee: GE Infrastructure Sensing, Inc.
    Inventors: Xiaoyong Liu, Yufeng Huang, John McKinley Poole, Gene Smith Berkowitz, Anthony Kowal, Shawn D. Wehe, Hejie Li
  • Publication number: 20100089117
    Abstract: Several methods of calibrating a wavelength-modulation spectroscopy apparatus configured to measure a concentration of an analyte in a sample gas are disclosed. Each of the methods allows for calibration and recalibration using a relatively safe gas regardless of whether the sample gas for which the concentration of the analyte can be determined is a hazardous gas. In one embodiment of the invention, calibration that is sample-gas specific is accomplished by determining a first slope coefficient and calibration function for the sample gas, after which a scaling factor can be determined based on the first slope coefficient and a second slope coefficient for the same or a different sample gas and used in a subsequent calibration (or recalibration) to scale the calibration function. In other embodiments of the invention, calibration that is not sample-gas specific is accomplished to allow for the determination of the analyte concentration in variable gas compositions and constant gas compositions.
    Type: Application
    Filed: October 10, 2008
    Publication date: April 15, 2010
    Inventors: Xiaoyong Liu, Yufeng Huang, John McKinley Poole, Gene Smith Berkowitz, Anthony Kowal, Shawn D. Wehe, Hejie Li
  • Publication number: 20100091278
    Abstract: In one embodiment of the spectroscopy method, the method comprises the steps of modulating the wavelength of a monochromatic radiation at a modulation amplitude and a modulation frequency; determining a first variable representative of an absorbance of an analyte in a sample; and demodulating by phase-sensitive detection the first variable at a harmonic of the modulation frequency to produce a harmonic spectrum of the analyte. In one embodiment of the spectroscopy apparatus, the apparatus comprises a laser diode integrated with a first photodetector configured to detect an intensity of a backward emission from the laser diode and act as a reference detector; a second photodetector configured to detect an intensity of laser radiation exiting a sample; and electronic circuitry coupled to the laser diode and the photodetectors, configured to acquire and process spectra of the sample.
    Type: Application
    Filed: October 10, 2008
    Publication date: April 15, 2010
    Inventors: Xiaoyong Liu, John McKinley Poole, Yufeng Huang, Daniel M. Stearns, Michael J. Gambuzza, Gene Smith Berkowitz, Anthony Kowal, Hejie Li, Shawn D. Wehe
  • Patent number: 6865940
    Abstract: A method of operating an aluminum oxide moisture sensor to measure moisture in a sample gas, where the sensor comprises a pair of electrodes sandwiched about a dielectric, the method comprising: a) heating the sensor to a first temperature above the sample gas temperature and holding the sensor at said first temperature for a first predetermined period of time; b) cooling down the sensor to a second lower temperature over a second predetermined period of time; c) taking plural samples of sensor conductance over a third predetermined period of time at the lower temperature; and d) determining a rate of adsorption of the moisture and using the rate of adsorption as a measure of moisture in the sample gas.
    Type: Grant
    Filed: June 25, 2003
    Date of Patent: March 15, 2005
    Assignee: General Electric Company
    Inventor: John McKinley Poole
  • Publication number: 20040261526
    Abstract: A method of operating an aluminum oxide moisture sensor to measure moisture in a sample gas, where the sensor comprises a pair of electrodes sandwiched about a dielectric, the method comprising: a) heating the sensor to a first temperature above the sample gas temperature and holding the sensor at said first temperature for a first predetermined period of time; b) cooling down the sensor to a second lower temperature over a second predetermined period of time; c) taking plural samples of sensor conductance over a third predetermined period of time at the lower temperature; and d) determining a rate of adsorption of the moisture and using the rate of adsorption as a measure of moisture in the sample gas.
    Type: Application
    Filed: June 25, 2003
    Publication date: December 30, 2004
    Inventor: John McKinley Poole